Silicon
atomic number 14 tetravalent metalloid chemical element.
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Product
Digital Attenuators
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Macom Technology Solutions Holdings Inc.
Digital Step Attenuators (DSA)are offered in up to 6 Bit control with lowest step size of 0.5 dB covering DC to 40 GHz. MACOM's DSAs can be controlled with serial and parallel control allowing for best implementation for our customers. These products exhibit low insertion loss and high attenuation accuracy and are offered both GaAs and Silicon (SOI) processes and are offered in both packaged and bare die form factors.
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Product
Wireless Networking Systems
ZigBee®
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Silicon Labs is the vendor of choice for OEMs developing ZigBee networking into their products. The Silicon Labs ZigBee platform is the most integrated, complete and feature rich ZigBee solution available a family of Wireless SoCs, based on ARM Cortex processor and 2.4 GHz transceiver, together the most reliable, scalable and advanced ZigBee software and supported by best-in-class development tools.
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Product
Life-time Measurement System For Silicon Bulks / Ingots With Non-contact
HF-90R
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*Silicon bulk, Prismatic shape (JIS code), Ingot condition*Non-contact photoconduction vibration decay method*Data processing by digital oscilloscope and PC with software
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Product
Pressure Sensors
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A pressure sensor is a device that senses pressure and converts it into an electric signal where the amount depends upon the pressure applied. TE Connectivity (TE) designs and manufactures pressure sensors ranging from the sensing element to system packaging for harsh environments. We are an industry leader for our range of both standard and custom pressure sensors, from board level components to fully amplified and packaged transducers. Based on piezoresistive Micro-electromechanical systems (MEMS) and silicon strain gauge (Microfused, Krystal Bond) technology, our sensors measure everything from less than one inch of water column (<1.25 mbar) to 100K psi (7K bar).
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Product
Optical Profiler
DRK8090
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Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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Product
Point Contact Diodes
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SemiGen’s 1N Series of Point Contact Mixer Diodes are designed for applications through KA band. Each device in this series is specially designed for low noise gure, impedance and VSWR. Our devices are drop in replacements for all military and commercial requirements. These diodes employ epitaxial silicon grown in a speci c reactor for optimized performance. They are suitable for use in stripline applications.
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Product
Manual Four Point Probe Sheet Resistance/resistivity Measurement
RT70V series
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• Combinational measurement system by Measurement tester(RT-70V) & Stage.• Thickness input with easy JOG dial operation (RT-70V Tester)• Tester self-test function/Auto change-over measurement range function• Thickness & Temperature correction function for Silicon sample
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Product
Step Recovery Diodes
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Macom Technology Solutions Holdings Inc.
MACOM’s Silicon and GaAs varactor multiplier diodes provide broadband performance ranging from 10 MHz to 70 GHz. They are ideal for multiplier circuits and are available in die form, plastic and ceramic packaging. These diodes boast a flip chip series for higher frequency millimeter wave applications; plastic packaged series for microwave frequency surface mount applications; ceramic packaged series for high power waveguide and coaxial applications.
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Product
Embedded PCs
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Powered by NXP, Nividia, Rockchip, and TI silicons, Advantech Arm-based Edge AI Boxes and IoT gateways are designed for the AIoT applications.
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Product
NanoModeScan M² Measuring System
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This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
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Product
Switches-SP6T
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Macom Technology Solutions Holdings Inc.
At MACOM we offer an extensive collection of switches covering multiple commercial and aerospace and defense markets. Our product portfolio has a broad frequency spectrum from DC to 70 GHz. Our silicon Heterolithic Microwave Integrated Circuit (HMIC) PIN diode process is ideal for high power and broadband switches operating from 50 MHz to 26 GHz. Our AlGaAs PIN diode process can extend the upper frequency range of our switch die beyond 70 GHz and is ideal for instrumentation and radar applications. Our GaAs pHEMT and MESFET technology is ideal for fast switching and low control voltage switches optimized for both narrow band and broadband applications. Our 75 Ohm absorptive switches are designed specifically for demanding CATV, FTTx and DBS Infrastructure and CPE applications.
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Product
Ka-Band Silicon SATCOM Tx Quad Core IC
AWMF-0109
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The AWMF-0109 is a highly integrated silicon quad core chip intended for satellite communications transmit applications. The device supports four dual polarization radiating elements with full programmable polarization flexibility. The device provides 22 dB of gain per channel with an output power of +12 dBm per element per polarization. Additional features include gain compensation over temperature, temperature reporting, and Tx output power telemetry. The chip features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 48 lead 6x6 mm QFN for easy installation in planar phased array antennas.
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Product
Electronic Dmm Test Lead Kit For Hand-Held Meters
5543B
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Electronic DMM test lead kit for hand-held meters. Test leads with a right angle banana plug are ideal for use with hand held digital multimeter. Flexible test leads feature high strand count silicone wire for extreme flexibility and high temperature resistance.
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Product
Milk Analyzers
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Measuring parameters: FAT 0.01% - 25%SNF 3% - 15%Density 1015 1040kg/m3Proteins 2% - 7%Lactose 0.01% - 6%Water content 0% - 70%Temp. of milk 1C 40CFreezing point - -0.400 0.700CSolids 0.4 1.5%1. Sample visualization onLCD display(green)2. Possibility to measure 1 sample 90 seconds(option 60 seconds)3. Adapter 220-110 V 4.Spare silicone tubes5. Syringe6. Plastic sample holder7. Calibrations Cow, Sheep, and UHT milk8. Operation Manual9. Cardboard transport case10. CD Service PackMeasuring time 30s
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Product
Precision Integrated Analog Front End, Controller, & PWM for Battery Test & Formation Systems
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The AD8452 combines a precision analog front-end controller and switch mode power supply (SMPS), pulse-width modulator (PWM) driver into a single silicon platform for high volume battery testing and formation manufacturing. A precision instrumentation amplifier (in-amp) measures the battery charge/discharge current to better than ±0.1% accuracy, while an equally accurate difference amplifier measures the battery voltage. Internal laser trimmed resistor networks establish the in-amp and difference amplifier gains (66 V/V and 0.4 V/V, respectively), and stabilize the AD8452 performance across the rated operating temperature range.
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Product
Contactless Wafer Gauge for Resistivity, Thickness
MX 60x
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The MX60x series measure Resistivity or Sheet Resistance of silicon and other materials.
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Product
Process EDXRF Spectrometer
NEX LS
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Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Product
Spectroscopic Reflectometer
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– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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Product
C/D-PHY CSI-2/DSI Analyzer
Envision X84
Analyzer
is the first combination C-PHY/D-PHY analyzer in single platform. The Envision X84 supports C-PHY/D-PHY and Cameral Serial Interface (CSI-2) and Display Serial Interface (DSI/DSI-2) on a single hardware platform. Envision X84 supports C-PHY version 1.1 and D-PHY 2.1 as well as CSI-2 version 2.1 and DSI version 1.3 and DSI-2 version 1.1. The Envision X84 offers Silicon ad device designers, integrators and validation engineers a complete, robust yet flexible tool to ensure the correct and efficient operation of Camera and Display over C-PHY and D-PHY implementations.
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Product
Screen Brightness Tester
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Adopting a detector powered by a silicone photocell with high stability, photostability, and shock resistance, strict vision correction and accurate photometric measurement can be realized.
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Product
Power Meters
Rk-5700
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The Rk-5700 Series Power Meters accept a wide variety of probes – pyroelectric, silicon, and thermopile – enabling them to perform absolute radiometry, total laser power (cw and average), and irradiance measurements from the UV to far-IR, pW to kW. Integrated lock-in amplifier circuitry allows for synchronous detection of chopped optical signals, improving both S/N ratio and background rejection. The dual channel Rk-5720 simultaneously measures Channel A, Channel B, and the ratio B/A. An IEEE-488 GPIB computer interface, Analog Outputs, Background Cancel, and Autorange are all standard features.
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Product
Frame Grabbers
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Active Silicon designs and manufactures a wide range of acquisition solutions based around leading-edge hardware technology and versatile software toolkits. The range includes acquisition solutions for CoaXPress, Camera Link, HD-SDI, SDI and LVDS in different form factors. Operating system support includes 32/64-bit versions of Windows 7/Vista/XP, Linux, QNX, and Mac OS X.
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Product
Digitizer
761 Family
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The 761 is the family of CAEN Waveform Digitizer with the highest sampling rate Flash ADC (10 bit @ 4GS/s). It can record fast signals from fast organic, inorganic and liquid scintillators coupled to PMTs or Silicon Photomultipliers, Diamond detectors and others, and save them with high efficiency and precision for advanced timing analysis. The acquisition can be externally vetoed/gated. Multiple boards can be synchronized to build up complex systems.
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Product
Universal Multichannel System up to 100V
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- From 12 to 48 independently controllable High Voltage channels- 0 ÷ 100 V output voltage- Maximum Current: 1mA, 10 mA or 1 mA/100 μA (dual range board)- Individual Enable (A1510 only)- Either DB37, DB25 or SHV connectors- Available with either positive, negative or mixed polarity- Up to 20 nA / 100 pA current set / monitor resolution- Up to 2 / 0.2 mV voltage set / monitor resolution- Extreme Low ripple, down to < 3 mVpp- 3 different channel grounding- Common Ground (AGxxxx)- Common Floating Return (Axxxx)- Full Floating (A1510 only)- Independently programmable for each channel:- Output voltage- Current limit- Ramp up/down- TRIP parameter- Current generator operation in overcurrent condition- Specific design for double side silicon detector (A1510)
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Product
BGA Sockets
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Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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Product
Laboratory Centrifuges
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Centrifuge systems are designed for the development, test, evaluation and calibration of accelerometers and a variety of inertial devices. Centrifuges provide a cost-effective solution for simulating high-"G" environments in the laboratory. They support testing of devices such as MEMS-based Inertial Measurement Units (IMUs), low-cost quartz or silicon sensors, Ring Laser Gyros (RLGs), Fiber-Optic Gyros (FOGs), fuzes and crash sensors.
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Product
Broadband Detectors
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These waveguide bandwidth detectors use silicon beam lead diodes on a planar stripline circuit to obtain an extremely rugged and compact device. Most millimeter wave broadband detectors have very poor VSWR due to the difficulty in obtaining a good wideband impedance match to the diode. To overcome this problem, these detectors utilize two diodes and an internal matched termination and 3 dB hybrid as shown below. This circuit allows a VSWR of 2.0 or better over a full waveguide bandwidth for most of these detectors. Detectors for waveguides WR-8 and smaller use a single zero bias GaAs diode. The high sensitivity zero bias GaAs diodes can also be special ordered for use at lower frequencies when highest sensitivity is required.
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Product
Diode Arrays
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a silicon diode with minimal packaging overhead. The small signal 0603, 1005 and 1206 Chip Diodes are lead free with Cu/Ni/Au plated terminations while the other packages (SMA, SMB, SMC, 1408, 1607, 2010, 2419, 8L NSOIC, 16L NSOIC, SOT23, SOT23-6, 16L WSOIC) use 100 % Tin terminations. All Bourns® diodes are compatible with lead free manufacturing processes, conforming to many industry and government regulations on lead free components.
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Product
Conductivity Type (P/N) Checker By Contact Thermo-electromotive Force Method (seebek Effect)
PN-12α
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*Thermo electrode and cold electrode is mounted detecting part of measuring probes*Possible to check most figure of sample such as single crystalline silicon wafer, bulk, ingot and so on*Please select from 2 types;1) 2 probe ver.(Hot probe, Cold probe),2) 1 probe ver.(Hot & Cold probe)
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Product
High Temperature, Low Strain Capacitive Extensometers (1200 C or 1600 C)
Model 3648
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Jinan Testing Equipment IE Corporation
These extensometers use a high temperature capacitive sensor in combination with an innovative design to achieve high accuracy strain measurements in low measuring ranges not possible with other high temperature extensometers. They mount on a slide bracket (included) that can attach to the load frame of your test system; optional load frame mounting brackets are available. The overall design reduces any influence from common lab environment vibrations.The standard temperature version (to 1200℃) is supplied with high purity alumina rods. The high temperature option is furnished with alpha grade silicon carbide rods. Rods are made to order to the length required for your furnace. These units are made to order in many different gauge lengths and measuring ranges.The extensometer comes with a signal conditioner. The output is an analog DC voltage, factory calibrated with the extensometer to 0 to ±10 VDC typically. They are readily interfaced with most existing test controllers, and may be directly connected to data acquisition systems and chart recorders. Bringing the signal into a spare DC input channel (or external input) on the test controller allows the extensometer to be used for strain controlled tests like low cycle fatigue.
