Electron Microscopes
scientific instruments that use a beam of highly energetic electrons to examine objects on a very fine scale.
See Also: Transmission Electron Microscopes
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Product
High Power DC Electronic Load
IT8800 Series
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IT8800 series has wide power range 150W~10KW, voltage and current measurement speed up to 50KHZ, resolution up to 0.1mV/0.01mA, adjustable measurement current rising speed 0.001A/us~2.5A/us, built-in RS232/GPIB/USB interface. IT8800 series has wide application fields because of its high performance products, it has been applied to LED lighting, aerospace, automotive electronics and other fields.
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Product
Electronic Light Table
ELT®/Series
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The ELT/Series software provides powerful imagery and geospatial exploitation tools for a wide range of applications, including intelligence, mission planning and disaster management.
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Product
Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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Product
Desktop Fluorescence Microscope
Nanoimager
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The complete package for super-resolution microscopy
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Product
Electronic Control Units
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Delivers high-performance real-time control, functional safety, and exceptional flexibility, making it ideal for demanding applications in off-highway machines and non-road vehicles.
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Product
Programmable DC Electronic Load
DL3000
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The DL3000 series is a cost-effective, economical programmable DC electronic load with a friendly human-machine interface and excellent performance specifications. It provides a variety of remote communication interfaces to meet diverse testing needs for design and testing. A wide range of solutions are available for a wide range of industries including automotive electronics and fuel cells.
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Product
Electron Multiplication (EM) Standard Image Sensors
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EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Product
High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
DC Electronic Loads
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Keysight DC electronic loads provide you with the flexibility to test a wide range of applications from power-supply test to simulation of high-intensity discharge (HID) headlamps. The 16-bit voltage, current and power-measurement system provides both accuracy and convenience, and eliminates the need for a DMM, external shunts and wiring.
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Product
Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
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HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Product
DC Programmable Electronic Load
ELCH300
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- VFD display- High resolution 0.1mA/1mV- Voltage range 0V to 500V- Working mode CV/CC/CW/CR/OV/OC/- OP/OT protection- Communication: USB/RS232/GPIB
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Product
Raman Microscopes
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Edinburgh Instruments has been providing high performance instrumentation in the Molecular Spectroscopy market for almost 50 years. Our Raman microscopes continue our commitment to offering the highest quality and sensitivity instruments. For further information on our Raman Microscopes, simply contact our sales team, sales@edinst.com, who will be delighted to help.
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Product
Acoustic Microscope
AMI P300
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The FastLine P300 Acoustic Microscope is specifically designed for accelerated throughput, semiautomated screening of microelectronic devices on the manufacturing floor.
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Product
Scanning Probe Microscopes
SpectraView 2500
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* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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Product
Microscope Software
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Discover more with Olympus microscope software. With intuitive operations that offer a seamless workflow, Olympus microscope software supports your ever-evolving research needs.
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Product
Industrial Microscope for Materials Science & Industrial Applications
BX53M
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Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with OLYMPUS Stream software, the BX3M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.
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Product
Electronical Load Board 6U CompactPCI (air cooled)
056-169
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The 6U load boards are designed to simulate the power consumption of a single board computer and other boards on the backplane.
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Product
Acoustic Microscope
AMI D9650Z
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The D9650Z incorporates the latest C-SAM technology with enhanced features to accommodate the testing of Power Modules as well as performing standard C-SAM operations. This new system configuration is optimized for inspection of heatsink bond integrity, thickness of bond layer and wire bond welds. Powered by our Sonolytics software platform with PolyGate technology, the D9650Z is ideal for failure analysis, process development and QC screening in low-volume production environments.
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Product
Atomic Force Microscope
NX10
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Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
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Product
Electron Probe Microanalyzer
EPMA-1720
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Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
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Load Cell Electronics
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All our electronics are continuously evolving to feature faster and more powerful components. This commitment to innovation ensures that we can meet any new challenge or application.
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Digitize, Quantify, Collaborate With Your Unique Automated Petrographic Microscope
ZEISS Axioscan 7 for Geology
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Digitize your thin sections with Axioscan 7 – the reliable, reproducible way to create high quality, digitized petrography data in transmitted and reflected light. Uniquely designed for petrographic analysis, the Axioscan 7 Geo combines unique motorized polarization acquisition modes with unprecedented speed and a rich software ecosystem for visualization, analysis, and collaboration.
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Product
Older Style Reed Relays from Pickering Electronics
Reed Relay
The older style reed relay ranges have been manufactured for many years. Most are sold today as service replacementsproving Pickering's long term commitment to our reed relays and to our customers.
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Product
Electronic Load Mainframe GPIB
3300 Series
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A 4 Channels 1200W Mainframe which accepts up to four Load Module.
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Product
Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Product
Multiport Electronic Calibration Module (ECal), DC To 20, 6-ports
N7564A
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A series of multiport ECal that cascade-able up to 36-ports which makes it possible to calibrate a wide frequency range from DC up to 20 GHz without making numerous connections during calibration process. Ideal for multiport measurement application with VNA in such as high-volume PA/FEM, massive MIMO antenna or high-speed digital interconnect test applications
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Product
Electronic Tearing Strength Tester
DRK108B
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Shandong Drick Instruments Co., Ltd.
DRK108B Electronic Tearing Strength Tester is the special instrument for tearing strength test. In paper making industry, packaging industry, science and research industry and supervision and inspection industry, it is necessary.
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Product
Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
