Electron Microscopes
scientific instruments that use a beam of highly energetic electrons to examine objects on a very fine scale.
See Also: Transmission Electron Microscopes
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Product
High Current Probes (Power Electronics) H310
1001695
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The High Current Probes (Power electronics) H310 is meticulously engineered for precision in high-demand electronic applications. With a total length of 14.00 mm, this probe is designed to facilitate seamless connections in power electronics, showcasing its aptitude in efficient electrical measurements. The compact architecture, with a press ring diameter of 1.50 mm and an outer diameter of 1.20 mm, ensures a secure fit in various receptacles. The collar height of 0.30 mm contributes to its robustness, making it an essential tool for both power engineers and hobbyists alike.
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Product
Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Product
Electronic Test Lead Kit
U8202A
Accessory Kit
Designed for use with the U3606A DMM and DC power supply; includes leads, alligator clips, mini grabbers, and more
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Product
Microscope Platforms
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
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Binocular Stereo Zoom Microscope Systems
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Our ELZ Series is not only a great choice for an entry level binocular microscope, but it’s cost effective and compact, as well as have a zoom range of 3.5x – 120x with options and a FOV of 67mm – 6mm with options. Our SSZ-II Series, which is a user friendly stereo zoom microscope, has a zoom range of 2x – 180x with options and a FOV of 109mm – 1.3mm with options.
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Product
DC Electronic Load
3110 Series（250W~700W）
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Each 3110 Series stand-alone load has its own control and display panel, CC / CR / CV / CP/ Dynamic modes, also can be controlled intranet via RS232 and USB interface.
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Product
Electronic Transformer Test System
UI2000-ET
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• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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Product
Automotive Electronics Functional Test System
TS-5020
Functional Test
The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Product
Electronic Components Test
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Parameters to be measured (absolute value): Measure hypo-class U, Iout, Hz, Hc, Br, Bm, Hm, Br /Bm, m, magnetic core loss, B-H curve, U curve and I curve Output capacity of the high frequency power: Uout: 1~300V, Iout: 0.05~5A, Pout: 300VA, frequency: 10~300kHz Accuracy: 2% With 12-bit high-speed A/D, sampling rate up to 40MHz, ensuring data precise and stable test result Supermaximal database, suitable for almost all kinds of magnetic material in market, such as: circle, E ,U , ETD-EER, JAR, RM , EP , PM , EL , ER, PQ, EFD, plane E, etc Perfect software interface enables observation of curve in detail Meet international test requirements for magnetic particle ASTM E1444, ASTM E709-08.
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Product
Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Digital Microscope
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A variation of a traditional optical microscope in which a digital/microscope camera is connected, and image output is displayed on a screen and/or monitor. Most models include software and a computer for use.
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Product
Electronic DC Load, 500V, 16A, 400W
LDH400 Series
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Versatile solution for direct testing of dc power sources and PFCsConstant current, resistance, conductance and power modesWide voltage and current range, 10 to 500V and 0 to 16A400 watts continuous dissipation at 28°C (360W at 40°C)High resolution and accuracy for level settingBuilt-in transient generator with variable slewCurrent monitor output for waveform viewingVariable drop-out voltage for battery testingHigh resolution backlit graphic LCD with soft key controlAnalogue remote control of levels and TTL control of on/off and transient switchingFront and rear input terminalsLoad inputs rated to CAT II (300V)Full bus control via USB, RS232 and LXI compliant LAN interfacesGPIB Option
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Electronics For Signal Processing
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PCB Piezotronics manufactures a wide variety of electronics to power ICP®, PE (Charge Mode), MEMS, strain gage and other types of sensors. All of these products provide conditioning of sensor signals for transmission to data acquisition systems.
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Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Electron Diffraction System
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Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Product
Programable Power Supply & Programable Electronic Load
PW-8033P
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*DC 0~32V / 0~3A X 2 + Fix 5V/3A*Triple Output 207 VA High Power*4 Digits, 4 Display*Programable Control, 9 Memory*Built In USB Interface*Series 0~64V / 0~3A Operation
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Programmable DC Electronic Loads
SDL1000X/X-E Series
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SDL1000X/SDL1000X-E series Programmable DC Electronic Load has a 3.5 inch TFT-LCD display, a user-friendly interface and superb performance specifications. The SDL1020X/SDL1020X-E models feature an input range of 150 V/30 A 200 W while the SDL1030X/SDL1030X-E have an input range of 150 V/30 A 300 W. The SDL1000X series leads with measurement resolution of 0.1 mV/0.1 mA and the base SDL1000X-E series resolution is 1 mV/1 mA and adjustable current rise times from 0.001 A/μs~2.5 A/μs. For remote communication and control, the SDL series includes RS232/USB/LAN interface types. The SDL1000X series delivers stability over a wide range of applications and can meet all kinds of testing requirements. including: Power, battery/handheld device design, industry, LED lighting, automotive electronics, and aerospace.
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Product
RF Electronic Calibration Module (ECal), DC/300 KHz To 9 GHz, 7mm, 2 Port
85091D
Electronic Calibration Module
The Keysight 85091D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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Electron Multiplication (EM) Standard Image Sensors
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EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Strap-Down Electronic Compass - for Commercial, Industrial, and Military Users
Revolution LP
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The Revolution™ LP is a strap-down electronic compass designed specifically for commercial, industrial, and military users. The Revolution LP will be of particular interest to ROV and AUV manufacturers who are concerned with power usage and accurate heading in all types of challenging conditions. In standby mode, it draws a mere 50 μA and requires only 15 mA in run mode. It provides accurate heading data in less than a tenth of a second from wakeup. An extended range tilt sensor is available that allows for +/-60° of pitch and roll.
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Product
DC Electronic Load
Model - KM-mPD-501
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Kusam Electrical Industries Limited
KM-mPD-501 DC electronic load mainly focuses on the testing of power circuit on PCB. KM-mPD-501 offers a solution for function test of Switch step up, Stepdown, Regulators and Driver IC . Engineer puts components, such as CPU, DSP, FPGA; etc on a PCB after the power circuit has been tested. It’s not complete to use a meter to measure the voltage. KM-mPD-501 offers engineer OVP, OCP and OPP functions that help engineer know the value of overload current . On the other hand, engineer can use a programmable DC power supply (mPP series) to offer external power and connect PCB’s output to KM-mPD-501. Then engineer can easily get output watt, figure out the efficiency of power circuit and check if inductances, capacitances and resistances perfectly work with the power circuit. KM-mPD-501 not only offers loading emulation of current but also provides OVP and OPP. User can use these functions to test solar power battery, rechargeable battery and motor driver. In school laboratory, KM-mPD-501 helps students do experiment on power circuit, linear circuit and driver circuit.
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Product
Electronic Load Device
786531-01
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The RMX-4005 provides capabilities for qualifying power designs and validating power supply functionality in a production environment. You can combine Electronic Load Devices to customize your test system based on the number of channels, maximum load power, and voltage and current of each channel. You can connect multiple RMX-4005 devices in parallel to provide higher power capabilities for your power supply tests. This feature gives flexibility for future projects that have different power requirements.
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Product
AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Product
High Current Probes (Power Electronics) HCF77306B300G150
1009398
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The High Current Probes (Power electronics) model HCF77306B300G150 is specifically designed for high-performance applications in demanding environments. With a robust operating temperature range of -45°C to +200°C, this basic contact probe excels in reliability and performance under extreme conditions. The probe features a compact design with a pitch of 3.50 mm, making it suitable for various integration needs in power electronics.
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Acoustic Microscope
AMI P300
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The FastLine P300 Acoustic Microscope is specifically designed for accelerated throughput, semiautomated screening of microelectronic devices on the manufacturing floor.
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Product
Scanning Kelvin Probe Microscope
VS-SKP
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The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Electronic Test & Measurement Equipment
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We are known worldwide for the M.O.L.E. Temperature Profiler. The Mole is used in the Electronic, Paint, Food, and the Industrial marketplace. The Mole is a stand alone, 6 channel, temperature profiler that it is used in many harsh processes that require the temperature measuring instrument to be inside the heating chamber or "ride along" with the parts or process being measured over time such as Solder Reflow Ovens and Wave SolderMachines.
