Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Aggregates Testing Equipment
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Aggregates are one of the most important construction materials, used as a composite material in concrete and asphalt, and as a base material in foundations, roads, and railways. The high hydraulic conductivity of aggregates also makes them ideal for drainage applications and as filter media. With so many different applications, ELE’s range of aggregate testing equipment performs a vital role in checking performance characteristics against specifications, quality control, new source assessment and the prediction of in-service behaviour.
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Electronic Test Equipment
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Teledyne LeCroy offers a comprehensive range of electronic test equipment solutions to complement our well known family of oscilloscopes and analyzers. We offer these tools under both the Teledyne LeCroy and Teledyne Test Tools brand names. The Teledyne Test Tools family of products was created in collaboration with leading OEM technology partners and comes with the world class service and support you've come to expect from us.
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Laser Test Systems
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Santa Barbara Infrared, Inc. offers an extensive family of test systems and components that test and characterize the performance of laser range finders, designators, illuminators and spot trackers.
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Test Handler
JOT M5
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Simple, cost-effective way to automate PCB and pallet based testingSafe, reliable product handlingQuick-adjust ease: no product-specific partsFaster handling of smart productsIndustry 4.0 autonomous interconnectivityTruly scalable for growing test needsReusable, application-specific test boxesM-TestBoxes compatible with M1 handlerBoxes are fully independent, just pull out from M5 rack and use in off-line testingFail product separation to integrated magazineSpacious service-friendly constructionErgonomic workspaceTouchscreen UI with base statistics and service capabilityEasy start-stop operabilityAutomated width adjustment
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Exchangeable Test Fixture
MA 2112/D/H/S-7
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 11,30 kg
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Leak Test Accessories
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Cincinnati Test Systems offers a variety of leak test accessories to compliment your needs for air leakage testing equipment. The accessories support calibration, verification processes, and system troubleshooting. In addition to leak standards, seals, and connectors, CTS provides a range of high and low pressure gauges.
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Continuous Testing Platform
TOSCA
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Tricentis Tosca is a Continuous Testing platform that accelerates testing to keep pace with Agile and DevOps. With the industry’s most innovative functional testing technologies, Tricentis Tosca breaks through the barriers experienced with conventional testing tools. Using Tricentis Tosca, enterprise teams achieve unprecedented 90%+ test automation rates—enabling them to deliver the fast and continuous feedback required for Agile and DevOps.
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Scattered Light Dust Measuring Devices
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The reliable way to detect low dust concentrationsLight scattering by dust particles is a measurement principle that allows even very low concentrations of dust to be detected. Depending on the system-specific requirements, either forward scattering or backward scattering can be used in this context. Both measurement principles return stable and reproducible measurement results, regardless of the gas velocity, humidity, or dust particle charges.
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Vibration Test Systems
G-5 Series
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Both Shock tests at from relatively high acceleration(max. 4900m/s2 -500G) to low acceleration with wide pulse width, difficult to achieve with conventional Shock Test Systems and Vibration tests for not only IEC, MIL and JIS but also requiring higher acceleration, velocity and displacement than ordinary VTSs can be carried out with one system.
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DC Insulation Testing
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Weshine Electric Manufacturing Co., Ltd
Cable harness tester is used for test and measure wire cable harness,wire harness, like as : auto cable, audio cable, power cable, network cable, telephone cable, USD cable, HDMI cable,video cable, etc. .
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DIP Test Clips
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Low-profile fine-pitch chips, desnely populated boards, or vertical boards, Pomona test clips connect you with confidence.
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Test Stands DC
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forms e.g. B. together with an MTS750 source system, a DC meter testing device with a maximum of 40 measuring stations
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Microwave Testing
50A
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The GGB Industries, Inc., MODEL 50A probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 50A achieves an insertion loss of less than 1.0 db and a return loss of greater than 18 db through 50 GHz.
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USB-6501, 24-Channel, 8.5 mA, Digital I/O Device
779205-01
Digital I/O
The USB-6501 is a portable, bus-powered USB digital I/O device, providing reliable data acquisition and control at a low price. The device provides overvoltage protection its digital I/O lines and a 32-bit counter. With plug-and-play USB connectivity, the USB-6501 is simple enough for home and academic applications, but robust and versatile enough for laboratory and industrial applications.
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VLF Insulation Testing
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VLF testing uses very low frequencies as part of an AC cable maintenance routine. VLF testers are smaller and more practical than AC testers but output the same amount of power as a 50 Hz mains device. This combination of size and power makes Very Low Frequency cable testing perfect for testing longer sections of cable and apparatus
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Flammability Test System
COMP0804CAP
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Active flammability test system according to IEC 60384-14 Ed4. For testing X & Ycapacitors up to 1uF. The test system includes control of the nominal AC supply via an integrated variac up to 1800V. Impulse amplitudes are programmable up to 8kV which covers all requirements. X1 capacitors are stressed up to 4kV, X2 and Y4 capacitors up to 2.5kV and Y2 capacitors up to 5kV.
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Thermal Test Chip
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Thermal Engineering Associates, Inc.
Thermal Test Chips (TTC) are used in many different Applications: Package Thermal Characterization, Heat Source Simulator, Temperature Reference Platform, Transient Analysis, System Thermal Management Design, Thermal Interface Material (TIM) Measurement & Characterization, Heat Sink Measurement & Characterization.
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Environmental Testing
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D.L.S. Electronic Systems, Inc
D.L.S. Conformity Assessment provides testing services for environmental tests under its accredited ANAB/ACLASS ISO 17025 program. This globally accepted accreditation covers environmental and mechanical testing that include vibration and shock, temperature extremes , sand and dust, fluid and chemical resistance, altitude, humidity, salt spray, ingress protection, icing, flammability and other related testing services.
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Bond Testing
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Our complete line of bond testing (BT) flaw detectors provides unmatched capabilities for the location of discontinuities and other flaws in composite structures. We offer a wide range of measurement features and application-specific options for flaw detection.
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Thermal/Mechanical Testing
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Accolade Engineering Solutions
As new products employ advanced materials and processes, the need to measure and characterize those material properties becomes increasingly important. DSC is used to measure heat flow in to or out of a material. Some DSC applications include measurement of melting temperature, polymorphic transitions, crystallization temperature, thermal stability, heat of fusion and degree of cure. TMA is used to measure dimensional changes of a material as a function of temperature.
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Product
PCIe-6535B, 32-Channel, 10 MHz, 40 MB/s Digital I/O Device
782629-01
Digital I/O
The PCIe-6535 can continuously stream data over the PCI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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Active Device Characterization Solution Up To 43.5 GHz For 5G
N5244BM
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The N5244BM provides the N5244B 43.5 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 43.5 GHz for 5G applications.
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Highest Throughput For Fragile Devices
Ismeca NY20
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20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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Material Testing
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With so many materials and applications in the world, you need to know that you can trust your products are durable and do what your engineers designed them to do. Manufacturers rely on results from hardness testing and international safety standards require materials to have a specific hardness or stiffness. Different metals need to be tested according to different hardness testing standards, whether it’s using a Rockwell, Brinell, Vickers or a Universal machine. Bowers Group have a variety of portable, bench and floor models in our product range to provide a solution for your hardness testing needs, whatever it may be.
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Safety Testing
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Mobile Power Solutions specializes in guiding your company through today’s increasing quagmire of battery-related safety regulations. MPS provides comprehensive regulatory compliance, safety, and performance testing; we are ANAB accredited to ISO/IEC 17025:2017.
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Electrical Signal Test
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High-density, multi-channel pulse pattern generators and bit error detectors for the design, characterization and production test of optical transceivers and opto-electrical components.
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Measuring Devices for Magnetically Soft Materials
TMAG-RJJ-3.1
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The system is a mobile version of computerized measuring system MAG-RJJ-6.0 and is designed for measure the dynamic magnetic properties of the soft magnetic materials e.g. oriented or not-oriented electrical sheet. The system provides the opportunity of a tabular and graphic presentation of the obtained data, which can be presented by means of monitor, printer or plotter. The system works under Windows 2000/XP.





























