Test Fixtures
UUT interconnect interchangeable with tester.
See Also: Fixtures, Mechanical Fixtures, Vacuum Fixtures, ATE Fixtures, PCB Test Fixtures, Board Test Fixtures, Bed of Nails, Spring Probes, Test Jigs, Test Probes
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Aircraft Test Set
CA-2100S-07
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The CA-2100S-07 is a bench mounted, modularized and computer based test set used to service all types of aircraft electronics. It simulates the aircraft environment and replaces a myriad of specialized test fixtures found in the industry.
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Test Probes
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Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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Product
Low Noise Test Cables For N1413 With B2980 Series, 1.5 M
N1427A
Coaxial Cable
The N1427A is designed to operate specifically with the B2985B/87B Electrometer/High Resistance Meter. It comes with a separate triaxial (special screw-type) female connector and a High Voltage BNC (special type) female connector. This allows terminal configuration to be converted to any other configuration. Therefore, custom test fixture can easily be constructed. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1427A to the B2985B/87B.
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Small Footprint Flex 20 ATE
Flex 20
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The Flex 20 is floor mounted but maintains a small footprint on the shop floor. A VPC S6 interface is normally used on this system allowing multiple test fixtures to be used with the system.
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Product
PXI Fault Insertion Switch, 6-channel, Two Fault Buses, 10 A
40-192A-012
Switch Module
The 40-192A-012 is a PXI fault insertion switch using solid state switching elements and is capable of switching current up to 10A. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test
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Functional Fixtures
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Joule''s strength is in the design and manufacture of functional test fixtures. Using 3D modeling software to create the fixtures allows us to actuate pneumatics, open and close overclamps, actuate side access units - all before a single part has been machined for the fixture.
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Structural Durability Products
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Instron offers a wide range of Durability Testing Products such as Controller and Software modules, Hydropuls actuators (linear & rotary), Servo valves, Sensors, Power Packs & Accessories and Test frames & fixtures.
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Press Down Rods Bed of Nails Testers
RandHDPE HDPE Family
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HDPE plastic plates for extra easy machine ability and upgradeability. Designed for Research & Development and Pre-Production where product engineering changes are a weekly issue. The primary design focus is easy upgradeability. In R&D and Preproduction, design changes can happen every week. This fixture unlike normal test fixtures was designed to be easily taken apart and updated. Disassembling a normal bed of nails test fixture over and over again can be a major disaster with wire breakage and test pin bending issues. The modular design of the Rand fixture allows for easy disassembly without flexing the wires or risk of bending test pins. The Rand fixture provides complete easy access for machining, drilling and wiring updates.
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Product
10-Ch Pneumatics Selftest Module
YAV90PNT
CAN Interface
Use this module in your self test diagnostics fixture. The YAV90PNT can be used as counterpart of the YAV90PNE, to test that is working properly.
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Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Programmable Parametric Tester For Discrete Semiconductors
IST-8800
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IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
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Product
Stand-Alone Test Fixture
MA 2012/D/H/GR2270/71
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,00 kg
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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Becker Transponder Test Fixture
TA-3400
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This transponder test fixture is specific to the requirements for testing Becker Avionics Transponders and provides interface connectors for both the panel mount and remote systems. The panel also provides switches to implement Gillham code altitude as well as separate interfaces for an external parallel or serial encoder. The panel will interface with the RMU 5000 or standard control head. This fixture also comes with voltage and current meters along with an internal dimming source. This panel comes in the standard 19 inch rack width and measures 12 inches in depth.
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Product
RF Shielded Box
LTL B12001
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LTL B12001 RF Test Enclosure is the streamline solution to manage your RF Testings. LTL B12001 RF shielded test enclosure can comfortably houses the intermediate and large devices on test such as Laptops, larger test Fixtures and other large RF devices.LTL RF Enclosures are available in aluminum and stainless steel models and come with a specialized EMI gasket which enables stable and effective RF shielding performance in all frequency bands.
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Testing Services
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*Programmable Multipoint Tester*Over 8,000 programmable test points (DWV, Capacitance, Insulation Res., 2/4-Wire Resistance, etc.)*1500VDC / 1000 VAC Dielectric Withstanding Voltage (DWV)/ Hi-Pot (Programmable Dwell times)*Full Electronics laboratory complete with state of the art testing equipment*Custom Unit Testing (Designing of Specialized Test fixtures)*EMI Testing*Temperature and Humidity Testing*Shock Testing*Vibration Testing*Sand and Dust / Altitude Testing*Military Qualification Tests Performed
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In-Circuit Test
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In-circuit test works by checking all components are fitted correctly to the PCB and are within the correct electrical tolerance. In-circuit testers do this by interfacing to the board via a "bed of nails test fixture" and programs can be generated via CAD data. They offer a quick and easy method of checking the manufacture of the board and also offer a reliable and simple fault report.
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Latch-on Test Fixtures
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Latch-on Test Fixtures provide a convenient way for production personnel to quickly and reliably make electrical connections to a product for programming or final test. These custom fixtures eliminate the need to hand-wire products in order to power them up and communicate with them. Typical applications for latch-on test fixtures are metering devices, control panels, and any type of controls that connect via terminal strips.
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Automatic Test Equipment Machinery
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Is used to assist wiring fixtures and then test the fixtures for wiring errors. We also can manufacture and/or design custom machinery to your specifications.
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ARINC HSI / ADI Test Fixture
TA-2000
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The TA-2000 test fixture is a combination panel that incorporates all the standard capabilities of the legacy CTS-11(ADI) and CTS-12(HSI) panels and much more. This panel is married to our model TA-1001 dual synchro transmitter/API panel thus allowing for local stimulus and alignment of the instruments synchros and resolvers. The panel provides for testing of both superflag(28v) and low level meters through a matrix of switching that will allow testing of all meters simultaneously or just individually. The low level meter drive circuit also incorporates an automatic mode that will continuously oscillate the L/R and Up/Dn pointers.
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Becker NAV/RMU/RMI/OBS Test Fixture
TA-3320
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This NAV test fixture is specific to the requirements for testing Becker Avionics NAV, RMI and RMU products. The panel incorporates specific functionality required for testing these Becker products by the book including special requirements for the RMU 5000 and the IN 3300 series of nav indicators. This BAEE NAV test fixture also facilitates resolver alignment and discrete meter testing through the PG 3300 interface connector. The RM 3300 portion of the panel tests the Becker RMI indicators and allows for sourcing the composite signal from the paired radio or from an external generator. The DME channeling outputs are monitored with discrete LED's as well as the ILS, V/LOC, Glideslope and NAV TEST valids. Discrete test jacks are provided for all the meters and the resolver of the NAV indicator and a dimming source is also provided. When testing the RMU 5000 computer access is through a dedicated connector.
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Genrad 2270 Interface Receivers
GR Series
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The 3210 Series Receiver is designed for interfacing the GR 2270 style test fixture. Using patented CAM/TRAC design, the 3210 Receiver provides an accurate, positive locking system that ensures consistent contact throughout the entire interface. With a 5/8" stroke, the 3212 Receiver allows additional clearance for coax and custom block applications.
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Headphone Test Fixture
AEC206
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The Larson Davis Model AEC206 Binaural Test Fixture is the tool for testing supra-aural, circumaural, supra-concha, intraconcha, and insert-type headphones. Preassembled with IEC 60318-4 (711) occluded-ear simulators and TEDS compatible preamplifiers that provide electronic calibration information, the Model AEC206 is user-friendly and easy to learn. Additionally, calibration is a simple process—a custom adapter is included for the Model CAL250 acoustic calibrator or similar device.
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Computer Networking Solutions
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Today’s world has a never ending appetite for data. Everywhere you look there are connected devices that provide and consume that data at an astonishing rate, and the demand increases every day. Our computer and networking customers are constantly pushing the edges of technology to deliver data faster and more reliably than ever. They use the newest electronics available to keep our data flowing – data that is critical to the operation of the world’s infrastructure. As cutting edge technologies are developed, these faster more advanced capabilities require the most sophisticated testing available. Circuit Check is constantly evolving our test fixtures and systems to meet this industry’s most advancedrequirements.
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Design for Test
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Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Test Fixturing Solutions
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Amfax and MAC Panel have teamed up to provide a unique WIRE-FREE Test fixture technology. We have created an alternative solution to traditional wired ITAs called PECture(TM). The name is a combination of PEC (Printed Electronic Circuit) and fixture.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Bending Stiffness Test Fixture
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Q-Card’s bending stiffness fixture features splayed feet and aggressive no-slip rubber pads for stability. It is manufactured of aerospace-grade aluminum alloy with a hard anodized, scratch-resistant, durable finish to provide years of rigorous testing and trouble-free service.
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PXI 8x9 RF Matrix 250MHz 75 SMB
40-725-751
Matrix Switch Module
The 40-725 is an 8x9 RF Matrix Module suitable for switching frequencies up to 500MHz (50Ω version). The 40-725 is available in either 50Ω or 75Ω versions with SMB coaxial connectors. It is intended for the easy construction of high performance bidirectional matrix switching systems. Automatic Isolation Switches are located on all coaxial connections, these disconnect the matrix from the external test fixture maximizing isolation and RF performance.
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Stand-Alone Test Fixture
MA 2011/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg
