Test Pattern Generators
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Product
50MS/s PCIBus Arbitrary Waveform Generator
5325
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Model 5325 is a Single-Channel Arbitrary Waveform Generator that combines many powerful functions in one small package. Supplied free with the instrument is ArbConnection software, which is used for controlling the 5325 and for generating, editing and downloading waveforms from a remote computer.
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Product
Test Platforms
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Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
Alternate 1.00 (28.00) - 2.00 (57.00) General Purpose Probe
P2663G-1P2S
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Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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PXIe-5745, 12-Bit, 6.4 GS/s, 2-Channel PXI FlexRIO Signal Generator
785596-02
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The PXIe-5745 enables direct RF generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s for generation up to 1.5 GHz or in a single-channel wideband upconversion mode at 6.4 GS/s. The PXIe-5745 is ideal for applications that require high channel density IF signal generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for generating predefined waveforms, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA for dynamically creating waveforms, signal modulation/demodulation, and other custom real-time signal processing.
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Pattern Conversion
Wave Wizard
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Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective.
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TestStand
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TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Functional Test Fixtures
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Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Product
Standard 1.10 (31.00) - 3.85 (109.00)General Purpose Probe
SPA-64-4
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3: 0,365″; Tip 8: 0,385″; Tip ,9,10: 0,363″
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NTSC Test Signal Generators
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Provides an economical means for generating the most common SD analog composite video reference timing signals required to operate various SD analog composite video switchers, effects generators, VTRs/VCRs, cameras, video edit controllers, and other professional video equipment.
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Standard 1.00 (28.00) - 2.30 (65.00) Non Replaceable General Purpose Probe
P2532-2
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Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 156Test Center (mm): 3.96Full Travel (mil): 139Full Travel (mm): 3.53Recommended Travel (mil): 93Recommended Travel (mm): 2.36Overall Length (mil): 812Overall Length (mm): 20.62Rec. Mounting Hole Size (mil): 94.5Rec. Mounting Hole Size (mm): 2.40Recommended Drill Size: #41 or 2.40 mm
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Product
40GHz Single Channel MW Benchtop Signal Generator
LXS4091B
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The LSX4091B is a 40GHz Single Channel Microwave Signal Generator, offers industry leading performance, in an easy to use benchtop box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Product
PXIe-5442, 43 MHz Bandwidth, 16-Bit Onboard Signal Processing, 512 MB, PXI Waveform Generator
780109-03
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PXIe, 43 MHz Bandwidth, 16-Bit Onboard Signal Processing, 512 MB, PXI Waveform Generator—The PXIe‑5442 is a 43 MHz arbitrary waveform generator capable of generating user-defined, arbitrary waveforms, standard functions including sine, square, triangle, and ramp, as well as signals that require onboard signal processing. Some of these signal processing operations include FIR and CIC interpolation filters, digtal prefilter gain, numerically-controlled oscillator, and I/Q mixing for quadrature digital upcoversion. The PXIe‑5442 also features advanced synchronization and data streaming capabilities.
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Pattern Generator
PI-2005
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As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
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The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
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Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Product
NFC Conformance Test System
T3111S
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The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Pattern Generators
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Active Technologies Data Pattern Generators offer a complete and unique portfolio of instruments to address a wide range of applications starting from Digital Logic and Semiconductors characterization, Aerospace & Defense compliance testing, Mixed Signal Systems testing to Signal Integrity experiments.
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Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3H
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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6TL08 Benchtop Test Platform
H710008
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The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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NTSC PATTERN GENERATOR
PG-28
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Model PG-28 NTSC Pattern Generator can be use to quickly and easily troubleshoot, test, and align NTSC television. Features a wide selection of popular video patterns including Color Bars, Crosshatch, Dot, Staircase, Circle, Center Cross, Window, and Raster for accurate and comprehensive TV troubleshooting and testing. Supports both progressive and interlace scanning system. Composite video and S-Video output. 1KHz audio tone for audio troubleshooting.
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General Test
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Helps technicians diagnose and troubleshoot problems with twisted pair cable. Easily install, qualify, and maintain DSL services.
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Automatic Test System
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Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
6GHz Four Channel Signal Generator 19" 1U Rack Module
LS6084R
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The LS6084R, 6GHz four channel RF Analog Signal Generator, offers industry leading performance, in a 1U, 19” space efficient, rack-mounted box. The LS6084R features four phase coherent channels, exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The LS6084R was designed to offer excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Communications Test System for Frontline Diagnostics
CTS-2750
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The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Standard 2.00 (57.00) - 3.60 (102.00) General Purpose Probe
P2664G-1R1S
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Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 10Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 114Full Travel (mm): 2.90Recommended Travel (mil): 84Recommended Travel (mm): 2.13Overall Length (mil): 895Overall Length (mm): 22.73Overall Length Remark: Tip 1C: 845 mil (21.46 mm) Tip 2R: 935 mil (23.75 mm)
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Test Pattern GeneratorDelay & AV Sync Analyzer
VQDM-100
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Versatile compact and robust multi-purpose tool for R&D and glass-to-glass QA/QCInstant visual-aural quality estimation plus automatic latency, AV sync and 3D LR sync measurementMulti-channel time-line analysis, including video frames continuity testing4 Light Sensors with vacuum caps, 4 Audio inputs (standard line levels)2 channels of AV timing analysis, simultaneous measurements of Video and Audio LatenciesReal time multi-channel data acquisition via USB portUnique sophisticated set of static and dynamic test patterns up to 1080p@60fps - see more details in separate VQL pageSource of VQDM, VQMA2, and VQMA3 Test Patterns for VideoQ AnalyzersMulti-format digital and analog AV outputs: HDMI, YPrPb, S-video, SPDIF, LR analog audioNetworkable unit, easy expansion with any external USB storage device: live clips, user content, etc.
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Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
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Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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PCI-5412, 100 MS/s, 14-Bit Waveform Generator Device
779177-03
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The PCI‑5412 can generate user-defined, arbitrary waveforms and standard functions, including sine, square, triangle, and ramp. This arbitrary waveform generator can generate signals from -6 V to +6 V and uses direct digital synthesis (DDS) to precisely generate waveforms.





























