Test Pattern Generators
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Product
Pattern Matching Sensor
AI Series
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For use in wide variety of industriesfrom automotive, metal,and electronics to food, medicine, and beyond. The sensor that can betaught AUTOMATICALLY using only one button.
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Product
EPA-5 General Purpose Probe
General Purpose Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,420Overall Length (mm): 36.07
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Product
In-Circuit Test Systems For Sale
Test System
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Product
Generate MC/DC Test
VectorCAST/MCDC™
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Modified Condition / Decision Coverage (MC/DC) provides two levels of verification for conditional expressions. The first level, named MC/DC Branches, tracks each subcondition in an expression to verify that is has been tested with both True and False values. The second level, named Equivalence Pairs, verifies if each subcondition can affect the value of the condition. This is done by generating a truth table for the expression, and then finding a pair of rows in the table that will generate a different result when all values except the tested value remain constant.
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Product
Omni-Directional Radiation Pattern, Compatible For WiFi5/6
AIW-510
Dipole Antenna
Dipole antenna with omni-directional radiation patternCompatible for WiFi5/6RP-SMA male connectorOperating Temperature: -40 ~ 85℃
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Product
Generators
Random Vibration
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Random vibration Software program is used for testing the specimen resistance to random vibration impact. This program is a part of vibration controller ZET017-U.
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Product
Alternate 2.54 (72.00) - 6.20 (176.00) General Purpose Probe
HPA-52D-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
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Product
Test Case Generator
Hexawise
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Use Hexawise to design better tests. Maximize test coverage with the minimum number of test cases. Find twice as many errors per tester hour. Manually-designed software test plans often omit combinations of functions and configurations that need to be tested. Hexawise leaves no gaps and ensures all important combinations get tested.
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Product
Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74B-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
Alternate 6.00 (17.00) - 2.50 (71.00) General Purpose Probe
P2662AG-1Q2S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Product
Wireless Test Standards Software
test
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Product
6GHz Single Channel Portable Signal Generator
LS6081P
Signal Generator
The LS6081P, 6GHz Single Channel RF Analog Signal Generator, offers industry leading performance, in a modern tablet like design that can be used as a benchtop or portable unit. The LS6081P features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The LS6081P was designed to offer excellent performance and meet today’s most demanding applications, whether in the lab or out in the field.
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Product
2D Antenna Pattern Measurements
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The world's top antenna manufacturers utilize MET Labs for 2D Antenna Pattern Measurements to compare an antenna's real-world performance versus its theoretical performance
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Product
General Purpose Switches
SMX-5XXX (General Purpose)
General Purpose Switch
The VTI SMX-5xxx Series of general purpose switches deliver exceptional performance and reliability by implementing extensive signal path shielding, isolation and built-in health monitoring. Embedded virtual schematic control simplifies setup and debugging, allowing all relays to be engaged independent of application software and device drivers.Ideally suited for a wide range of discrete signal switching, the SMX-5xxx Series provides uncompromised measurement integrity ideal for the most demanding aerospace, defense and automotive automated test equipment (ATE) applications.
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Cloud-based API Testing & OpenAPI Documentation Auto- Generator
Swagger Inspector
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Swagger Inspector is the newest and easiest way to test and auto-generate OpenAPI documentation for any API. Using Inspector, developers can easily call any API end-point, and see if the response is what was expected. Inspector’s simple UI is built to allow developers to test as quickly as possible without any learning curve or process change.
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Product
Dual Channel Arbitrary Waveform Generator 9GS/s 8Bit, 4GS Mem 2CH 8 Markers AWG
P9082M
Waveform Generator
The Proteus P9082M, is a PXIe based, 9GS/s, dual channel arbitrary waveform generator offering technologically advanced options and configurations such as, a dual channel 2.7GS/s digitizer with 9GHz bandwidth, to transform the instrument to an arbitrary waveform transceiver. The P9082M offers industry leading performance Including an innovative task oriented programming, real time data streaming, fast feedback loop for environment dependent waveform generation and user customizable FPGA for application specific solutions.
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Product
General Purpose Probes
General Purpose Probe
*High current*Fine pitch*Long travel*Mounting options
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Product
Hybrid Single Site Test Handler
3110
Test Handler
Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T156
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Test Platform
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
12 GSa/s Arbitrary Waveform Generator
M8190A
Arbitrary Waveform Generator
From low-observable systems to high-density comms, testing is more realistic with precision arbitrary waveform generation. Now you can take reality to the extreme: A Keysight AWG is the source of greater fidelity, delivering high resolution and wide bandwidth simultaneously. This unique combination lets you create signal scenarios that push your design to the limit and bring new insight to your analysis. Get bits and bandwidth and enhance your reality.
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Product
Arbitrary/Pulse Generator
TG251xA/501xA
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Waveform Manager Plus for Windows software included.Programmable via USB and LAN (LXI) interfaces; GPIB optional.
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Product
MXG X-Series RF Analog Signal Generator, 9 kHz to 6 GHz
N5181B
Signal Generator
Take your devices & designs to their limit with outstanding hardware performance, including unmatched phase noise & spurious characteristicsDrive power amplifiers & characterize nonlinear behavior with industry-leading output powerThoroughly test receiver performance by simulating complex analog modulation scenarios with multi-function generator capabilityLower your cost of ownership with 3-year cal cycles & comprehensive solutions for self-maintenance
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Product
Signal Generator
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bsw TestSystems & Consulting AG
Especially for signal generation above 50GHz and in waveguide bands is done with a standard lower microwave generator and then the signal is frequency multiplied to get to higher frequencies. The frequency multiplied signal may optionally be filtered to make it spectrally pure and/or amplified to come to an appreciable signal level.
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Product
Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74E-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
PCIe 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 4 Channels, up to 80 MS/s on 8 Channels
M2p.6568-x4
Arbitrary Waveform Generator
The M2p.65xx series offers different versions of arbitrary waveform generators for PCI Express with a maximum output rate of 125 MS/s. These boards allow to generate freely definable waveforms on several channels synchronously. With one of the synchronization options the setup of synchronous multi channel systems is possible as well as the combination of arbitrary waveform generator with digitizers of the M2p product family.
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Product
Surge Generator
SG61000-5
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Automatic lightning surge generator (or Lightning surge immunity) SG61000-5 is used to assess the power cord and connect the internal switch stood in line to connect the internal switch to provide a common basis for switching the natural world and lightning caused by the high-energy transient interference performance. Performance fully meets the IEC 61000-4-5, EN61000-4-5 and GB/T17626.5 standards.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
