Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
-
Product
Boundary Scan Test and JTAG Programming Tool Set
onTAP® Series 4000
-
onTAP is a comprehensive boundary scan testing and JTAG programming tool set that bolsters the most accurate possible fault coverage in an affordable and expedient manner, while providing support for the entire product life cycle.
-
Product
Wireless In-Circuit Test Fixtures
-
Higher density more complex circuit boards complicate testing requirements while smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in standard long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board or T-Board®. Circuit Check’s wireless fixture technologies reduce test program debug and maintenance times while easing the ECO process. Thus allowing for the higher level of test performance, the ability to probe smaller denser targets and achieve ultra-high node counts.
-
Product
Rotary Table Test system
-
The requirement was to develop a test system that can take very different test and programming times into account so that the hardware used can be used in the best possible way.
-
Product
Developer's Studio for ATLAS
PAWS
-
PAWS Developer's Studio gives you the power to compile, modify, debug, document, and simulate the operation of ATLAS test programs in a Windows environment.
-
Product
Test Module
FailSim
-
FailSim simulates a faulty component and allows the user to quickly and simply improve the actual fault detection of a test program. The result represents a definitive conclusion for tested or untested components.
-
Product
Direct conversion from cycle driven simulation data
Test program generator
-
Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester. TDL/WGL/STIL to tester conversion Supports STIL ext 0,1,2 constructs Easy to use and cost effective conversion solution Optimize tester resources usage Supports advanced tester features (Such as Xmode, Multi-port etc’) Compress and minimize vectors count Allow direct tester binary patterns creation
-
Product
Military Communications Test
Test Platform
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
-
Product
Digital Test Instruments
-
High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
-
Product
Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
-
Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
-
Product
MODBUS RTU Test Software
-
MODBUS RTU Communication Test Program that helps users troubleshoot MODBUS RTU Communications. The software supports function codes, #3, #6 and #10(hex)
-
Product
In Circuit Test Service
-
In Circuit Test Program Development. Provide you with programming and fixture build as well as schematic review. Will order the fixture from one of our preferred vendors or any Fixture Vendor you prefer.
-
Product
JTAG USB Controller
NetUSB-1149.1/E
Controller
The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz.The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.
-
Product
Digital Test Instrumentation
Di-Series™
-
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
-
Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
788182-18
Vector Network Analyzer
The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
-
Product
Highly Accelerated Stress Screening (HASS) Test
-
HASS consists of high and low temperature and 3 axis vibration testing performed either individually or in combination.Highly accelerated stress screening is a technique for identifying process flaws in equipment during production. HASS subjects equipment to overstress conditions but at a level which does not affect design life.For assistance in designing a HASS test program contact the laboratory.
-
Product
Content based revision compare of Test Programs
Test program Comparator
-
TP-C is part of the new test program life cycle solutions from TestInsightAddress concerns such as - Why does my test program yield differently in two sites ? Is it really the same program ? What is different in a given test program revision ?
-
Product
Aging and Life Test Rack
SY2036
-
SY2036 Aging and life test rack is fully designed according to the IEC standard, and can also be designed based on the customer request. SY2036 can test LED, CFL, HID Indoor lamp and Outdoor lamp. Input Power supply: AC220V, 50/60HZ, 12KVA Min (110V is option) • Built-in transformer: 0-250V 5KVA and 0-300V 5KVA (Other power is option) • Maximum power for EUT: 5KVA and 12A (Other power is option) • EUT and Number: 112pcs B22, 112pcs E27. 36pcs T5/T8/T12 Tube. 32pcs LED panel (Other EUT can be designed according to customer request) • ON/OFF test: Can be set on the touch screen with program • Test number: 0~99999（Adjustable）
-
Product
PCI Based JTAG Controller
PCI-1149.1/Turbo
Controller
The PCI-1149.1/Turbo is a powerful PCI-based JTAG/boundary-scan controller that is used for testing and in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
-
Product
Test Program Sets
-
Each grouping may consist of 15 levels of development ranging from Complexity 0 to Complexity 14, with level 14 the most complex. Within each complexity, nine additional subcomplexity levels exist.
-
Product
Integrated Test Facility
ITF
-
The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
-
Product
Spectrum Analyzer Modular AFM AXIe
-
The software and hardware complex "Modular Spectrum Analyzer AFM AXIe" for the analysis of RF signals with a frequency of up to 10 GHz is intended for use in automated testing programs, research in the frequency domain of periodic signals in the RF and microwave ranges, as well as for analyzing the parameters of signals with analog modulation (AM, World Cup, FM).
-
Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
788182-12
Vector Network Analyzer
The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
-
Product
Pulse Adapter
CV30 P300
-
Frothingham Electronics Corporation
The CV30 P300 test station is the highest current 30KW pulser in a series of exponential pulse generators that can be connected to our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of high power exponential pulses. For exponential pulses up to the 10/1000, the station can produce 30KW, 1000A, or 300V whichever is the most limiting. The station can also include all of the usual FEC200 tests in the same test program.
-
Product
CMT - Tester
-
VPC G12 interface - interchangeable fixturesQuick exchange of test applicationMinimum of equipment in the fixture - fixture only as contacting interfaceManual fixtures ATXFixture identification - automatic test program loadingConnection to external meas. instrumentsControled by SCADUS / LabViewSelftest of internal cards and connected instrumentsCentral test program, configuration and datalog files location possibility (server)Uninterruptible power supply for PC
-
Product
High Power LED Test System
Lumere-GM
-
Evolusys Technologies Sdn. Bhd.
Lumere GM is a LED test and measurement system for various parameters of LED light. It is a high-accuracy system with a temperature-controlled CCD, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. The Lumere GM is used in laboratory applications and in the production of high-power LEDs.
-
Product
Development Software Suite
JTAG ProVision
-
The JTAG ProVision software suite is used to generate boundary-scan tests and in-system programming applications for assembled PCBs and systems. This professional development tool is fully automated and supports the import of design data from over 30 different EDA and CAM systems. Other key data inputs are JTAG device BSDL models and a large, well-maintained model library describing thousands of non-JTAG devices.
-
Product
Flying Probe Test Programming & Testing Services
-
Zero Defects International LLC
ZDI utilizes a Seica flying probe tester in order to provide test program development and testing services to customers in Silicon Valley and throughout North America. This is a very cost-effective solution for printed circuit assembly manufacturers who do not have in-house equipment of their own but have customers who require test services.
-
Product
Software
-
Our range of pcb test software covers your requirements in the entire production process: from preparation of CAD files to test program generation and quality assurance.
-
Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
-
Product
NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
