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Product
Electronic Test And Measurement Systems
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Summaries, information, & tutorials about electronics test and measurement equipment & techniques.
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Product
Transportation Simulation Test System
KRD50 series
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KRD50 series transportation simulation test system is to simulate the actual road conditions such as shocks and vibrations during the transportation of various items of a specific load, and to evaluate the effect of the actual working conditions on the loading, unloading, transportation, packaging, sealing or internal structure of the goods. In order to assess or confirm the products and packaging.
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Product
Thermal Stability Test System
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Premier Electrosystems' Thermal Stability Test Setup is used to test thermoplastics and PVC (Plasticized Polyvinyl Chloride) materials. When exposed to continuous heat, these materials degenerate and emit harmful acidic gases. The instrument is manufactured for testing PVC materials for their thermal stability at higher temperature.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Handheld Compact Professional IC Tester
LinearMaster
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The ABI LinearMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The LinearMaster is designed for testing analogue ICs with up to 16 pins through a ZIF socket (see ChipMaster for digital devices). A range of adapters is also available for SOIC and PLCC devices.
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Product
Scienlab Battery Test System – Module Level
SL1001A Series
Test System
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Product
IC Test Probes
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C.C.P. Contact Probes Co., LTD.
Our IC Test Probes are suitable for pitches of less than 0.012mm.
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Magnetic-Field Test System
MTS-800
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The MTS-800 is a compact test system for broadband generation and measurement of magnetic fields. Its internal components allow automatic EMC tests according to automotivestandards where high field strength need to be generatedor measured.
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Battery Testing Systems
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The CT2001 series Battery Testing Systems are designed for energy storage materials research and battery test. The eight channels are independently programmed and controlled by the computer. The Current ranges are from 1 mA to 5 A and Voltage ranges from 2V to 15V. Each testing system is specifically built for customer needs.
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Product
COMPUTERIZED LCRTZ TEST SYSTEM (Automatic Transformer Test System)
CVCT-S20
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Ideal for fast and fool proof testing of COILS AND SMALL TRANSFORMERS like SMPS transformers, Telecom transformers (HYBRID, POT CORE, RM-CORE), Pulse transformers etc. The systems scans at one stroke, all the windings of a transformer and tests as per definition of test procedure. The test procedure can be pre-programmed and stored under User friendly menu driven software . Any semi-skilled and unskilled person can be engaged for actual testing purpose. Can Select test frequency, pin number, parameters, test conditions, limits for each test. Test any pin to any other pin any defined parameter.Test Parameters :-> Inductance-> Capacitance-> AC Resistance, -> DC Resistance, -> Impedance, -> Leakage Inductance,-> Transformation Ratio & Winding PolaritySPECIFICATIONS :Measurement Frequencies : 50 Hz, 100 Hz, 500 Hz, 800 Hz; 1 KHz, 2 KHz, 5 KHz, 10 KHz. Measurement Voltage: 0.1 V – 1.0 V RMS adjustable under program control.
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Brake Test Systems
GIANT 9000 Series
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The major test target is to detect noise and vibrations generated by the vehicles brake. Our intention was to build a dynamometer that can operate either with brakes mounted to the complete vehicle, or with just the axle module mounted to a universal adaptor system or wheel suspensions.
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Chassis and Safety ICs
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ST is a world-class supplier of IC smart power solutions for all the Chassis and Safety applications, ranging from passive safety, braking, vehicle dynamics and steering systems. Type of devices in ST portfolio are analog and mixed-signal ICs, integrating different functions such as supply modules, drivers for loads and actuators, diagnostic functions, system monitoring and communication interfaces.
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Portable Test System
MT786
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Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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IC Design & Verification
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Mentor Graphics provides best-in-class products for IC design. Calibre for physical verification, extraction, resolution enhancement and mask data preparation, ADVance MS for analog/mixed-signal simulation and an integrated tool flow for custom IC design
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Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Electrodynamic Vibration Test Systems
DC-series
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Depending on the reference PSD or other operating conditions such as the specimen, one part of the controlled response may deviate from the reference PSD
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Product
D-Mic Testing System
BK3012V2
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Easy to use and faster than human testers can load, the new BK3012V2 is the upgrade of our popular BK3012 D-Mic tester. Setup is even easier than for the BK3012 and you can enter specifications and be ready for testing in a few minutes. As well as testing, the BK3012V2 can be connected to a computer, so you can keep your results and analyze them for current quality and trends over time.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Power Supply ICs For R-Car
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R2A11301FT is a single-chip system power supply for CPU core and DDR (DDR2 and DDR3).
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Product
Timing & Digital Logic ICs
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Renesas offers a selection of industry standard quartz- and RC-based timing/oscillator ICs along with real time clocks. Timing circuits provide clock pulsing and synchronization in digital systems as well as pulse modulation circuits.
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Shock Test Systems
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Accurately measure the fragility of products and evaluate how they respond to specific shock inputs.
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Product
Battery Backup IC
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Analog Devices offers a range of supervisory circuits that offer a complete single chip solution for power supply monitoring and battery control functions in microprocessor systems. Functions include microprocessor reset, backup battery switchover, watchdog timers, CMOS RAM write protection, and power failure warning.
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Product
Mezzanine System
3556
System
The 3556 provides two removable Micro SD flash memory sites, and fourteen bits of general purpose digital I/O. The Micro SD sites are each capable of Gigabytes of storage. A retention mechanism holds the Micro SD card securely in place preventing movement due to vibration or shock.
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Production Test System
G3 Hybrid
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The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
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Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Test System
4003 TLP+™
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The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Digital Interconnect Test System, Reference Solution
Test System
When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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Product
Test System
USB Explorer 280
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The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
