Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
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Product
USB Explorer (Two Port)
JT 3705
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The JT 3705/USB Explorer is a low-cost two port USB powered boundary-scan controller interface specifically suited for low volume testing and in-system programming of (C)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.
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Product
Humidity Chambers
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Shanghai Morningtest Environmental Chambers Co.,Ltd.
Humidity chambers offer a wide range of standard solutions for your testing program. Environmental testing with a humidity chamber helps improve product reliability and durability. Humidity chambers are available in a variety of styles, sizes, and performance configurations. All humidity chambers come with a standard temperature range for combined temperature and humidity testing.Humidity may affect the life expectancy of a component by creating stresses on the part materials and altering its electrical properties in a way that the component reliability is significantly diminished.Humidity tests are those performed with the aim of evaluating the properties of materials used in components and the reliability of non-hermetic packaged devices in humid environments.
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Product
In Stock & Rental Testing Chambers
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Weiss Technik In Stock and Rental test chamber programs help assist you with your environmental testing needs with a wide selection of stock for fast delivery. We offer many options that will fit your testing requirements. Our In Stock test chambers offer common sizes and features that allow you to keep your testing on track.
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Product
Climate Test Control
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The visibility and intuitive clarity of the created interface ensures the simplicity of creating climate testing programs and significantly reduces the possibility of operator error. Monitoring of the climate chamber parameters can be carried out both in manual mode and automatically. The program for measuring the electrical parameters of the tested product can also be configured. The data saved during the test can be presented in a graphical format and converted into Excel format.
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Product
Universal A/V Tester
Tester
This tester was built for our client with the specific requirement that specific UUTs can be added to the system by our client. We handled developing test software for the first 2 UUTs utilizing an open programming structure that allowed programming modules to be strung together to create test programs for any additional UUT that our client wants to add in the future.
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Product
Pattern Conversion
Wave Wizard
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Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective.
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Product
PLD ISP Feature, GTE 10.00p
K8220A
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The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Product
4-TAP PXI Express JTAG Controller
PXIe-1149.1/4E
Controller
The PXIe-1149.1/4E is a highperformance, multi-feature boundaryscan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring a high-speed PXI Express (PXIe) interface with four independent and configurable Test Access Ports (TAPs) along with direct serial programming capability, the PXIe- 1149.1/4E enables of boundary-scan integration with PXIe systems.
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Product
In-Circuit Test Programming Services
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Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Product
Test Adapter
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Development of a 12-way test and programming adapter from Toptest for ?? The Dash ?? from Bragi, a wireless, intelligent earphone with communication and sensor technology. With the first version of the test adapter, only a purely sequential testing was possible due to the interdependencies of the tests. In version 3.0, the now autonomous tests were brought into a parallel TestStand sequence. In addition, individual sockets were prioritized in order to optimally use the hardware resources. This resulted in a time advantage of 80% compared to the initial situation.
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Product
Remote Control Voice Recognition Tester
BK3013
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Ready to help you take on the leading edge of consumer technology, we have designed a machine that tests microphones which both use RF and are used for voice recognition. The BK3013 runs a uniform SPL sweep to calculate FRF and also runs an SPL sweep that allows you to test the SPL range of your mic. Our "Test Shop" program will show you the results in graphs and allows you to have the computer check specific points in the test.
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Product
6TL10 Table Top Test Base
H71001000
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
SD Express
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SCHILLER AUTOMATION GmbH & Co. KG
The Standard SD Express Memory Card Test Adapters support PCIe® 16 GT/s (Gen4) and PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD8.0 and SD7.1. Minimal crosstalk, short trace lengths. The Micro SD Express Memory Card Test Adapters supports PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD7.1. Minimal crosstalk, short trace lengths. They all support SDHC, SDXC, and SDUC operation modes Data collection via Lab Standard SSMP Test Cables and hard gold mating surface allow for high cycle count insertions and reliable performance.
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Product
Software for the Development and Implementation of Test Programs using IEEE 1641
newWaveX Suite
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We Have a unique suite of tools to support the development and implementation of test programs created using IEEE 1641 to define the signals and tests. These include the entry-level version of newWaveX (newWaveX–Lite), the development versions of newWaveX (newWaveX–SD and newWaveX–PD) and the complete integrated development environment for IEEE 1641, SigBase. These tools provide everything necessary to work with IEEE 1641, from creating simple signals through to implementing and managing a complete 1641 test environment. All of our 1641 tools are commercial off-the-shelf (COTS) items that may be used stand-alone or integrated into a complete test development environment. newWaveX products may be integrated with third party test executives and associated software.newWaveX is an intuitive user-friendly suite of products that does not require specialist training for users to acquire the skills to develop 1641 programs. Completing the IEEE 1641 User/Developer training course (which uses newWaveX Signal Development for the hands-on element), together with the associated 1 day newWaveX–SD User/Developer training course, provides complete information for the newWaveX user. Further support is provided for users of newWaveX packages under the maintenance agreements for those products.
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Product
Vector Network Analyzer (VNA) Simulator – Advanced
S94051B
Vector Network Analyzer
S94051B puts Keysight’s industry-leading network analyzer software portfolio into your computer. Dive deeper into data captured on an instrument with support for time domain, spectrum analysis, gain compression, and all the other software applications you use on your instrument. You can also develop and troubleshoot test programs on your computer before deploying them to the instrument. S94051B is a superset of S94050B and contains the S-parameter functionality.
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Product
Single Channel Signal Buffer Module
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Alliance Support Partners, Inc.
Signal quality problems caused by mismatched impedance can result in intermittent measurements and faulty diagnostics. This is most often observed when transporting a test program from one system to another, such as re-hosting it from an older generation system to a new one. The primary root cause of the impedance mismatch is the signal path from the UUT to the measurement instrument. The switching system technology often is responsible for much of the distortion. The Signal Buffer Module (SBM) is designed to receive a signal from the UUT with high impedance output and accurately reproduced it at the output for delivery to the measurement instrument. The SBM output matches the 50 ohm input impedance of most measurement instruments and result in significantly reduced signal distortion.
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Product
Laboratory Weathering
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Atlas Material Testing Solutions
Atlas Weathering Services Group (AWSG) operates one of the largest networks of ISO/IEC 17025 accredited accelerated weathering testing laboratories in the world. With laboratories in the USA, Germany, France and the United Kingdom, AWSG's indoor exposure laboratories offer artificial accelerated weathering tests and a variety of other environmental test programs, all designed to accurately simulate true end-use conditions and meet global weathering standards. Atlas has several accelerated laboratories around the world.
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Product
Website User Testing
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User experience research platforms. Analytics delivers what, Userlytics reveals why & how. A scalable user testing program combined with response & action dependent user test scripts. Now you can design a scalable user testing project that has the flexibility and ability to customize the UX test to the actions and responses of each UX test participant.
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Product
288-Pin Dual In-Line Memory Module
SQR-UD4(ECC)
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SQRAM is Industrial Grade DRAM memory. all of SQRAM are designed with original IC chip and adopt a rigorous test program.
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Product
Operating Software for elowerk Test Systems
TestBuilder
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elowerk TestBuilder is the operating software for elowerk test systems. TestBuilder is based on the Microsoft .Net Framework and runs on Windows Vista and Windows XP. Test programs can be created by CAD data import. The comfortable graphical user interface allows a straightforward editing of test programs. Customized applications can be programmed using a programming interface.
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Product
Test Adapters / Aeroflex Test System
52xx / 5300
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We develop and manufacture test adapters for your existing interface including documentation and test program
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Product
PAT Testing Software
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How PAT test results are recorded and managed can be an important factor in the implementation of effective workplace electrical safety testing programs.
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Product
Test Executive for Visual Development, Database Storage, and Run-Time Execution of Test Strategies
TestBase
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TYX TestBase is a test executive that supports the visual development, database storage and run-time execution of test strategies (also known as test plans or test sequences).TestBase integrates third-party applications such as: test programming languages, document viewers, report generators, database engines, Configuration Management systems and diagnostic tools.Its modular and open architecture enables system integrators and end-users to customize and extend the product and to integrate additional third-party applications.
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Product
LED Inspection
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Indicates which LEDs are not working. Checks if all diodes are placed in the correct places. Independently configures a test program for each new LED panel. Fast and effective – 1000 LED panel test takes up to 3 seconds.
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Product
Promira™ Serial Platform
TP500110
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The Promira™ Serial Platform is our most advanced serial device ever. This new, powerful platform offers many benefits over our previous generation of host adapters:*Integrated level shifting ensures you'll be able to work at a variety of voltages ranging from 0.9 to 5.0 volts without needing any costly accessory boards.*High-speed USB connectivity to the host system provides high performance and convenience for benchtop programming, testing, and emulation.*Ethernet connectivity is convenient for benchtop work, and it also enables remote control for your automation needs.*With the ability to provide a total of 200 mA of power, Promira platform can easily power your project, simplifying connectivity and troubleshooting.*New architecture enables you to download applications to the Promira platform - Upgrade your device when you need new features and you'll never wait for that emergency delivery in the middle of your project.
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Product
DiodeTester
FECPLS510
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Frothingham Electronics Corporation
The PLS510 automatic tester is designed primarily to doSURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses andTHERMAL RESPONSE either in DVF (mV) or degrees per Watt. All three test types may be performed in a single test program.
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Product
UDIMM DDR3L 1600
SQR-UD3N
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Micron Original memory IC, FIXED BOM. 3yrs longevity & lifetime warranty, Undergo strict test program. Support Smart Monitoring (SQR Manager)Select Product.
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Product
High Performance 50 MHz Dynamic Digital I/O PXI Subsystem
GX5960 Series
Digital I/O
The GX5960 digital subsystem represents the highest level of performance available for PXI-based digital instrumentation and features high performance pin electronics and a timing generator / sequencer in a compact, 6U PXI form factor. The GX5960 series consists of the GX5961 clock generator board with 16 driver / sensor channels and the GX5964 driver / sensor board which supports 32 bi-directional I/O channels. Up to 528 digital I/O channels can be supported by the GX5960 digital subsystem. Each digital channel features a wide drive / sense voltage range of -14 V to +26 V (maximum swing of 24 volts) which can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and a load value (with commutation voltage level) – offering the user complete flexibility when creating test programs and fixtures for multiple UUTs. In addition, each channel offers a parametric measurement unit (PMU) for DC measurements.
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Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
788182-26
Vector Network Analyzer
The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
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Product
Universal Tester Software Platform
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APG (Automatic Program Generator) is a user-friendly 32-bit programming system aimed at providing fast and easy test program creation. It is a powerful Windows Application with all of the features of the Windows® environment enhanced by Autotest’s own Multi-Tasking Windows control.
