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Parallel systems
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Did you know you can couple several Gill AC, Gill 12 and Weld Testers together or any combination of Gill AC, Gill 12 or Weld Tester, to give you a parallel logging multiple Potentiostat / Galvanostat / ZRA / FRA system, capable of recording from each working electrode at up to 60 readings per second. Coupling several Gill ACs or Gill 12s together gives the added abilities of the Weld tester and the ability to perform fast sweeps. Using our latest software, it has never been easier to couple instruments together to provide a Parallel System. In fact up to 32 instruments can be controlled at the same time. These instruments can either have individually enclosures or be rack mounted.
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Parallel Seam Sealers
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It is an equipment to hermetically seal the packages, such as the crystal and SAW devices, optical devices, sensors, MEMS, etc., by seam welding. Hermetic sealing can be accomplished in both N2 and vacuum environment. Furthermore, we are offering a variety of products for research and development and production applications.
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Ethernet Parallel Interface
Model 8013
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* Provides 128 high-power TTL I/O lines.* Fully VXI-11 Compliant plus Raw Socket for easy programming with Visual Basic or C, Agilent VEE and LabVIEW.* Standard board has a horizontal Ethernet connector and 150-pin Digital IO connector on the component side. * Mates to Relay Driver Boards with 64 or 128 Relay Drivers.* Mates to 115650 Connector Board with 4 flat ribbon headers.
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Parallel Electrode SMD Test Fixture
16192A
Test Fixture
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
Serial And Parallel Port For PCIe
DTA-2142
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Serial and parallel interfaces for ASI and SD-SDI, supporting multiple electrical standards including M-LVDS and LVTTL. Clock rates up to 108MHz are supported.
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High Parallel Tri-Temp Pick-and-Place Handler
Delta MATRiX
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Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.
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Parallel Memory Test Solution
Magnum2
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Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.
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Parallel Differential Battery Tester With Integrated Chamber
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Accelerate your battery parallel test using our PDBT. Featuring an integrated chamber, it precisely conducts battery comparison test and fast measures battery's self-discharge current. Its portable, powerful design is perfect for innovative research applications.
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Serial Parallel Interface
Model 2303
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* 2303 Board provides 40 high-power TTL I/O lines that can sink 23 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Dual Serial headers support conections with baud rate switch inputs or to a Serial Flat Ribon Cable Assembly. * Optional Relay Driver board drives 24-40 relays. * 114732 Board has the DIN connector on circuit side for use with the X3DVR Relay Driver Board or for piggyback mounting.* All other specifications are the same as listed above for the 2303.
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Product
Parallel NTDS Isolation Tap Box
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IXI’S NTDS parallel isolation tap box is the ideal solution for relibility tapping NTDS parallel type A, B, C, and H interfaces. It connects easily to existing cables forming a tee connection that can be used for data monitoring and acquisition over long distances without interference with your system.
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Product
I-8000 Parallel Data Acquisition Modules
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ICP DAS I-8000 Parallel Series I/O are high speed cartridge based and come in a multitude of digital and analog configurations. They are communicable via an RS-485 backplane in all of ICP DAS USA's I-8000 & I-87K series rack mount controllers. There are two types of I/O communication bus, parallel bus and serial bus. The parallel bus type I/O modules (high profile I-8K series) are high speed, used only in the PACs including XPAC, WinPAC, iPAC, ViewPAC, etc. And the serial bus type I/O modules (high profile I-87K series) are low speed, used in both PACs including XPAC, WinPAC, iPAC, ViewPAC, etc.
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Product
Serial to Parallel Analysis Package
B4601C
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Your system uses serial buses to communicate between ICs and transfer data to and from peripheral devices. Sifting through thousands of serial bits by looking at long vertical columns of captured 1's and 0's can be very tedious, time-consuming, and error prone. The Keysight Technologies B4601C serial to parallel analysis package is general-purpose software that allows easy viewing and analysis of serial data.
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Product
IP Parallel HV
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High Voltage [up to 30V] IP Compatible card with 48 programmable IO. 40 mA sink. Open collector interface. Interrupt generator on each input channel. Filtered or direct input.
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Product
GPIB to Parallel Printer Interface
Model 4892B
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* Adds a GPIB Interface to Printers with Centronics or IEEE-1284 parallel interfaces. See the compatible printer list. * Replaces obsolete printers and plotters with a current HPGL/PCL5 printer.* Prints and Plots from most Analyzers. * Large 256 kbyte buffer and high speed GPIB interface off-loads the instrument and reduces printing time.* No program changes required.* Rack mountable in 1 U high rack mount kit.* Includes universal VAC Power Adapter and printer cable.
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Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
SATA (Serial ATA)
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Serial ATA (SATA) is a data transfer technology designed to move data to and from storage devices such as disk drives, ATAPI drives, host bus adapters (HBA), and port multipliers. SATA is a serialized enhancement and replacement to parallel IDE. Since SATA ratification in 2003 and its move to 6Gbps in 2008, Teledyne LeCroy has continued to support and innovate with its industry leading protocol analysis and traffic generation capabilities.
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Dual Parallel Strain Gauges
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Dual Parallel Strain Gauges strain gauges have two measuring grids arranged parallel to each other. Typical applications include measurements on bending beams
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High Parallel Test Handlers
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High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.
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GPIB Parallel Interface
Model 4823B
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* Provides 56 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Available with DIN connector on circuit side for piggyback mounting.
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Massively Parallel Board Test System
I7090
In-Circuit Test System
The Keysight i7090 is a massively parallel board test system designed to help PCBA test engineers improve manufacturing efficiency while reducing costs. Unlike traditional in-circuit testers, the i7090 supports up to 20 In-Circuit Test cores in parallel, which means engineers can test multiple Units Under Test (UUTs) simultaneously without the need for multiple systems. This reduces scaling and infrastructure costs and frees up valuable testing space.
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Parallel Testing of Multiple DUTs with High RF Channel Count
Test Rack UTP 7033 RF for validation
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Our basic test rack UTP 7033 (33 rack units) is intended for equipping with various products and therefore for various application areas.The rack shown here as an example is prepared with products and measurement instruments to test automotive devices with high channel count.
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IP Parallel IO
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IndustryPack compatible IP-Parallel-IO with counter and timer design adds up to 48 digital parallel IO lines to one IP slot of your carrier board.
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Portable Parallel Analyzer
SL1000
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Perform up to four colorimetric and two probe-based measurements in parallel, and complete the entire test suite in 25% of the time. Complete more tests on site, get the results you need faster, and visit more sites in each shift.
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Serial Parallel Interface
Model 2313
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* Provides 128 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Separate headers for RS-232 and RS-485 signals. * Optional 2313 Flat Ribbon Cables mount DE-9 male or female connectors on the rear panel. * Optional Relay Driver boards with 64 or 128 Relay Drivers.
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Parallel Interface Voltage Output D/A Converters
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Analog Devices offers a large portfolio of parallel interface voltage output D/A converters (DACs). We provide precision, fast settling, rail-to-rail micropower VOUT D/A converters, with resolutions of 8 bits up to 16 bits, single-channel to 40-channel density, and a unipolar or bipolar supply. These devices are used in a wide variety of applications such as process control, automotive test equipment, or digital gain and offset adjustment.
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Ethernet Parallel Interface
Model 8003
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* Provides 40 high-power TTL I/O lines.* Fully VXI-11 Compliant plus Raw Socket for easy programming with Visual Basic or C, Agilent VEE and LabVIEW.* Standard board has vertical Ethernet and Digital IO connector on the component side. * Optional Relay Driver board adds 4, 32 or 40 Relay Drivers. • Apply regulated 5 Vdc power through the Digital IO connector.
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Parallel Plate Dielectric Test Cell
LT-4203A
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The LT-4203A Parallel Plate Dielectric Test Cell is designed for measuring the AC loss characteristics and permittivity of solid laminates and panels per ASTM Standard D150‑98, and implements the guarded electrode (three terminal) measurement preferred as the referee method.
