Memory Test Systems
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Product
Modular Test System
IMU-MGS
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Modular test system with colour touch screen and intuitive software. An integrated help with graphics guide the user through fast and efficient setup and operation. The system is used for CE mark testing in the European Union.
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Product
Seat Actuation Systems
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Extensive solutions for seating cabin interiors including motion and lighting controllers, linear and rotary actuators, power supplies, passenger interfaces, custom harnesses, sensors, pneumatic units, and bladders.
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Product
VPX Processing System
CRS-D4I-3VB1
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4-slot, SWaP-reduced, rugged VPX Intel base plate cooled data processing system that can be applied across various applications including civilian and military unmanned vehicles, manned commercial and military aircraft, helicopters, over- and underwater research vessels, ground vehicles, and locomotives.
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Product
Transportation Bounce Test System
KRD51 series
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Bounce testing simulates the constant loose cargo state during truck transport. Often times, containers carrying military and civilian hardware (such as: medical supplies, electronics, weaponry, communication devices) travel for extended periods of time and must be transported off-road. All of these items must maintain functionality upon arrival at their destinations.
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Product
Test System
ETS788XL
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The 50/100 MHz ETS788XL system is the compact protable version of our ETS788. Made with the new high-performance precision components of our Griffin series, this portable powerhouse offers an optional tough road case and ready to go to any test site needed. Just pop off the covers and get started. Whether it's research, Failure Analysis, or single-event effects testing, his powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date.
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Product
Drop Test System
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HIACC Engineering & Services Pvt. Ltd.
HIACC's Drop Test System is a specialized, automated testing apparatus designed to simulate real-world handling and transportation hazards, determining the "drop bearing capacity" (durability) of products and their packaging.
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Product
SODIMM DDR4 3200MT/s
SQR-SD4S
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Original Hynix IC chips adopted, Data transfer rate: 3200MT/s. Capacity: 4/8/16/32GB, Operating temperature: 0 °C ~ 85 °C Lifetime warranty.
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Product
Modular Hydrostatic Test System
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Our modular hydrostatic test chambers are designed with open ends to accommodate the connection to similar units for the purpose of lengthening the enclosed test area. The modular test system starts with a base unit with complete pump system, gauges and controls mounted on the 60” x 24” x 18” test chamber. If longer test lengths are required, simply add another test chamber to double, triple or quadruple the test length area. Specify your particular requirements at our Customization Page.
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Product
PXI Test System
APT-1000
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18 Slot NI PXI chassis (PXIe-1065)Amfax MDU with E-StopMAC Panel SCOUT Receiver chassis and tableProgrammable DC power supply4 channels- 0-30V 2AFan Vented 29u Instrumentation rackIndustrial PC i7- Windows 7 or 1024 inch touchscreen LED Monitor on armLight TowerCE CertifiedFully wired and testedFull documentation packDelivery and commissioning on site
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
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The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Ionic Contamination Test Systems
CM+ Series
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The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric introduced by Gen3 Systems: Process Ionic Contamination Testing. The CM+ Series measure the amount of ionic contamination in accordance with all existing test methods, often referred to as ROSE testing, as well as the new PICT test.
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Product
Plug-in Test Systems
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FAME is the innovative, modular plug-in test system for measuring and testing tasks in protection technology for medium-voltage and high-voltage switchgear. The plug-in test system combines complex switching operations for testing the function of current transformers and voltage transducers, as well as tripping and signal contacts.
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Product
FPGA Test System
DO-254/CTS
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DO-254/CTS™ is a fully customized hardware and software platform that augments target board testing to increase verification coverage by test and satisfy the verification objectives of DO-254/ED-80. The target design runs at-speed in the target device mounted on the custom daughter board. The simulation testbench is used as test vectors to enable requirements-based testing with 100% FPGA pin-level controllability and visibility necessary to implement normal range and abnormal range tests. The FPGA testing results are captured at-speed and displayed using a simulator waveform viewer for advanced analysis and documentation.
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Product
Test Case Management System
Kiwi TCMS
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The leading open source test case management system. *Efficiently manage test cases, plans and runs*Improve testing productivity & reporting*Integrates with popular issue trackers*External API interface*GPL 2 licensed
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Product
Standalone with Drop-In Test Systems
800 Series ATE
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The Circuit Check 800 Series ATE provides the versatility of utilizing the economical drop-in fixturing present in the 600 Series or an integrated dedicated fixture, while simultaneously providing the increased test equipment capacity of the 1000 Series. This combination produces a cost effective full turnkey test solution.
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Automatic Hardness Testing System
AMH55
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Maximize your productivity and easily measure impressions on various surface conditions for a wide number of applications with LECO’s new AMH55. The AMH55 introduces LECO’s innovative Cornerstone® brand software to our hardness testing platforms, for increased usability, simplified reporting, and streamlined analysis times. Supporting accurate and efficient microindentation and Macro/Vickers hardness testing in fully automatic, semi-automatic, and lite configurations, the AMH55 is a valuable resource for users needing precise and productive hardness testing while tailoring the data and results to their needs.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
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The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
Brake Test Systems
GIANT 9000 Series
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The major test target is to detect noise and vibrations generated by the vehicles brake. Our intention was to build a dynamometer that can operate either with brakes mounted to the complete vehicle, or with just the axle module mounted to a universal adaptor system or wheel suspensions.
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Product
Engine Performance/Endurance Test System
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Various types of test system as follows can be built up in combination with measurement control equipment and peripheral instruments (fuel flow meters, actuators, temperature control device, combustion analysis system, ECU monitor, OBD, sound and vibration measurement instruments, emission analyzer, smoke meter etc.)·Traveling fuel economy test·Gas emission test·Output performance test·Deterioration/endurance test·Combustion analysis·Sound source probing
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Product
Test System Elowerk
eloZ1
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The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the latest generation. It reliably finds connection errors and assembly errors in electronic assemblies. The test electronics can be integrated both in table systems and in inline systems.
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Product
Magnetic-Field Test System
MTS-800
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The MTS-800 is a compact test system for broadband generation and measurement of magnetic fields. Its internal components allow automatic EMC tests according to automotivestandards where high field strength need to be generatedor measured.
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Automotive Electronics Functional Test System
TS-5020
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The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Product
IP-Reflective Memory
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Each IP-ReflectiveMemory can be used as a standard node or as the Master Node. Clearly labled "DIP Switches" are provided to make the selection of Master or Standard Node, and the Node Address. The Network is based on using LVDS signaling over Ethernet cabling. Nodes automatically come up for pass through operation.
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Product
Ferroelectric Test System
RT66B
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Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
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Product
Battery Pack Test System
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*Easy to see now test progress*Can cycle test*Provide Charge, Discharge, Suspend, FOR, LOOP Mode Select*When Charging, set the stop current to stop charging when fully charged so as to avoid overcharging that will damage the battery. When Discharge, set the stop voltage to stop discharge when discharging to lowest so as to avoid over-discharging that will damage the battery.
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Product
Hardware-in-the-Loop Test Systems
HIL
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Our early development efforts and NI VeriStand expertise uniquely qualify us to maximize the benefits of and provide top-notch integration services for this software platform. Wineman Technology offers powerful and flexible MIL and HIL testing solutions, such as: Full range of MIL and HIL test systems. Software for testing. Software for simulating electronic control modules. Fault insertion unit (FIU)..
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Product
Checkpoint Security System
ConneCT
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The ConneCTTM Checkpoint Security System is an advanced aviation security explosive detection system (EDS) engineered to deliver superior threat detection, dramatically improved passenger throughput, and low total cost of ownership.
