Scanning Electron Microscopy
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopes, SEM
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Programmable Single Channel DC Electronic Load, 150V/30A/300W
T3EL150303P
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Programmable Single Channel DC Electronic Load, 150V/30A/300W.
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Product
Talon 6 GHz RF/IF Sentinel Intelligent Signal Scanning Rackmount Recorder
Talon RTS 2620
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- Search and capture system using Sentinel™ Intelligent Signal Scanner- Captures RF signals up to 6 GHz- Capture and scan bandwidths up to 40 MHz- 30 GHz/sec scan rate- Selectable threshold triggered or manual record modes- 16-bit A/D with 75 dB SNR & 87 dB SFDR- Built-in DDC with selectable decimation range from 2 to 65,536- Built-in DUC with selectable interpolation range from 2 to 65,536- 3U to 6U 19-inch rackmount server chassis with hot-swappable HDDs- Storage capabilities to 192 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor- Optional RF upconversion- SystemFlow® GUI with virtual Oscilloscope, Spectrum Analyzer and Spectrogram displays
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Electronic Differential Pressure
Density Measurement
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An innovative software and hardware concept makes it possible to combine any two pressure transmitters of the VEGABAR 80 series into an electronic differential pressure system to measure density. Electronic differential pressure measurement is used for measuring density change and/or for compensation when the level needs to be measured.
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Electronic Crockmeter
UI-TX51
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Electronic Crockmeter (Crock Meter) is used to test color transfer of colored textile (leather, fabric and etc,) to other surface due to rubbing. It is test of colour fastness to rubbing, one of physical testing of textiles.
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Electronic Yarn Count System
Y006
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Consists of an electronic balance (220 grams x 0.001 grams) with internal and external custom software which calculates yarn, sliver and roving counts as well as fabric yield in various systems and provides statistics on any number of tests including totals, average, CV and SD
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Line Scan Camera
Piranha4 Polarization
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The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
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Electronic Fuel Injection & Ignition Spark Tester Kit
36310
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Quickly diagnose "no start" and engine miss conditions in the electrical fuel injection and spark plug circuits. Analyze rough running engines. Contains Cat. No. 36300, Noid Light Set to test electronic fuel injection signals and the Cat. No. 23900, In-Line Ignition Spark Checker to trouble shoot the ignition system (Shows a duplicate view of the ignition spark). Supplied with Noid Lights to check Bosch PFI, Ford TBI, Geo TBI, GM PFI, GM SCPI and GM TBI.
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Saluki SEL7 Series Programmable DC Electronic Load (up to 6kW)
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The new SEL7 series programmable DC electronic load is a new generation product designed by Saluki Technology. Incorporating high-performance chips, the SEL7 series delivers high speed and high accuracy with a resolution of 0.1mV and 0.01mA (basic accuracy is 0.03% and basic current rise speed is 2.5 A/μs).SEL7 series have wide application from production lines for cell phone chargers, cell phone batteries, electronic vehicle batteries, switching power supplies, linear power supplies, and LED drivers, to research institute, automotive electronic, aeronautic and astronautic, maritime, solar cell and fuel cell etc. test and measurement applications.
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Electron Microscope Analyzer
QUANTAX EDS for TEM
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Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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Product
High Current Probes (Power Electronics) HCF32005S135N130
1003497
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The High Current Probes (Power electronics) HCF32005S135N130, order code 1003497, are meticulously designed to cater to high-performance applications in power electronics. With a pitch of 2.54 mm, these basic contact probes ensure precise contact for robust current handling up to 12A. They are operational across a temperature range of -45°C to +200°C, making them ideal for various environments. The typical contact resistance is a remarkable 20 mOhm, emphasizing their reliability in delivering efficient performance under load.
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H330 High Current Probes (Power Electronics)
1001697
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The H330 High Current Probes are designed specifically for power electronics applications, offering exceptional performance and precision. With a total length of 15 mm and a lightweight yet durable brass construction, these probes ensure reliable connections in demanding environments. The pressed ring diameter of 2.67 mm and an outer diameter of 2.35 mm make them compatible with a variety of receptacles, enhancing their versatility in multiple testing scenarios.
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Color Measurement With Line Scan Cameras
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The Chromasens line scan cameras offer new approaches for the color-accurate capture of objects. The chromaPIXA has an internal FPGA-based color calculator which converts the color information of the CCD sensor on-the-fly into standard output color spaces. Algorithms are used which allow a more precise transformation than the usual 3x3 matrix transformation.
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Electronic Testing
1148675
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The Electronic Testing probes by FEINMETALL represent the pinnacle of precision technology, tailored for a wide variety of applications in the electronic components sector. With over 60 years of expertise, these sophisticated probes are designed for rigorous tasks including board tests and wire harness validations. They excel in both low and high-current applications, providing reliability and efficiency in demanding environments. The probes are engineered for precision, ensuring effective electrical contact in tightly packed configurations, making them suitable for modern electronic testing needs.
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Product
300 Watt Electronic Load Module
N3304A
Load Module
The Keysight N3304A is a 300 W (0-60A, 0-60V)electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3304A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3304A can also digitize waveforms.
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Sensitive Terahertz Detectors: Cooled Terahertz Detectors Based On Hot Electron Bolometer (HEB) And Room Temperature Terahertz Detectors Based On Golay Cell.
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Insight Product Company offers Cooled and Room Temperature Terahertz (THz) Detectors
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Electronic Pressure Switch (select Pressure Switch)
PSW
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multi-rotation trimmer and operation display are built in, making setting easy.
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Product
Electron Multipliers
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Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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Otolaryngology (ENT) Microscopy Solutions
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Otolaryngology (ENT) microsurgery requires top-class imaging quality and visualization. Microscopes for otolaryngology allow specialists to carry out complex and minimally invasive ENT surgical procedures with a high level of precision to enable the best possible clinical outcomes.
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Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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Optical Microscopy
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Rocky Mountain Laboratories, Inc.
Optical microscopy from 1X to 1000X is achieved with a variety of microscopes. Images can be formed in bright field, dark field, and differential interference contrast (DIC or ‘Nomarski’) modes. Optical microscopy anlaysis is often used before any other techniques to document samples. Color and morphology are important clues in materials identification.
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Electron Microscope Sample Preparation
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Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Electronic Circuits
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1. A complete laboratory training system. 2. Understanding the theory and application of basic electronnic circuits. 3. Suitable for both technician and beginner of electronic students.
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PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
Load Module
The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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Electronics
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Electromagnetic, Signal Integrity, Thermal and Electro-Mechanical Simulation Solutions. The use of Ansys Electronics solution suite minimizes the testing costs, ensures regulatory compliance, improves reliability and drastically reduces your product development time. All this while helping you build the best-in-class and cutting-edge products. Leverage the simulation capability from Ansys to solve the most critical aspects of your designs
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Boundary Scan / JTAG Test Development System
onTAP Development
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The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Atomic Force Microscopy
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Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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High Current Probes (Power Electronics) HCF73317B400G300
1008187
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The High Current Probes (Power electronics) HCF73317B400G300 is engineered for precision and reliability in critical applications, standing out with its ability to handle continuous current up to 30A and a broad operational temperature range of -45°C to +200°C. This basic contact probe is designed to provide exceptional performance, featuring a low typical contact resistance of just 8mΩ, which ensures minimal energy loss and maximal efficiency during operation. Its robust mechanical properties include a preload of 60cN, a spring force of 300cN, and a nominal travel of 4mm, allowing for accurate and consistent contact under varying conditions.
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Scanning Electron Microscope
SEM
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Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
