Interoperability Test
assures functionality between two or more systems.
See Also: Interoperability Testing, Functional Test, Standards
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Interoperability Testing Services
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Using our decades of knowledge and experience of Bluetooth, markets and products we'll help you deliver products which are free of defects, minimize field issues, lower development costs and reduce time to market. Teledyne LeCroy offers test services to help in all stages of product development from Specification to Market Launch and beyond.
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Testing and Training Solutions
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Teledyne LeCroy offers an broad array of testing services and educational training options. From advanced multi-day protocol training courses to device interoperability testing to calibration and testing service, Teledyne LeCroy offers valuable expertise, in-depth knowledge, leading edge testing solution, and top-notch engineers able help move your projects forward. Whether you need your team to come up to speed on the latest technology or you just need more hands getting your product tested and ready for market, we can help.
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Product
P-Series Modular Power Meter (LXI Compliant)
N8262A
Power Meter
The Keysight N8262A P-Series modular power meter enables LAN-based automated measurements of peak, peak-to-average ratio and average power. The N8262A enables fast, efficient, and cost-effective creation and reconfiguration of your ATE system. Owing to LXI test standardization and its interoperability with existing test assets, your system can be up and ready in no time.
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Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
Battery Test Platform
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Functional Testing Services
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We manage an in-house team of testing specialists having sufficient experience to perform quality functional testing activities.ImpactQA exhibits cross-browser & cross-platform testing capabilities together with the latest interoperability testing methods to assess functionalities across multi-faceted systems.Unlike other functional testing services, our testing model is loaded with adaptable properties to perform white-box testing and functional testing of Java and .Net applications.
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Integrated Solution for Digital Switching & Fiber Optics Operational Verification
VERTA
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When incorporated into defense/aerospace ATE, Verta enables reliable, error-free bus communication and interoperability tests to verify performance of high-speed, optically networked military weapon assemblies.
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Ethernet
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Arasan Chip Systems has a complete portfolio of Fast (10/100) Mbps and Gigabit (10/100/1000) Mbps and now 10Gigabit Ethernet IP. Our high quality IP has completed the rigorous interoperability tests at UNH-IOL laboratories and has been widely licensed. Arasan also provides a portable Ethernet driver.
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Anite SAS Interoperability Testing
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Access advanced platform for network simulation, currently used by major Tier 1 carriers in their device acceptance programsAccelerate the introduction of new mobile devices with cost-effective, controllable, repeatable and automated lab-based testingQuickly evaluate devices in the integration, interoperability testing and carrier acceptance testing phasesConduct rigorous device testing to achieve superior experience in terms of functionality and quality of voice and data transferTest data performance under fading conditions using the internal fading capability to enable comprehensive performance testing
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Power Meter
P-Series
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The N8262A is a compact and slim LXI-compliant P-Series modular power meter. The N8262A helps you to reduce your test system size and enables LAN-based automated power measurements. Owing to LXI test standardization and its interoperability with existing test assets, your system can be up and ready in no time.
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Ethernet
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The UNH-IOL has been providing Ethernet testing services since its inception in 1988. We have a strong and wide-reaching industry reputation and participate in many industry organizations including the IEEE, the Ethernet Alliance, and the OpenAlliance. We were honored to receive the IEEE-SA Corporate Member of the year award in 2013 for "unwavering contributions to interoperability testing of IEEE standards".
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NVMe® Technologies
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We have been a leader and expert in NVMe Testing Services for several years providing conformance and interoperability testing. In addition, we also host NVMe Plugfests where storage vendors from around the world come together to test against NVMe standards to qualify them for the NVMe Integrator's List. The NVMe Integrator's List currently consists of configurations that have proven to be interoperable and conformant to NVMe standards.
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Mobile and Wireless
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Our testing enables wireless interoperability between and within your devices. We keep your devices connected through interoperability testing for home and enterprise Wireless networks through our Wireless Testing Services. We ensure that devices work reliably by seamlessly connecting the components within your mobile devices through our MIPI Alliance testing efforts.
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Interoperability Testing
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Underwriters Laboratories Inc.
Leverage our expertise to validate that your product not only works as expected with all other relevant devices but also conforms to all appropriate standards and technology platforms. We do this by testing products in real-world scenarios. We are an approved testing laboratory for many IoT and wireless standards bodies, such as Bluetooth SIG, Thread Group, Wireless and Zigbee Alliance, and are actively engaged with key players in 5G. We test interoperability across many industries including appliances, building systems, consumer electronics and vehicles.
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Software Solution for Interoperability Testing
COMPRION Network Bridge
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COMPRION Network Bridge provides a direct connection between (e)UICCs and back end servers. This way, remote administration scenarios can be processed in a lab environment independent of a real network or a network simulator. This makes the work of (e)UICC manufacturers, MNOs, SM-DP(+), and SM-SR providers easier. The test effort is reduced significantly, because there is no need for a network simulator and the testing limitations of a real or simulated network do not apply.
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NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
test
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Scalable Tester System for Functional Testing
UTP6010
Functional Test
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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High Speed Test Bench
AT444
Test Platform
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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NTS Platform
Test Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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FPD Tester Model
27014
Test Platform
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
