Silicon
atomic number 14 tetravalent metalloid chemical element.
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Product
Silicon Test & Yield Analysis Solutions
Tessent®
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The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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Silicon Resistivity, PN type & Alarm Tester
HS-PSRT
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It use Four Probe to test the resistivity and P/N type of wafers、ingots and all type of silicon materials.It can be used by Solar and Semiconductor industry.
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Silicon Heavy-doped Pen Tester
HS-MPRT
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Heavy doped testing, especially good for purchase the material.■ Not only sound alarm, but also Led light alarm , to guarantee sorting work accurately.■ adaptable for sorting little granular material, little broken IC Wafer and other little silicon material.■ Can set alarm ranges from 0.0 to 1.0Ω﹡㎝.
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Silicon heavy-doped Tweezer Tester
HS-MRTT
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Mini resistivity tweezer tester is used to check heavy-dope silicon. adaptable for little granular material, little broken IC Wafer and other little silicon material. When the resistivity is lower than the set value, it will make alarm.
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Silicon & Compound Wafers
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Compound semiconductors are undergoing a major expansion addressing many new applications and using various materials such as SiC, GaN, GaAs and others, to improve the performance of new devices in several segments such as Power and Face Recognition.
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DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
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NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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Quick Silicon Discriminator
HS-QSD
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HS-QSD Quick Silicon Discriminator is specially designed for silicon sorting，it can quickly test the silicon type, heavy-dopedt, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
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Silicon Charged Particle Radiation Detectors
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ORTEC introduced the first silicon surface barrier detectors for charged particle spectroscopy in the early 1960’s. Since then, ORTEC has expanded the product line with more than ten different options to choose from.
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Life-time Measurement System For Silicon Bulks/ingots By JIS Method
HF-100DCA
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*Global standard model for the lifetime test of silicon bulk*JIS direct current anodizing method*Data processing by digital oscilloscope and PC with software
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MICROWAVE SILICON LIMITER PIN DIODES
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Insight Product Company offers Microwave Silicon Limiter PIN Diodes with p+-i-n+ structures are designed to be used in microwave protective  devices included in hybrid integrated circuit (HIC) hermetically sealed, design of which provides protection against  moisture, salt, fog, mycelial fungus, hoarfrost, dew, decreased and increased pressure.
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Silicon Steel Sheet Iron Loss Tester
DX-30SST
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DX-30SST Silicon Steel Sheet Iron Loss Meter adopts SCM technique and analog electronics technique, the magnetic circuit of permeameter adopts low loss silicon steel iron core, it is a small tester for measuring the characteristics of silicon steel sheet, met the requirements of tracing the brand of silicon steel sheet.
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Silicon Nails Feature, GTE 10.00p
K8214B
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Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.
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Silicon Optical Power Head
81620C
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The new 81620C optical power head provides a 5 mm detector area and allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The 81620C accepts parallel beams with up to 4 mm diameter, standard SM fiber and MM fiber with max. 100 μm core diameter, NA ≤ 0.3. A wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
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Silicon Drift Detector
Octane Elite (SDD) Series
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The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
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RF Power Transistors
Silicon Bipolar
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Macom Technology Solutions Holdings Inc.
At MACOM we offer a broad range of silicon bipolar transistor products designed for applications ranging from DC to 3.5 GHz. Our silicon bipolar transistors are ideal for civil avionics, communications, networks, radar, and industrial, scientific, and medical applications. Our all-gold metallization fabrication processes ensure high performance and long term reliability for ground and space applications.
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Ka-Band Silicon 5G Quad Core IC
AWMF-0108
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The AWMF-0108 is a highly integrated silicon quad core IC intended for 5G phased array applications. The device supports four Tx/Rx radiating elements, includes 5 bit phase and 5 bit gain control for analog RF beam steering, and operates in half duplex fashion to enable a single antenna to support both Tx and Rx operation. The device provides 26 dB gain and +9 dBm output power during transmit mode and 28 dB coherent gain, 5.0 dB NF, and -28 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, Tx power telemetry, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 48 lead 6x6 mm QFN for easy installation in planar phased array antennas.
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Pyranometer with Silicon Photodiode
LP471SILICONPYRA
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Pyranometer with silicon photodiade for GLOBAL SOLAR IRRADIANCE measurement.
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Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
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Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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K-Band Silicon SATCOM Rx Quad Core IC
AWS-0102
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The AWS-0102 is a highly integrated silicon quad core IC intended for satellite communications applications. The device supports four dual polarization radiating elements with full programmable polarization flexibility. The device provides 22 dB of gain with a noise figure of 3.4 dB. Additional features include gain compensation over temperature and temperature reporting. The chip features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 56 lead 7x7 mm QFN for easy installation in planar phased array antennas.
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Automatic Online Flatness and Surface Appearance System
UltraSort200
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The UltraSort continues our 25 year tradition of providing metrology solutions to semiconductor wafer manufacturers. Designed for volume wafer production, this automated system offers superior performance in rapid, repeatable, accurate, noncontact qualification of silicon and alternative substrate wafers.
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Probes
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SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Automotive
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The UNH-IOL is taking the lead on providing testing solutions for silicon vendors and Tier 1 automotive suppliers in an environment where connectivity is of growing importance to end users. Our testing helps customers ensure their products work seamlessly with other products in the marketplace.
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Miniature Pressure Sensor
Series 2 Mi
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KELLER AG für Druckmesstechnik
Developed for measuring hydrodynamic and aerodynamic pressures. A silicone drum protects the measurement cell from the influence of vibrations and fast acceleration.
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DMM MULTIMETER TEST LEADS
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Flexible Vinyl Strain ReliefSoft Silicone Leads48" Length, 18 Gauge1000 Working Volts10 AMP RatedLow-resistance Gold ContactsRetractable Safety Shroud
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Semiconductor Large Range Type Tester
HS-PSTT
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HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001～19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
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Hardness Testers
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Dalian Taijia Technology Co.,Ltd
Digital durometer for shore hardness testing pocket size model with integrated probe● Test scale: shore hardness● Standards: DIN53505, ASTMD2240, ISO7619, JISK7215● Parameters displayed: hardness result, average value, max. value● Measurement range:0-100HA(HD)(HC)● Measurement deviation:＜1%H● Resolution: 0.1● Auto switch off● With RS232C interface● Operating conditions: 0℃ to 40℃● Power supply: 4x1.5V AAA (UM-4) battery● Battery indicator: low battery indicator● Dimensions: 162x65x38mm● Weight (not including probe):173g● Application:Shore A is designed to measure the penetration hardness of rubber, elastomers and other rubber like substances such as neoprene, silicone, and vinyl. It can also be used for soft plastics, felt, leather and similar materials.Shore D is designed for plastics, Formica, Epoxies and Plexiglass.shore C is designed for various foam and sponge.
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Photodiodes & Arrays
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Excelitas utilizes Silicon and InGaAs materials for our photodiodes to provide detection from 220 nm to 1700 nm. These devices are offered in a variety of sizes to meet customer sensitivity and speed requirements. Many different types of photodiodes are available to serve various unique applications.
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Digital Solutions
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Dexter's Digital Detectors and Temperature Sensor Modules (TSM's) are based on Dexter's superior silicon thermopile technology and incorporate an ASIC that provides a cost effective front end for reading out the detector output. The digital solutions include pre-amplification, A/D, multi-plexing and SMBus communications. Additionaly, the SMBus can accommodate communications with up to 100 digital products. Our digital solutions are housed in industry standard TO-5/TO-39 packages.
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Digital Pressure Controllers
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Through our continued optimization of the technology and processes that comprise accurate pressure reading, we've established a new standard for digital pressure controllers. Our 780 line offers the same dependability that Additel products are known for with increased silicon pressure sensor accuracy and up to 3,000 psi measurement. Through our latest control sensor configurations, you can automatically identify the ranges most beneficial for your application. Our Additel 780 intelligent pressure controllers also come equipped to read one external sensor and one internal sensor for additional flexibility.
