Memory Test Systems
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
System
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
16GB DDR4-3200 1GbX8 1.2V ECC Samsung Chip
AQD-D4U16GE32-SE
Memory Module
16GB, Speed 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, ECC.
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Product
Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
System
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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Product
Edge AI Inference System
AIR-021
Edge AI Inference System
Edge AI Inference system powered by NVIDIA® Jetson Orin™ NX/Nano and Super mode. Compact and high performance AI box. NVIDIA® Jetson Orin NX 16GB/8GB and Orin Nano 8GB Modules. 12~24V wide power and -20~50 °C (NX) -10~50°C (NANO) supported.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Test Handler
M4872
Test Handler
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
Test Port Adapter
The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
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Product
Component Test Fixture For N1413 With B2980 Series
N1428A
Test Fixture
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Product
Computing VITA System
CRS 48.5
System
The CRS 48.5 is a complete, integrated, pre-tested, ready-to-run HPEC rugged subsystem enabling faster development/deployment at lower cost and risk using the most advanced VITA 48.5 compliant air-flowthrough cooling to allow the integration of up to eight quad core Intel® Core™ i7 processing nodes.
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Product
Inflight Entertainment System Hardware
System
Innovative IFEC solutions that enable connectivity, entertainment, and control.
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Product
Functional Test System
TS-5040
Functional Test
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
High-Speed Signal Recording Systems
System
GaGe has a long history of providing high-speed, real-time signal acquisition, processing, and recording systems on PC-based platforms. This expertise saves customers time and eliminates uncertainties and risks with self-integrated systems.
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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Product
Alpha Particle Counting System
UltraLo-1800
Particle Counting System
The UltraLo-1800 is a best-in-class alpha particle counting system. Our patented design reduces background rates by 50x compared to conventional systems.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Conformance Test System
TS-RRM
Test System
The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL
In-Circuit Test System
The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.
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Product
Development System
PCIe490
System
The PCIe490 Expansion Chassis enables users to scale application workstations with up to eight additional PCIe boards per chassis and up to 63 total slots with chassis daisy chaining. It was designed to accommodate the Abaco Systems PC820 and PC821 with Xilinx Ultrascale technology and multiple FMC+ interfaces.
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Product
Test Port Cable, 1 Mm
11500I
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 8.8-cm cable featuring a return loss of 17 dB minimum.
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Product
PXIe System Sync Module, 2 Port
M9032A
System Sync Module
The M9032A has a Soft Front Panel (SFP) that provides a graphical user interface to the system sync module. It allows the user to set up the most commonly used functionalities of the module. The SFP also gives you the ability to check the module's connection status, configure the reference clock and IO settings, and perform firmware udpates.
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Product
Multipurpose Mobile PXI DAQ System
System
The mobile DAQ system achieves seamless integration among signal conditioning, data acquisition, and synchronization that benchtop instruments would not have achieved. By choosing this system over using benchtop instruments, United Technologies Research Center saved hundreds of thousands of dollars.
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Product
Emergency Systems
System
Safety and survival products which aid in on-board emergencies, aircraft evacuation, and search and rescue operations.
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Product
Test Fixture Kits
Test Fixture
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
