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Product
Thermal Imaging System for Electronics Testing
ETS320
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Whether the goal is product testing or scientific research, heat can be an important indicator of how a system is functioning. The FLIR ETS320 is a non-contact thermal measurement system that pairs a high-sensitivity infrared camera with an integrated stand, for hands-free measurement of printed circuit boards and other small electronics.
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Product
TestStand
test
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Product
Cable/Harness Test System with Rack-Mounted Switching
CKT1175-20
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The CKT1175-20 is a high-voltage wiring analysis system that features rack-mounted switching matrices. This system is expandable in 100 test point increments to 96,000 test points, and available with a wide variety of adapter cable interface connectors, with the standard interface being the CKT MAC interface system.
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Product
Nanomechanical Test System
Hysitron TI Premier
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Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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Product
Cobot Testing System
CT6
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The CT6 cobot testing system introduces the benefits of automation to the testing of biomedical devices and components. This system pairs a collaborative robot with a 5900 or 6800 Series universal testing system to increase the efficiency of small to mid-sized testing labs that require a high degree of flexibility in their testing systems. The CT6 is designed to handle a wide range of medical components, including drug delivery, sample collection, and wound closure products.
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Product
Test Automation Systems
iTest
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Our iTest family of test automation systems provide a full range of capabilities, allowing you to purchase just the right solution for your application without having to overbuy.
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Product
Ionic Contamination Test Systems
CM+ Series
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The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric introduced by Gen3 Systems: Process Ionic Contamination Testing. The CM+ Series measure the amount of ionic contamination in accordance with all existing test methods, often referred to as ROSE testing, as well as the new PICT test.
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Product
(25kN) Fatigue Testing Systems
8872
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The 8872 fatigue testing system is ideal for fatigue and static testing of biomedical, advanced materials, and manufactured components. The servohydraulic actuator is conveniently located in the crosshead for easy table mounting. The T-slot base makes it easy to secure orthopaedic specimens, automotive components, and manufacturing assemblies. The adjustable crosshead, actuator-mounted load cell, and corrosion resistant T-slot base with unique drain channel are essential for testing biomedical specimens immersed in a saline bath.
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Product
Electronic Transformer Test System
UI2000-ET
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• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
VME Test System
VMETS
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Measurements of system performance include Bus Utilization, Transfer Rates and Statistics. As data is acquired the Min, Max and Average values are updated and displayed in graphical form.
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Product
End-of-Line IC & MEMS Tester
igentic® 841t
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Integrated circuit (IC) and micro electro-mechanical system (MEMS) device manufacturers need to address the challenges of today's global market including increased functionality, speed and complexity while delivering components at reduced costs. Sterner Automation's igentic® 841t automated test systems meet these demanding requirements by providing a flexible platform for comprehensive end-of-line IC and MEMS device handling, testing, grading and packaging. The resulting improvements in quality assurance and process efficiency will maximize customer satisfaction and profitability.
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Product
Eddy Current Testing /ET System
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Xiamen IDEA Electronic Technology Co., Ltd.
Eddy current testing system uses the most advanced digital electronic technology, photovoltaic technology and microprocessor technology. With beautiful design automatic transmission, complete electromechanical integration system, which is the only company that have a complete system of automatic machine.
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Product
RSP-2T Test System Interface Probe
RSP-2T
ICT/FCT Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 167Full Travel (mm): 4.24Recommended Travel (mil): 79Recommended Travel (mm): 2.00
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Product
Handheld Test Systems
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Lightweight and easy to use handheld test systems designed with a plug and play approach, ideal when operating on site or close quarters.
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Product
Electronic Equipment Testing System
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The task set forth the need to create a special universal software core, the main tasks of which are the provision of measurement and control processes, as well as the interaction of software components intended for collection, visualization, mathematical processing and documenting of data. For each stand, specific program modules were additionally developed according to test methods specific products. The overall modular architecture of the system makes it easy to supplement and correct test algorithms.
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Product
Test System
ETS788
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The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
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Product
GNSS ICs
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Teseo III, the latest generation of ST's GNSS ICs, offers reduced power consumption and carrier-phase tracking, allowing higher accuracy for automotive applications.
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Product
SIP-90-5 Test System Interface Probe
SIP-90-5
ICT/FCT Probe
Overall Length (mil): 1,000Overall Length (mm): 25.40Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Product
Rail Wheel Testing Using Phased Array System
ECHOMAC® PA Wheel Tester
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MAC introduces two versions of Rail Wheel Testers using ECHOMAC® PA platform based on customer requirements. One is a semi-automated solution using local immersion technique. Used for tread inspection of new and/or reprofiled wheels. This solution meets or exceeds EN13262, ISO5948 or AAR M-107/M-208 standards for tread inspection. The second solution is a fully automated immersion tank. Performs tread and face inspection of rail wheels using two phased array probes simultaneously. This solution meets or exceeds EN13262, ISO5948 or AAR M-107/M-208 standards for tread and face inspection, while monitoring the backwall on the face side per EN 13262.
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Product
Backplane Test System
402HV
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Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Product
Vibration Test Chamber Elevator Mechanism System
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Guangdong Test EQ Equipment co., Ltd.
- Structural Design: Monolithic construction with seamless TIG welding for durability and aesthetics. Lever-driven door lock mechanism.- Smart Control System: Features a Chinese/English-language color LCD touchscreen HMI + high-performance PLC, powered by TESTEQ's proprietary software for automated, intelligent, and user-friendly operation.- Energy Efficiency: Incorporates TESTEQ's patented "Static Balance" technology, reducing energy consumption by over 30% during low-temperature stabilization.- Vibration Integration: Elevator Mechanism: Wireless remote-controlled for alignment with horizontal/vertical vibration platforms.- Advanced Sealing: Custom flexible connectors ensure airtight integration between temperature/humidity chambers and vibration platforms.
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Product
Tan Delta Test System
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Diagnostic test that indicates the degree of cable insulation degradation. Rather than using only a VLF instrument to perform a go/no-go proof test, the Tan Delta, used in conjunction with a VLF hipot, permits the user to grade the deterioration level of many cables in order to prioritize replacement, rejuvenation, or to determine what additional tests may be useful.
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Product
Test Tables / System Solutions
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WEETECH, as a manufacturer of test equipment, offers its customers also a "Ready To Use" test system solution. It consists of the test table, the customer-specific adaptation as well as the test device, and is very quickly ready for use at the customer's site. According to the customer's requirements, the set-up is designed as a system with permanently installed adaptations for the production of constant cable harnesses in large quantities or with interchangeable adapters for the flexible production of different cable harnesses. Depending on the application, a larger table version or a smaller desk version is available. Various interfaces are available for integrating these solutions into a complete production automation system.
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Product
Test Automation Platform Developer's System
KS8400A
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The Keysight KS8400A Test Automation Platform (TAP) Developer's System provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. Keysight TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher-level test executive software environments. Leveraging C# and the power of Microsoft Visual Studio, TAP is not just another programming language. It's a platform upon which you can build your test solutions, maximizing your team's productivity by using your existing software development tools and infrastructure.
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Product
Optics Test Stations For Single Lenses And Optical Systems
OTS
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Optik Elektronik Gerätetechnik GmbH
The optics test stations of the OTS series enable the computer-based, software-controlled measurement of optical parameters of individual lenses (including cylindrical lenses) and optical systems. Measured variables are, for example, focal length, MTF, focal length, radius, contact dimension, centering, wedge angle and deflection angle. The optional software module LensTest enables the measurement of the center thickness of lenses and air gaps in complete lenses as well as the measurement of the centering error of individual surfaces.
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Product
Test System
2000/DATS
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WesTest Engineering Corporation
The WesTest-2000/DATS features Teradyne's high performance Digital Test Instrument and state-of-the-art intrsuments from Agilent, Elgar and North Atlantic.
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Product
AVL Battery Test Systems
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In modern electrified powertrains (xEVs), huge demands are placed on batteries. These electrochemical energy storage and conversion devices must meet market requirements such as long-lasting high power and energy performance, and dynamic charge and discharge processes.
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Product
Slip Ring Test System
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This is a high specification tester that will measure many cable parameters. It measures cable resistance very accurately using the Kelvin 4-wire method. It also tests for shorts between pins at a low voltage. The next test is to measure insulation between connections at a higher voltage. This is carried out at up to 1500 Volts DC with resistances of 10 to 500 Meg ohms.
