Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
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Product
Rotary Table Handler
6000 Series Rotary Handler
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Rotary table handlers are an excellent choice for PCBA or product – level test, programming, part marking, automatic part rejecting, and vision inspection in order to satisfy manufacturing applications that require high throughput. Rotary table based systems used in production can also help reduce the impact of load and unload times for the operator, because the device-under-test (DUT) automatically moves to the next cell within the station as each DUT is loaded. Circuit Check’s 6000 series handlers are modular, scalable and flexible, supporting high-mix and high-volume production needs. A common application example is to configure a 6000 series as a rotary station to perform simultaneous PCBA bar code scanning, testing, programming and marking, in a pipe-line process which improves throughput requirements. The 6000 series handlers leverage Circuit Check’s unique quick-change fixture drop-in technologies to allow for station modularity and scalability. Production line flexibility is achieved because the 6000 series handler is software and hardware agnostic, enabling adaptability to a variety of applications, and is limited only by the number of stations.
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Product
Engineering Design & Development
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TPSA has over 20 years of experience in Engineering Design & Software Development including:Hardware & Software DesignOTPS Acquisition SupportSystems Installation & SupportAircraft Modification/CertificationEngineering Studies & AnalysesFunctional & Systems TestingIndependent Verification & Validation (IV & V)Test Program Set EngineeringReliability & Maintainability (R&M)Engineering Drawings & DataConfiguration Data ManagementReverse EngineeringRequirements AnalysisSupport Equipment (SE)Aircraft Launch & Recovery Engineering (ALRE)Engineering Change Proposal (ECP) ReviewTechnology Insertion (TI)PDR, CDR, FAT, Techeval, OSV Support
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Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
790406-12
Vector Network Analyzer
The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
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Product
Engineering Services
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In addition to the highest quality test programming, maximizing board coverage, and efficient board testing, TTCI offers a full array of other engineering services, including CCA (Circuit Card Assembly) Testing, Design for Test, ASTER TestWay electrical design for test analyzer, Feasa LED analyzer, SMH Technologies FlashRunner in-system programmer, finite element analysus, installation, reverse engineering of Gerber to CAD, Training, Test System PC, Hardware, and Software Upgrades, and more.
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Product
Boundary-Scan Controllers
Controller
Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry’s most reliable IEEE 1149.x high speed and performance JTAG controllers, JTAG interfaces and more. To reliably execute your test and programming applications you can choose from a range of different controllers with different performance capabilities and form factors. For use in design, production and manufacturing and service.
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Product
Ci Series Xenon-Arc Weather-Ometers
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Atlas Material Testing Solutions
The Ci Series Weather-Ometers are the most widely used rotating rack water-cooled xenon-arc weathering testing instruments in the world. Their large capacity and full-functional performance make these instruments the best choice for a wide variety of accelerated weathering test methods. They offer superior irradiance and temperature uniformity within the test chamber, as well as a wide performance envelope for all weathering testing parameters. They are commonly referenced in OEM weathering test standards and specifications. The intuitive user interface makes operation and programming very simple. Several revolutionary options and accessories are available to allow researchers to get the most out of their weathering testing programs.
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Product
PCIe to 3U VPX Extender / Riser Card
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This adapter can be used to run, test or program a 3U VPX card in a standard PC PCIe slot. SSC switchable (ON/OFF) PCs available from PCI-Systems Inc.
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Product
Universal Tester Software Platform
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APG (Automatic Program Generator) is a user-friendly 32-bit programming system aimed at providing fast and easy test program creation. It is a powerful Windows Application with all of the features of the Windows® environment enhanced by Autotest’s own Multi-Tasking Windows control.
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Product
4-TAP PXI Express JTAG Controller
PXIe-1149.1/4E
Controller
The PXIe-1149.1/4E is a highperformance, multi-feature boundaryscan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring a high-speed PXI Express (PXIe) interface with four independent and configurable Test Access Ports (TAPs) along with direct serial programming capability, the PXIe- 1149.1/4E enables of boundary-scan integration with PXIe systems.
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Product
1-2 Independent, Dual Redundant 1553 Channels on Small Mezzanine
MEZ-E1553
Ethernet Interface
From our popular ENET product, the MEZ-E1553 is a small, rugged mezzanine product that can easily be integrated into your system design. Alta provides full reference schematics, design notes, STEP 3-D Files, and sample ESS test programs. Guaranteed 1553A/B/C compliant with AS4111 5.2 Protocol Test reports.
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Product
MTM-Bus Tester
PXIe-1149.5
BUS Tester
The Corelis PXIe-1149.5 is a versatile, multi-mode instrument for interfacing with MTM-Bus modules. The PXIe-1149.5 adds MTM-Bus master, slave, and monitoring with full IEEE-1149.5 electrical and protocol compatibility with a standard PXIe interface for convenient integration into any Test Program Set (TPS).
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Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
788182-08
Vector Network Analyzer
The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
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Product
JTAG Test Software
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JTAG Technologies software has been subject to a program of continuous development for over 20 years. The first products, launched in 1991 formed the start of our 'Classic' range of software and featured the first automatic boundary-scan test program generator (ATPG) for PCB interconnects plus associated test execution and diagnostics software. In 2006 JTAG Technologies launched it's new flagship tools platform JTAG ProVision.
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Product
6TL10 Table Top Test Base
H71001000
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
CAD / BOM Translation Software
ProntoTEST-FIXTURE
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In minutes the Unisoft ProntoTEST-FIXTURE software translates CAD and Bill of Materials (BOM) files into real reference designators, netlists, X/Y component pin geometries, values, tolerances, part numbers, etc. This data is then used by Test Engineers to program their ATE (Agilent/Hewlett Packard "board & board x/y", Teradyne "ipl", Genrad ".ckt"), MDA, and flying probe test equipment and design the "Bed of Nails" test fixtures.
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Product
288-Pin Dual In-Line Memory Module
SQR-UD4(ECC)
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SQRAM is Industrial Grade DRAM memory. all of SQRAM are designed with original IC chip and adopt a rigorous test program.
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Product
Vector Network Analyzer (VNA) Simulator – Advanced
S94051B
Vector Network Analyzer
S94051B puts Keysight’s industry-leading network analyzer software portfolio into your computer. Dive deeper into data captured on an instrument with support for time domain, spectrum analysis, gain compression, and all the other software applications you use on your instrument. You can also develop and troubleshoot test programs on your computer before deploying them to the instrument. S94051B is a superset of S94050B and contains the S-parameter functionality.
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Product
Test Module
FailSim
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FailSim simulates a faulty component and allows the user to quickly and simply improve the actual fault detection of a test program. The result represents a definitive conclusion for tested or untested components.
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Product
PLD ISP Feature, GTE 10.00p
K8220A
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The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Product
Test Executive & Development Studio
ATEasy
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ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems. ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles. With ATEasy, test applications are faster to generate and easier to maintain.
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Product
electronic Consolidated Automated Support System
eCASS
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electronic Consolidated Automated Support System (eCASS) will validate that the aircraft is combat ready. eCASS is the workhorse for avionics repair across the Naval Aviation Enterprise. Through automated testing at sea and ashore, maintainers are able to return equipment to readiness status quickly and efficiently. Compatibility with legacy CASS stations preserves the Navy’s investment in more than 550 Test Program Sets supporting 750 avionic components.
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Product
Spectrum Analyzer Modular AFM AXIe
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The software and hardware complex "Modular Spectrum Analyzer AFM AXIe" for the analysis of RF signals with a frequency of up to 10 GHz is intended for use in automated testing programs, research in the frequency domain of periodic signals in the RF and microwave ranges, as well as for analyzing the parameters of signals with analog modulation (AM, World Cup, FM).
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Product
Test Program Sets & Custom System Level Software
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WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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Product
Test Executive for Visual Development, Database Storage, and Run-Time Execution of Test Strategies
TestBase
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TYX TestBase is a test executive that supports the visual development, database storage and run-time execution of test strategies (also known as test plans or test sequences).TestBase integrates third-party applications such as: test programming languages, document viewers, report generators, database engines, Configuration Management systems and diagnostic tools.Its modular and open architecture enables system integrators and end-users to customize and extend the product and to integrate additional third-party applications.
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Product
LED Inspection
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Indicates which LEDs are not working. Checks if all diodes are placed in the correct places. Independently configures a test program for each new LED panel. Fast and effective – 1000 LED panel test takes up to 3 seconds.
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Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
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The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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Product
UDIMM DDR3L 1600
SQR-UD3N
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Micron Original memory IC, FIXED BOM. 3yrs longevity & lifetime warranty, Undergo strict test program. Support Smart Monitoring (SQR Manager)Select Product.
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Product
JTAG USB Controller
NetUSB-1149.1/E
Controller
The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz.The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.
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Product
Pulse Adapter
CV30P650
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Frothingham Electronics Corporation
The CV30 P650 test station is currently the highest voltage pulser in a series of exponential pulse generators that can be connected to our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of high power exponential pulses. The CV30 P650 pulse adapter can produce a maximum current of 100A at up to 600V using exponential pulses up the 10/1000 waveform. The pulser is rated at 30KW from 300V to 650V. Voltage compliance at 100A is 600V. The station can also include all of the usual FEC200 tests in the same test program.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
