Modulation Transfer Function
measures the various levels of detail an object transfers to an image.
-
Product
SINE Sinusoidal Vision Demonstration Array
-
The Sinusoidal Visual Demonstration Array is designed to demonstrate the Modulation Transfer Function (MTF) of the human eye. Its transmittance varies sinusoidally and increases in spatial frequency from 0.2 to 20 c/mm, following a logrithmic scale. The modulation increases linearly from top to bottom. One can see, in the image, where the visual contrast contour disappears which is the MTF of the eye. Ideally suited for teaching and demonstration, the Array is available on film mounted in glass (-G), or mounted in a 2″x 2″ projection slide.(-SL)
-
Product
Measuring Systems For Night Vision Systems
MTF Master IIT
-
Optik Elektronik Gerätetechnik GmbH
Measuring system for MTF, SNR and EBI of Image Intensifier Tubes (IIT). The MTF MASTER IIT was specially developed to classify the quality of image intensifier tubes by the objective criteria of the MTF (Modulation Transfer Function).
-
Product
SINE FBI Charts
-
There are two SINE Sinusoidal arrays designed for FBI applications: the SINE M-13-60-S-RM and the SINE M-13-60-FBI Kit.The SINE M-13-60-S-RM was designed jointly by the Federal Bureau of Investigation, of Washington DC, and MITRE, of Bedford MA. The primary function of this Target is for computing Modulation Transfer Function (MTF) evaluation in live scanner fingerprint systems for conformance to Integrated Automated Fingerprint Identification Systems (AFIS) image quality requirements. The array is on reflective material measuring 16mm x 16mm with sinusoidal arrays ranging in frequency from 1.0 to 10.0 cycles per mm; with nominal modulation of the sinusoidal areas at 60%. The top and bottom rows are density scales, from 0.20 to 1.20 densities.The SINE M-13-60-FBI Kit consist of two individual components, the SINE M-13-60-1X-RM and the RR1-N-RM Ronchi Ruling grating.
-
Product
MTF Measuring Systems For Industrial Applications
-
The MTF (modulation transfer function) is a recognized quality criterion for the imaging quality of optics. OEG GmbH develops and manufactures computer-controlled, fully automatic measuring systems for MTF and other parameters for quality assurance in optics production, incoming goods inspection, research and teaching
-
Product
Optics Test Equipment
MTF Measuring Systems For Industrial Applications
-
Optik Elektronik Gerätetechnik GmbH
The MTF (modulation transfer function) is a recognized quality criterion for the imaging quality of optics. OEG GmbH develops and manufactures computer-controlled, fully automatic measuring systems for MTF and other parameters for quality assurance in optics production, incoming goods inspection, research and teaching.
-
Product
NI's Wireless Connectivity Functional Test Solution
Functional Test
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
-
Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
Functional Test
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
-
Product
Benchtop Automated Functional Test
midUTS
Functional Test
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
-
Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
-
Product
Solid State PIN Diode Transfer Switch, 100 MHz to 8 GHz
P9400A
Dual Transfer Switch
The Keysight P9400A solid state PIN diode transfer switch offers outstanding performance in terms of port-to-port isolation, switching speed and low insertion loss over a broad operating frequency range of 100 MHz to 8 GHz. The P9400A is particularly well-suited for ultra-fast RF and microwave switching applications in instrumentation, communications, radar, switch matrices and various other test systems where high isolation, speed and lifetime of a switch are critical.
-
Product
Automated Multi-Functional Tester
QTouch 1408 C
Functional Test
Qmax Test Technologies Pvt. Ltd.
QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.
-
Product
LXI 50Ω Microwave Transfer Switch
60-808-415-003
Microwave Transfer Switch
These LXI (Ethernet-controlled) Microwave Transfer Switches are suitable for routing 50 Ω signals up to 50 GHz. With up to 16 switch banks, they are ideal for constructing complex microwave switching systems for many applications. Connection is by front panel mounted SMA. SMA 2.9 or SMA 2.4 connectors.
-
Product
LXI 50Ω Microwave Transfer Switch
60-808-015-006
Microwave Transfer Switch
These LXI (Ethernet-controlled) Microwave Transfer Switches are suitable for routing 50 Ω signals up to 50 GHz. With up to 16 switch banks, they are ideal for constructing complex microwave switching systems for many applications. Connection is by front panel mounted SMA. SMA 2.9 or SMA 2.4 connectors.
-
Product
LXI 50Ω Microwave Transfer Switch
60-808-310-007
Microwave Transfer Switch
These LXI (Ethernet-controlled) Microwave Transfer Switches are suitable for routing 50 Ω signals up to 50 GHz. With up to 16 switch banks, they are ideal for constructing complex microwave switching systems for many applications. Connection is by front panel mounted SMA. SMA 2.9 or SMA 2.4 connectors.
-
Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
-
Product
EOL/Functional Testing
Functional Test
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
-
Product
Functional Test for Engineering Lab
Spectrum BT
Functional Test
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
-
Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
-
Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
-
Product
LXI 50Ω Microwave Transfer Switch
60-808-310-011
Microwave Transfer Switch
These LXI (Ethernet-controlled) Microwave Transfer Switches are suitable for routing 50 Ω signals up to 50 GHz. With up to 16 switch banks, they are ideal for constructing complex microwave switching systems for many applications. Connection is by front panel mounted SMA. SMA 2.9 or SMA 2.4 connectors.
-
Product
Functional Test Fixtures
Functional Test
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
-
Product
Digital Bit Pattern Generator
FAB-3226
Function Generator
The FAB-3226 Digital Bit Pattern Generator connects digital ports to an user-defined FPGA logic. As the FPGA is user-programmable all kind of operation can be implemented: input, output, and closed loop operation where input and output are processed in real-time. All this can be controlled by an user-defined application program running on a computer system (PC or embedded).
-
Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
-
Product
Arbitrary/Function Generator,2 Ch,150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing
T3AWG2152
Function Generator
Arbitrary/Function Generator,2 Ch,150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing.
-
Product
PXI Three Channel Function Generator
Function Generator
Our PXI Function Generator is capable of generating sine, square and triangle waveforms to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard. It can generate fast swept frequency signals, permitting the output to emulate the operation of variable speed devices. The module can also generate arbitrary waveforms loaded into its internal 256k memory, allowing the emulation of many waveform types including the typical waveforms of automotive and aerospace sensors.
-
Product
LXI 50Ω Microwave Transfer Switch
60-808-215-004
Microwave Transfer Switch
These LXI (Ethernet-controlled) Microwave Transfer Switches are suitable for routing 50 Ω signals up to 50 GHz. With up to 16 switch banks, they are ideal for constructing complex microwave switching systems for many applications. Connection is by front panel mounted SMA. SMA 2.9 or SMA 2.4 connectors.
-
Product
PXI Functional Test System
U8989A
Functional Test
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
-
Product
PXI Multi-Channel Function Generator Module, 32-Channel
41-625-001
Function Generator
The 41-625-001 (PXI) and 43-625-001 (PXIe) are function generator modules that provide 32 channels in a single PXI/PXIe slot. They can generate sine waves to 300 kHz with 5.76 mHz frequency resolution referenced to the 10 MHz PXI clock. The output voltage range is up to +/-25 V in a 16-bit resolution. It also support PXI trigger functions allowing events from other instruments to initiate waveform generation or sweeps.
-
Product
Functional Test System
TS-5040
Functional Test
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
-
Product
Arbitrary Function Generator
HMF2525/HMF2550
Function Generator
Powerful pulse generator Provides pulses with a recurrence rate of up to 12.5 MHz/25 MHz; the pulse width can be set from 15 ns to 999 s with a resolution of 5 ns. Rise/fall time can be selected from 8 ns to 500 ns – a very useful feature when characterizing input hysteresis of semiconductor devices Easily create arbitrary waveforms Arbitrary waveforms can be developed with PC software. Stored waveforms can be loaded via front USB port or imported via the complimentary HMExplorer software (available for download)
