Memory Test Systems
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Product
Test Adapters / Aeroflex Test System
52xx / 5300
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We develop and manufacture test adapters for your existing interface including documentation and test program
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Product
Memory Analysis Software for Logic Analyzers
B4661A
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DDR3, DDR4, DDR5, LPDDR2, LPDDR3, LPDDR4, and LPDDR5 Analysis . The Keysight B4661A memory analysis software offers a suite of options that include the industry’s first protocol compliance violation testing capability across speed changes, a condensed traffic overview for rapid navigation to areas of interest in the logic analyzer trace, powerful performance analysis graphics, and DDR and LPDDR decoders. With the B4661A memory analysis software and a Keysight logic analyzer*, users can monitor DDR/2/3/4/5 or LPDDR2/3/4/5 systems to debug, improve performance, and validate protocol compliance. Powerful traffic overviews, multiple viewing choices, and real-time compliance violation triggering help identify elusive DDR/LPDDR system violations.
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Product
Ultrasonic testing / UT System
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Xiamen IDEA Electronic Technology Co., Ltd.
IDEA-UTXX Intelligent Digital Multi-channel Ultrasonic detector uses the most advanced digital electronic technology and ultrasonic technology.With utilitarian function,steady performance, easy operation and favorable price, which is the full-digital intelligent ultrasonic detector that has the excellent price versus performance ratio.
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Product
Chloride Test System
C-CL-2000
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The C-CL-2000 produces results on-site, within minutes that are accurate and comparable to expensive laboratory tests. It measures the electrochemical reaction of a weighted sample placed in an extraction liquid. It automatically shows a temperature compensated reading of percent of chlorides on its digital display. A wide range - from 0.002 to 2% chloride by weight - is covered.
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Product
Semiconductor Test System
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IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Product
Industrial Flash & Memory Solutions
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Advantech provides a full range of industrial storage module, memory module, and embedded I/O module.
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Product
Battery Test System
WBCS3000Ls32
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : ±5Vmax. current range : ±10mA
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Product
Memory Burn-In Tester
H5620/H5620ES
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As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Product
Parallel Test Systems
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Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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Product
High Temperature Component Test Fixture
16194A
Test Fixture
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
Wireless System For Test And Measurement
TM400 Compact
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The TM400 system was designed to provide the ideal link between calibrated test microphones and measurement equipment such as SIM®, SIA SMAART Live®, TEF® or other systems. By using a radio link, long cables can be eliminated thus saving time and providing opportunities for additional measurements to increase accuracy. The microphone can even be moved around in the venue while the audience is present – something that is impossible with a cabled measurement microphone.
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Product
Automated Test Systems
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Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Product
WEIGHING SYSTEM TESTING
1006
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The Tester 1006 has a simultaneous control function of up to 4 load cells in any weighing system, upload and download function for programming the DAT and MC 302 series instruments, but it can also be used as a Calibrator and Peak detector. It is very useful for the correct mechanical installation and for fault diagnosis. The Tester 1006 is supplied as standard with cable for connection to our junction boxes / sum mod. CEM 4 / C and CGS 4 / C. Simultaneous display of the signal of each individual load cell allows to control the entire weighing system, weight distribution, overloads, faulty cells and faulty connections. OUT OF PRODUCTION. Pavone systems provides a new version of Tester 1006: Tester 1008.
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Product
Portable Test Systems
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We refer to test meters with an integrated source as test systems. Test systems are particularly useful when you need custom current and voltage values when testing meter installations, but only want to use a single device.
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Product
VPX Processing System
CRS-D4I-3VB1
System
4-slot, SWaP-reduced, rugged VPX Intel base plate cooled data processing system that can be applied across various applications including civilian and military unmanned vehicles, manned commercial and military aircraft, helicopters, over- and underwater research vessels, ground vehicles, and locomotives.
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Product
3-in-1 Test System
CIBANO 500
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CIBANO 500 combines a micro-ohmmeter, timing analyzer, and a coil and motor supply. All important CB tests on all types of CBs can be carried out even when a station battery is not available.
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Product
SoC Test System
T2000
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SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
Microtester Test Systems
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With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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Product
microLED Testing System
OmniPix-ML1000
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The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Product
Universal In-Line Test Platform
Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Product
RFID Test System
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RFID test system of Peritec is making FPGA board (IF-RIO) the processing of the IF band. This reading of the code, called (Electronic Product Code) EPC is required for RFID tag ISO18000-6 TYPEC of (EPC C1 G2). However, it did not provide treatment too late in the traditional instruments.
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Product
Automated Testing System
PV-LIT
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Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects
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Product
Optics Test Systems
Mirror Collimator And Autocollimator
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Optik Elektronik Gerätetechnik GmbH
Mirror collimator and autocollimator for the entire wavelength range from UV to MIR The compact mirror collimator can be used both as an autocollimator and as a telescope.
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Product
Circuit Breaker Test System
TDR9100
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The Doble TDR9100 Circuit Breaker Analyzer is a state-of-the-art circuit breaker test set for testing all types of circuit breakers with efficient and accurate performance measurements.
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Product
Flying Prober Test System
QTOUCH2204C
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Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.
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Product
Low Frequency Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Our imaging low-frequency inspection systems are excellently suited to displaying internal defects with high resolution and high dynamics.
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Product
High Current Test System
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HIGHVOLT Prüftechnik Dresden GmbH
High current test systems are used to test the thermal stability of equipment and components. The test system induces a current in the test object causing it to heat up. Therefore, the test object is designed as a shorted circuit. The high current test system measures the temperature of the test object at various points, in addition to the current. As a special feature, the temperature that the test object should reach can be specified and the amount of the current can be automatically calculated by the HIGHVOLT test system.
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Product
Servo-Pneumatic Asphalt Testing System
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All signal conditioning, as well as high-speed data acquisition and control functions are done by the unit and graphically interfaced through CATS, windows based software running on a standard PC. The system is capable of performing the full spectrum of HMA tests: dynamic complex modulus, flow number, flow time, indirect tension, beam flexural fatigue and resilient modulus. These tests are done with the appropriate testing modules. The different testing modules can be obtained after the initial system acquisition at the same discounted price. In addition, guarantees system upgrades in order to meet future standards .
