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Product
Programmable Current Preamplifier
99539
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The Model 99539 is a modular, multi-channel current preamplifier with parallel, logic level, gain control input. It consists of circuit boards which plug into a 3 1/2" high by 19" wide rack chassis.
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Product
Power Supplier QP303E 2x30V/3A
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*on / off switch output section*two independent adjustable DC output*independent outputs serial and parallel*constant voltage and current*Low ripple and noise*four digit LED displays three*for 16 hours at full load*automatically search out
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Product
Liquid Test Fixture
16452A
Test Fixture
The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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Product
Ethernet To Parallel Digital Interfaces
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ICS's 8063 Ethernet Digital Interface provides a fully enclosed parallel interface that is suitable for benchtop or rack mount applications.
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Product
PXI Resistor Module Dual 16 Bit With 16XSPDT Relays
40-290-121
Programmable Resistor Modules
The 40-290 Series Programmable Resistor Modules comprise a Dual 16-bit or Quad 8-bit resistor chain together with 16 optional SPDT Reed Relays. Connections are made via a front panel SCSI 2 type 68 pin male connector. Programmable resistors may be connected together either in series or in parallel to form many types of configuration.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Flat Field and Imaging Gratings - Type IV
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type IV aberration-corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors.These gratings are produced with grooves that are neither equis-paced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
Digital Demultiplexers
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Advanced Science and Novel Technology, Co., Inc.
24:48 digital demultiplexer (DMUX) with SSTL1.5 input and output interfaces.Supports data rates from 1.0Mbps to 2.0Gbps.User-controllable independent internal delays for data and clock signals.1.5V I2C control interface with a user-defined 3-bit chip address.Preset function for synchronization of multiple parallel devices.Full-rate output copy of external high-speed clock input signal.Two pairs of clock divided-by-2 and synchronous clock enable outputs for supporting the tree-type demultiplexation structure.Additional synchronous clock divided-by-4 output.Dual power supply of +3.0V and +1.5V.Industrial temperature range.Low power consumption of 2.1W at 2.0Gbps.Available in custom 256-pin BGA package (13mm x 13mm x 2.5mm).
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Product
Ultra-compact Wide Range DC Power Supply
IT-M3100 Series
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IT-M3100 series breaks through the traditional tech limits, in the ultra compact size of only 1U Half-Rack, the unit can not only output high power, but also has high performance and versatility. It supports the master-slave parallel mode. The full range of models support multiple stacking and parallel connection by handily designing "leg" plug-in. Fit with rack mount kit to achieve the perfect use.
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Product
cPCI Serial Backplanes
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CompactPCI Serial is an industrial standard for modular computer systems. It is based on the established PICMG 2.0 CompactPCI standard, which uses the parallel PCI bus for communication among a system's card components. In contrast to this, CompactPCI Serial uses only serial point-to-point connections.
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Product
Battery Capacity Tester
BLU-T Series
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Battery load bank BLU-T is a powerful and lightweight solution designed for condition assessment of telecommunication and radio equipment backup supply. This instrument can perform the battery capacity test on battery strings such as Pb, Li-ion, Ni-Cd, and others. It tests battery strings with voltages in the range of 0,9 – 70,5 V DC. As a special feature, the BLU110T model enables capacity testing of single PB, Ni-based as well as Li cells (with current up to 100 A).The capacity test is conducted in an accurate, user-friendly way. Also, it is in accordance with battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.BLU-T battery load bank enables setting the discharge current up to 350 A, with 0,1 A resolution. If higher currents are required, the BLU-T units can be connected in parallel, or BXL-T additional load units can be linked.The instrument offers a high power-to-weight ratio. BLU-T series has models starting from 12,8 kg / 28.2 lbs and up to 19,2 kW of power.A user can select one of three discharge modes: Constant current, Constant power, Constant resistance. Additionally, different battery duty cycles can be simulated using user-selectable discharge profiles.Discharge parameters can be monitored in real-time during the capacity test. A 4,3-inch touch screen shows overall battery voltage, discharge current, discharge test time and capacity during the entire test. Also, the capacity tester is compatible with DV-B Win software. A user can view a detailed numerical and graphical presentation of key parameters, and create reports in various formats.Testing can be carried out without disconnecting the battery from the service.
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Product
SAS (Serial Attached SCSI)
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Serial Attached SCSI (SAS) is a data transfer technology designed to move data to and from storage devices such as disk drives, host bus adapters (HBA), and expanders. SAS is a serialized enhancement and replacement to parallel SCSI. Since SAS ratification in 2004, and it’s move to 6Gbps in 2008, Teledyne LeCroy has continued to support and innovate with it’s industry leading protocol analysis and traffic generation capabilities.
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Product
MEMS Optical Sensor Test
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For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.
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Product
WLCSP Probe Heads
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Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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Product
Test & Measurement Platform
Konrad System Manager
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The Konrad System Manager is the central tool for the Konrad test and measurement platform. It combines execution, interactive supervision and documentation of the installed Konrad test modules.- Displays the live status of the module functions in parallel to running test executions- Easy debugging of the switch routes- Control the modules functions- Configure device Alias name for modules- Display alias naming for switching channels- Execute selftest functionality of the modules- Display device information and documentation of the installed modules- Simulate modules
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Product
High Performance DC/DC Converters
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The 4:1 Input Voltage 1000 Watt Single FXP DC/DC Full Brick converter is designed to operate in parallel with up to 3 FXP bricks (2800 Watts) with no external circuitry. The FXP series provides a precisely regulated DC output. The output voltage is fully isolated from the input, allowing the output to be positive or negative polarity and with various ground connections.
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Product
High Speed DC Electronic Load
6330A series
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The 6330A family offers 8 types of modular loads with power ranging from 30 watts to 1200 watts, current from 0.5mA to 240A, and voltage measurement from 0.5mV to 500V. Each load is isolated and floating, programmable in dual current range and measuring voltage range, and capable of synchronizing with other modules for control operating. The load can be operated in constant current, constant voltage, and constant resistance. With Synchronic parallel control capability, 6330A series loads allow users to parallel and synchronize more than one load together from an internal loading control signal. This feature provides synchronic dynamic loading test for multi-output power and high power test solution. Real time measurement of voltage, current, is integrated into each 6330A load module using a 16-bit precision measurement circuit. The user can perform on line voltage measurement and adjustment, or simulate short circuit test using the simple keypad on the front panel.
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Product
FPGAs
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Think FPGA – think flexibility. Whether it’s high speed parallel signal processing you’re tackling or you’re implementing legacy bus support on the latest CPU platform, Elma has the FPGA solution you need.
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Product
Test Database Software Module
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The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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Product
Parallel Interface Voltage Output D/A Converters
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Analog Devices offers a large portfolio of parallel interface voltage output D/A converters (DACs). We provide precision, fast settling, rail-to-rail micropower VOUT D/A converters, with resolutions of 8 bits up to 16 bits, single-channel to 40-channel density, and a unipolar or bipolar supply. These devices are used in a wide variety of applications such as process control, automotive test equipment, or digital gain and offset adjustment.
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Product
Ultrasonic Thickness Gauge
UTG-1500
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The new PHASE II UTG-1500 is a hand held microprocessor controlled ultrasonic thickness gauge specifically designed for measuring the thickness of metallic and non-metallic materials such as aluminum, titanium, plastics, ceramics, glass and any other good ultrasonic wave-conductor as long as it has parallel top and bottom surfaces.
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Product
Double Function Tester with Shielded HF Test Chambers
End-of-line Tester UTP 9010 RF
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The UTP Series 9010 is a scalable test series available in a variety of feature-rich variants and many designs. The UTP 9010 RF function tester shown here as an example is suitable for tests with a medium number of channels and complexity. It is designed for parallel testing of two or more test items. The measuring instruments used are used alternately for several test items. Due to its compact design and construction as a modular system, this powerful tester can easily be expanded to larger numbers of channels.The integrated HF test chamber UTP 5070 developed by NOFFZ allows an independent shielded test. It can be operated manually or fully automatically by a robot .The basic version of the UTP 9010 series is an ideal system for functional and end-of-line tests and is already preconfigured for this purpose. The RF tester presented in the example is used in particular to test infotainment and eCall modules in the vehicle as well as IoT products with wireless technologies.
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Product
COMINT Monitoring System
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A modern COMINT system can handle thousands of parallel signals. With a reliable and intuitive management software, the increased situational awareness creates a firm base for any decision making
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Product
Analog Mixed Signal Testers
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- PC-performance independent: multiple SPEA CPUs provide test program timing, while pc replacement does not require the test program requalification- Pattern-based programming: -30% test time vs competitors- 64-line synchrobus and 16-line high-speed synchrobus for real-time instrument synchronization: no embedded delay when running pattern-based testing- 99% parallel test efficiency- Multi-site test capabilities for up to 256 devices in parallel- High-density, floating instruments, for true parallel analog test- Universal slot architecture, up to 1,408 channels- RF generators up to 3 GHz
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Product
Solder Test Pallet
WaveRIDER® NL 2
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The wave soldering process is one of the most challenging procedures to set up. The ECD WaveRIDER NL 2 greatly simplifies wave solder set up and ensures perfect repeatability, time after time. Board recipe preheat temperatures, conveyor speed, wave height, contact times and parallelism are all measured and monitored using the WaveRIDER NL 2 process pallet.
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Product
I-8000W High Performance Modules
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The I-8000 High Performance Modules are for use with ViewPAC, WinPAC, XPAC and LinPAC controllers. There are two types of I/O modules, Parallel and Serial. The parallel modules (I-8K Series) are high-speed modules and support MCU (Main Control Unit) only.
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Product
AMIDA 5000 Tester
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AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
