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Product
MB Millenium Dynamic Test Control System
MB Millenium
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The MB Millenium™ from MB Dynamics is a multiple-input, multiple-output (MIMO) and/or a multiple-input, single-output (MISO) dynamic test control system.
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Product
Optics Test Systems
Electronic And Visual Autocollimators
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Optik Elektronik Gerätetechnik GmbH
OEG GmbH specializes in the use of autocollimators, collimators and telescopes for special applications in optical measurement technology in the wavelength range from 380nm to 1550nm (SWIR).
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Product
Analogue IC Tester
SYSTEM 8 (AICT)
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The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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Product
Power Bank Battery Testing System
BTS4000
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Shenzen Neware Electronic Co LTD
Battery testing system for power banks(BTS-4000-6V4A-CCDC-USB) is based on Neware BTS4000, it shares all the main feature of BTS4000, such as 0.05%FS accuracy, 10Hz data acquisition frequency, based on Ethernet communication, etc.
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Test System
DA-1 ATS
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The DA-1 ATS is an economical Commercial-Off-The Shelf (COTS) build-to-print tester. The test station is compliant with the published drawing package. The system does not include software.
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Product
Shock Test System, Battery Test
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's shock test system used to measure and determine the impact resistance of a product or package. It is mainly used to evaluate the reliability of the function and the integrity of the structure of the test product under impact environment. Suitable for impact testing of aerospace, aerospace, marine, military, consumer electronics, automotive, household appliances and display equipment.
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Product
Test Automation Systems
iTest
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Our iTest family of test automation systems provide a full range of capabilities, allowing you to purchase just the right solution for your application without having to overbuy.
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Product
Fully Automated In-line Test System For LED Light Engines
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We are pleased to announce that we have received an order for the supply of a fully automated in-line test system for testing LED light engines from ASD Lighting, based in Rotherham. The solution provided, consists of an in-line handler fitted with a vision system. The camera software is capable of learning the position of all LED’s on a new pcb, thereby reducing the time to introduce a new product. In addition to identifying the location of any missing or faulty LED’s the tester measures the colour temperature of every pcb. An image is taken of faulty units with the location of any missing LED’s identified
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Product
Shock/Bump Test System
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HIACC Engineering & Services Pvt. Ltd.
HIACC’s Shock/Bump Test System is a specialized, automated, and high-performance testing apparatus designed to simulate the impact, shocks, and repetitive jolts that electronic components, electronic products, and packaging experience during transportation or operational use.
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Product
Fixture Kit In-Line 6TL35 455x600mm
AH500
Test Fixture
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 3000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
Test System
LB302
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Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Product
Fully Automatic Eddy Current Crack Test System
ROTO-PUSH
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Foerster Instruments, Incorporated
The ROTO-PUSH test station, which is integrated in production lines, serves to test cylindrical components for cracks in the liner surface. The testing configuration has to be rotated for automatic crack testing. After the test, the test pieces are sorted and separated. The continuous test run ensures a high testing rate, which increases profitability.
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Product
SIP-90-2 Test System Interface Probe
SIP-90-2
ICT/FCT Probe
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Product
High Current Discharge Testing System
DTV
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Cold Crank Testing to industry standards: IEC, SAE, BCIDischarge capacity performance testing to thousands of amperes
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Product
DC Parametric Test System with Curve Trace
DC3
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The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Product
Pneumatic Bidirectional Vertical Shock Test System
KRD17 series
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KRD17 series pneumatic bidirectional vertical shock test system is the novel designed and developed for large specimens that cannot or are not easy to turn over, especially adopt for battery testing. It can complete vertical upward and downward shock test in one test stand without moving the UUT.
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Product
Lamp Cap Temperature Rise Test System
CX-T1
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Shenzhen Chuangxin Instruments Co., Ltd.
Lamp Cap Temperature Rise Test System is according to IEC60360-1998 and GB2512-2001(Standard method of measurement of lampcap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards
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Product
Measuring Systems For Night Vision Systems
MTF Test Bench For Image Intensifier Tubes (IIT) And Night Vision Devices (NVD)
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Optik Elektronik Gerätetechnik GmbH
The MTF MASTER NVD was specially designed to measure the MTF of Night Vision Devices (NVD) and of Image Intensifier Tubes (IIT).
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Product
Multiple-Bus Architecture Cable/Harness Test System
CKT1175-MBA
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The CKT1175-MBA (for multiple-bus architecture) will provide seamless testing of electronic racks, panels and chassis containing passive and active components such as relays, solenoids, switches, circuit breakers, lamps and LED's, diodes, resistors, capacitors, etc. This functionality is made possible by a switching matrix that is up to 10 levels deep, plus a multiplexer that controls the various stimuli sources, instrumentation connections, and external energization outputs.
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Product
Ultrasound Pulser ICs And HV Multiplexers
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ST's Ultrasound Imaging IC Solutions offer a complete range of integrated high-voltage transmitters from quad and octal, to the latest device, the state-of-the art STHV1600 ultrasound pulser IC, to high-voltage multiplexer IC, the STHV64SW, a 64-channel, high voltage analog independent switches. ST’s proprietary BCD6s-SOI and BCD8sSOI process technologies enable the combination of low-voltage CMOS logic, precise analog circuitry, and robust power stages on the same chip, offering unprecedented level of integration.
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Product
Test Cell System
qCf FC50/125
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qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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Product
4 Quadrant Dynamometer Test System
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Magtrol’s 4 quadrant motorized dynamometers provides expanded testing flexibility over a typical braking dynamometer. With the ability to bring the motor under test (MUT) to synchronous RPM before beginning a test, repeatability is improved. Since the motor windings are at ambient temperature before starting a ramp test, wattage is more consistent.
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Product
SIP-90-3 Test System Interface Probe
SIP-90-3
ICT/FCT Probe
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Product
Laser Systems
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We offer a full line of complete laser micro-machining heads for semiconductor applications. These systems feature an integrated DPSS Jewel ND:Yag laser incorporated into a uni-body all-in-one form factor. They also have a robust mechanical and optical design for manufacturing and repair applications. Our three models of micromachining heads are diverse enough to adjust to a variety of applications including: ablation, semiconductor FA, TFT/LCD, CF and cell LCM, and OLED repair.
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Product
Mini-MRI Systems
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Magnets for Magnetic Resonance Imaging (MRI) are required to generate a high homogeneity field over the imaging volume which remains stable in time.
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Product
Modular Laser Diode Test System (PXI/PXIe)
LTS8620
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The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
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Product
Telemetry Systems
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For Automotive, Aerospace, Marine, Motor & Generator Health, Energy, Power Plant, and Industrial Applications.
