Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Product
One Phase Electric Power/Energy Calibrator
MC133
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The MC133 master unit model is a one phase electric power/energy calibrator. It can supply the device under test with single phase precise voltage and current with calibrated phase shift along with DC voltage and current capability. Output voltage can be set in five ranges up to 280V and output current in six ranges up to 30A. Simulated electric power can be set independently for each phase. Frequency can be set from 15Hz to 1 kHz with resolution 0.001Hz to 0.01Hz. The MC133 Calibrator is equipped with 5 1/2 digital DC meter with DC ranges 20mA or 10V for direct calibration of various types of power transducers and wattmeters.
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Product
PXI Battery Simulator 2.8 Amps
41-753-001
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The 41-753 is a battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals that can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
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Product
CMX RF Port Extender
CMX-Z25
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Complex devices under test (DUT) come with additional antenna ports to support low, mid and high bands - and advanced MIMO schemes such as 4x4 MIMO. The R&S®CMX-Z25 is the solution: Up to 16 DUT ports can be supported with just 4 ports from R&S®CMX500. So even prototypes of 5G smartphones, tablets, laptops or industrial modules with an extended number of antenna ports can now be connected to a single R&S®CMX500. Together with the scalable CMX architecture any 5G and 5G Advanced mobile device can now be tested in one go - without recabling or 3GPP band combo limitations.
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Product
Bulk Current Monitoring Probe
MP-50
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The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.
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Product
LXI Matrix Switching Unit
ProDAQ 6140
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The ProDAQ 6140 provides a relay matrix which can be fitted between the sensors and actuators on a device under test and the data acquisition and control system. It allows to separately connect/disconnect the signals from either side and to connect them to an internal bus. In this way signals can be routed via the bus to new destinations or the bus can be used to monitor or supply test signals. This allows calibrating and debugging the system without disconnecting and separating channels throughout the system wiring.
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Product
Regenerative Power System 2000 V, ±30 A, 30 KW, 400/480 VAC
RP7983A
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The RP7983A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Product
Test Probe
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Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
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Product
700 V, 25 MHz High-Voltage Differential Probe (÷10, ÷100)
AP031
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The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Product
EMI Test Receiver
ESL
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The R&S®ESL EMI test receiver combines two instruments in one, measuring EMC disturbances in accordance with the relevant standards and also serving as a full-featured spectrum analyzer for diverse lab applications. The combination of very good RF characteristics and all of the important functions needed for fast, precise measurement and evaluation of the EMC of a device under test in accordance with commercial standards is unmatched in this instrument class.
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Product
Two-Quadrant SMU For Battery Drain Analysis, 20 V
N6781A
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The Keysight N6781A is a source / measure unit (SMU) designed specifically for the task of battery drain analysis. Whether the device under test (DUT) is an eBook reader, MP3 player, mobile phone, or pacemaker, the N6781A’s seamless measurement ranging, programmable output resistance, and auxiliary DVM combine the best set of advanced features on the market for battery drain analysis. When used with the 14585A Control and Analysis software, the N6781A becomes an even more powerful battery drain analysis solution, offering additional insights into your measurements. Learn more about the 14585A Control and Analysis software.
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Product
sbRIO-9239, Non-Enclosed, ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780875-01
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Non-Enclosed, ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the sbRIO‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range. Non-enclosed modules are designed for OEM applications.
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Product
Single Board Source/Meter/Switch
SMSU
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SMSU Series SourceMeterSwitch Unit (SMSU), introduced by SW Link Ltd, is single-channel voltage/current sourcing, 4X6 switch matrix and measurement instruments. Each Series 100 SMSU instrument tightly integrates highly accurate stable DC power source and a true instrument-grade programmable gain amplifier and 18bits ADC on a 100x100mm PCBs. It can output up to 20V, sub-uA to 1A current to device under test (DUT)
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
PXIe-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
780587-15
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PXIe, 35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXIe‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXIe‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
Multiplexers
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Capable of performing the necessary switching between test points of the device under test, to give access to low frequency measuring instruments, in electronic test systems based on tool receivers.
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Product
Regenerative Power System, 20 V, ±800 A, 10 KW, 400/480 VAC
RP7943A
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The Keysight RP7943A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Product
Hand Held Test Fixtures
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Manual, or semi-automated mechanical devices designed to secure a Device Under Test (DUT) and provide a stable interface for electrical testing, inspection, or programming.
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Product
PXI-2547, 2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module
778572-47
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2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module—The PXI‑2547 is an RF signal multiplexer switch module. The higher channel count of the PXI‑2547 makes it ideal for test systems that require the switching of a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
Function Tester with Low Number of Channels
UTP 6010 RF
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The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
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Product
Accessory EFT/Burst generators IEC 61000-4-4
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The field sources and the burst transformer are used to harden the device under test. They are powered by an EFT/burst generator.
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Product
Functional Test Fixtures
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Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Product
12-Ch SPST 4A-250VAC 24VDC High Current Power Switching
YAV90PIN
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The YAV90PIN board is designed to cover the need to control the available power supplies in a test system to the device under test. A VPC 90 series connector is used as interface with the fixture, guaranteeing more than 20.000 mating cycles. Two connector contacts per relay contact are used.
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Product
PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
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±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
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Product
Mini Burst Field Generators
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Mini burst field generators are small and handy burst generators used to detect weak spots in the device under test.
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Product
Multi-Channel Attenuation Control Unit (5-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7205B
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The J7205B is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to 5 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205B reduces cost of ownership and provide the best measurement accuracy.
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Product
AC High Voltage Tester
VHT
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VEER make High Voltage Tester VHT is specially designed to test Dielectric Strength of Device under Test as per applicable standards. High Voltage test is required to determine whether test object has proper insulation or not. High Voltage test is carried out as Routine Test Each device is subjected to test at high voltage of 1 kV + 2 x (working Voltage)If Insulation is weak then device will consume more power because of leakage current which causes more heat. Heat will reduce the reliability and overall life of device under test It is also responsible for high risk of electric shock. So, High voltage test is necessary for all electrical equipments.
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Product
Regenerative Power System, 2000 V, ±30 A, 20 KW, 400/480 VAC
RP7973A
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The RP7973A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
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The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
NI-9224, ±10 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783862-01
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±10 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9224 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9224 is simultaneous sampling with two options for filtering a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
