Silicon
atomic number 14 tetravalent metalloid chemical element.
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Product
Cam-Over Wrenches
FGC
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Engineered and assembled in Silicon Valley, the Mountz FGC line of precision preset cam-over wrenches are the most advanced torque wrenches for high-level process and quality control.
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Product
Humidification Systems
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The Humidity bottles are made from type 316 stainless steel. Swagelok fittings for gas inputs and outputs are welded into the bottle. Nafion tubing inserted into a type 316 stainless steel spring for support is coiled in the bottle to provide dew-point humidity level for the gas passing through the tubing. The bottle is insulated and heated using a silicone rubber flex-pad.
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Product
Probes
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SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Product
Spectroscopic Ellipsometers
SENresearch 4.0
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The SENresearch 4.0 is the new SENTECH spectroscopic ellipsometer. Every individual SENresearch 4.0 spectroscopic ellipsometer is a customer-specific configuration of spectral range, options and field upgradable accessories. SENresearch 4.0 uses fast FTIR ellipsometry for the NIR up to 2,500 nm or 3,500 nm, respectively. It provides broadest spectral range with best S/N ratio and highest, selectable spectral resolution. Silicon films up to 200 µm thickness can be measured. The measurement speed of FTIR ellipsometry compares to diode array configurations, which are also selectable up to 1,700 nm. The new motorized Pyramid Goniometer features an angle range from 20 deg to 100 deg. Optical encoders ensure highest precision and long term stability of angle settings. The spectroscopic ellipsometer arms can be moved independently for scatterometry and angle resolved transmission measurements.
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Product
Milk Analyzers
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Measuring parameters: FAT 0.01% - 25%SNF 3% - 15%Density 1015 1040kg/m3Proteins 2% - 7%Lactose 0.01% - 6%Water content 0% - 70%Temp. of milk 1C 40CFreezing point - -0.400 0.700CSolids 0.4 1.5%1. Sample visualization onLCD display(green)2. Possibility to measure 1 sample 90 seconds(option 60 seconds)3. Adapter 220-110 V 4.Spare silicone tubes5. Syringe6. Plastic sample holder7. Calibrations Cow, Sheep, and UHT milk8. Operation Manual9. Cardboard transport case10. CD Service PackMeasuring time 30s
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Product
Universal Multichannel System up to 500V
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- From 12 to 48 independently controllable High Voltage channels- 0 ÷ 500 V output voltage (0 ÷ 250 V, A1519B and A1619 only)- Maximum Current 0.5, 1, 10 mA or 1 mA/100 μA (dual range boards)- Individual Enable (A151x only)- Either DB37, DB25, Radiall Multipin or SHV connectors- Available with either positive, negative or mixed polarity- Up to 20 nA, 100 pA current set / monitor resolution- Up to 10 mV / 1 mV voltage set / monitor resolution- Very Low ripple, down to < 5 mVpp- 3 different channel grounding - Common Ground (AGxxxx) - Common Floating Return (Axxxx) - Full Floating (A151x, A1612, A1619)- Independently programmable for each channel: - Output voltage - Current limit - Ramp up/down - TRIP parameter- Current generator operation in overcurrent condition- Specific design for double side silicon detector (A151x)
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Product
NUV-PL SiC Defect Inspection System
VS6845E
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Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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Product
Step Recovery Diodes
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Macom Technology Solutions Holdings Inc.
MACOM’s Silicon and GaAs varactor multiplier diodes provide broadband performance ranging from 10 MHz to 70 GHz. They are ideal for multiplier circuits and are available in die form, plastic and ceramic packaging. These diodes boast a flip chip series for higher frequency millimeter wave applications; plastic packaged series for microwave frequency surface mount applications; ceramic packaged series for high power waveguide and coaxial applications.
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Product
Digitizers
2745 Family
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The 2745 Digitizer is a 64-channel digital signal processor for radiation detectors available in VME64 (V2745), VME64X (VX2745), and Desktop (DT2745) form factor. It offers not only waveform digitization and recording but also Multi-Channel Analysis for nuclear spectroscopy using Silicon strip, segmented HPGe, Scintillation detector with PMTs, Wire Chambers, and others. The 2745 can perform pulse height measurements (PHA), constant fraction timing (CFD), charge integration (QDC) and pulse shape discrimination (PSD) independently for each of the 64 channels.
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Product
PSE Conformance Test Suites for 802.3at & 802.3bt
2-Pair 802.3at & 4-Pair 802.3bt PSE's
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Robust 4-Pair 802.3bt (Type-3,4) PSE Conformance Testing. Fully Automated Port Sequencing and Statistics - Test up to 24 ports with the PSA-3000. Catch Both Repeatable and Intermittent Specification Compliance Issues. Greater than 92% 802.3bt PICS Coverage from 24 Fully Automated Tests. Pop-Up Excel Reports Covering 1 to 24 Ports. Widely Used by PSE System and Silicon Manufacturers World Wide.
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Product
Rectifier Diodes
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Chip Diodes from Bourns has emerged that offers the capability to provide a silicon diode with minimal packaging overhead. The small signal 0603, 1005 and 1206 Chip Diodes are lead free with Cu/Ni/Au plated terminations while the other packages (SMA, SMB, SMC, 1408, 1607, 2010, 2419, 8L NSOIC, 16L NSOIC, SOT23, SOT23-6, 16L WSOIC) use 100% Tin terminations. All Bourns® diodes are compatible with lead free manufacturing processes, conforming to many industry and government regulations on lead free components.
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Product
PIN Diodes
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PIN photodiodes convert light to current – without a bias voltage having to be applied. Silicon is commonly used as an inexpensive detector material in the Vis range. For higher demands, InGaAs is used; it covers the widest spectral range from the Vis to the NIR. We offer silicon carbide as a “solar-blind” detector specifically for the UV range.
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Product
Manual Four Point Probe Sheet Resistance/resistivity Measurement
RT70V series
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• Combinational measurement system by Measurement tester(RT-70V) & Stage.• Thickness input with easy JOG dial operation (RT-70V Tester)• Tester self-test function/Auto change-over measurement range function• Thickness & Temperature correction function for Silicon sample
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Product
Pyrgeometer Low Temperature dependence of sensitivity
CGR 4
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CGR 4 pyrgeometer is an instrument for the highest quality scientific measurements. The specially designed meniscus dome provides a 180 field of view with negligible directional response error. A hard-carbon coating on the outside of the dome smoothes the spectral response and provides extra protection to the silicon surface.
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Product
Semiconductor Metrology Systems
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MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Product
Photometers & Colorimeters
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Instrument Systems Optische Messtechnik GmbH
A photometer is used to measure the photometric quantities of illuminance (lx), luminous intensity (cd), luminous flux (lm), and luminance (cd/m²). The integral method and the fast response time of silicon photodiodes means that photometers can achieve an outstanding measuring speed. They are therefore ideal for performing fast goniophotometric measurements. We take great care in the development and production of photometer heads and use innovative amplifier technologies.
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Product
Power Discretes
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Our power discrete products are high-quality solutions for a wide range of high-voltage and high-power applications. They include a variety of high-voltage Switch Mode Power Supply (SMPS) transistors—Insulated-Gate Bipolar Transistors (IGBTs) Silicon Carbide (SiC) MOSFETs and Silicon MOSFETs—Diodes and Radio Frequency (RF) MOSFETs. Many of our products are offered in single- and combi-packaged options across a variety of voltage ratings, currents, and package styles.
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Product
Schottky Barrier Bridge Quads
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SemiGen’s Silicon Schottky Diodes are designed for applications through 40Ghz. The special process technology utilizes various metal schemes to provide excellent performance of Low, Medium, and High Barrier applications. The end result is a low resistance diode with tightly controlled capacitance which allows for optimum performance. Low conversation loss and superior TSS make these diodes ideal for detector / mixer applications with frequency ranges from S band to Ka band as well as modulators, lower power limiters and high speed switches.
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Product
Cameras
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Active Silicon offers a range of autofocus-zoom block cameras. Camera features include multiple output options, compact size, global shutter, powerful zoom and our own range of Harrier cost-effective block cameras.
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Product
Wireless Networking Systems
ZigBee®
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Silicon Labs is the vendor of choice for OEMs developing ZigBee networking into their products. The Silicon Labs ZigBee platform is the most integrated, complete and feature rich ZigBee solution available a family of Wireless SoCs, based on ARM Cortex processor and 2.4 GHz transceiver, together the most reliable, scalable and advanced ZigBee software and supported by best-in-class development tools.
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Product
Voltage Controlled Oscillators
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Teledyne RF & Microwave offers Voltage Controlled Oscillators (VCOs) utilizing bipolar transistors & silicon varactors over the frequency range of 40 MHz to 18GHz. Many of the VCO designs incorporate internal filtering, regulation & amplifiers to meet total system requirements in a small integrated package. Additionally, our hermetic hybrid designs can be screened to the most demanding military and space applications.
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Product
Blackbody System
IR-564/301
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Infrared Systems Development Corp.
The IR-564 extends the temperature range of the IR-563 to 1200 º C by changing cavity materials to Silicon Carbide and high purity Alumina ceramics, otherwise the two units are virtually identical.
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Product
High Temperature, Low Strain, Extended Performance Capacitive Extensometers
Model 7650A
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Jinan Testing Equipment IE Corporation
Model 7650A extensometers measure strains with extremely high precision due to their design features and low strain range. All models are capable of tension and compression strain measurement, and may be used for fatigue testing under fully reversed load and strain conditions at frequencies up to 10 Hz.All 7650A models mount rigidly on the load frame and incorporate slide mounting to bring the extensometer into contact with the specimen. The gauge length is set automatically before mounting on the test specimen, which allows for hot mounting after thermal equilibrium has been reached.These units are specifically designed to provide high accuracy, high resolution measurements and perform high temperature fatigue testing at the highest possible frequencies. They incorporate capacitive sensors for low operating force and include electronics with programmable filtering and multi-point linearization for improved performance and accuracy. The overall design minimizes, and in many cases virtually eliminates, any influence from common lab environment vibrations.These water-cooled extensometers are equipped with high purity alumina rods for specimen contact when testing to 1200℃ (2200°F). Silicon carbide rods are used for the 1600℃ (2900°F) high temperature option.The Model 7650A is often customized for specific test needs. Contact Epsilon for a configuration that matches your requirement.
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Product
MICROWAVE SWITCHING DIODES FROM 1 to 40 GHz
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Insight Product Company offers Microwave Switching Diodes with switching time up to 3 nsec and operating in frequency range from 1 to 40 GHz. The p+ -n - n+ silicon spackage-less switching diodes are designed to be used in microwave switching devices, phase changers, modulators, microwave attenuators - parts of hybrid microcircuits that provide capsulation and protection against ambient action.
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Product
BGA Sockets
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Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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Product
Semiconductor Functional Verification Tools
Trek5
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Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
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Product
Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Product
Semiconductor Large Range Type Tester
HS-PSTT
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HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001～19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
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Product
Digitizer
724 Family
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The 724 is a family of CAEN Waveform Digitizer able to perform basic waveform recording and run online advanced algorithms (DPP) of pulse height analysis and dynamic acquisition window. Data is read by a Flash ADC, 14-bit resolution and 100 MS/s sampling rate, which is well suited for high resolution detectors as Silicon, HPGe or inorganic scintillators like NaI or CsI coupled with Charge Sensitive Preamplifers. In the waveform recording mode, algorithms of zero suppression are also implemented to reduce the data throughput. The acquisition can be channel independent and it is possible to make coincidence/anticoincidence logic among diferent channels and external veto/gating. Multiple boards can be synchronized to build up complex systems.
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Product
Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
