Functional Test
black box type testing via interface level inputs and resulting output analysis.
See Also: Functional ATE, Functional Test Systems, Interoperability Test, End of Line
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
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The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Product
ATE For Data Communications Equipment
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• Developed for DRS Codem Systems, Inc. to test the CTM-IP product line of the Multi-Interface Protocol Converter.• Manufacturing Test support for the CTM-IP chassis and Interface Modules. Functional test of signaling, protocol and software configurations for various communication interface configurations.• Regression Test support for Engineering Product Development. Configurable test sequencing allows engineer to select specific tests for execution, with the ability to exercise all combinations of data rates and interface configurations.
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Product
6TL60 Rotary Test Handler
H79006010
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6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
Spring Clip Fixture
16092A
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Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
Scienlab Combined Battery Test Solution
SL1133A
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Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
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Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
In-Line RF Test Station
AP770
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ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
6TL10 Table Top Test Base
H71001000
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The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
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Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
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The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
SoC Test System
T2000
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SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
Standard Test Systems
WaveCore™ Products
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Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
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Product
Active Alignment Assembly & Test Platform
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Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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Product
Test Port Cable, 1 Mm
11500L
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Connect test ports to devices, fixtures, or probe tips with this 24-cm cable featuring a return loss of 16 dB minimum.
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Product
Environmental Control System Test Platform
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The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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Product
Test Workflow Pro
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
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The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
VR/AR/MR Calibration Platform
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AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
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The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
PXI 10W Programmable Resistor Module, 1-Channel, 1.5Ω to 1.81kΩ
40-253-022
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The 40-253-022 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 1.81kΩ with 0.5Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
XLR-Function Tester
CTG-1SINE
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Monacor International GmbH & Co.
For quick and easy functional testing of balanced microphone cables or microphone inputs on stage.
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Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
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Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Photonics Module Test System
58625
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Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
PXI Integration Platform
ATS-3100
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The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Product
Physical Layer Test System
N19301B
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The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
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Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
