Bias Test
-
Product
NI's Electrical Functional Test Solution
Functional Test
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
-
Product
High Power Switch and Bias Module
-
Macom Technology Solutions Holdings Inc.
MACOM’s High-Power Switch and Bias modules are extensively used in 4G and 5G TDD base stations as well as aerospace and defense applications. The PIN Diode Switch features high power handling, low insertion loss, and super board band performance. The integrated bias controller utilizes a boost circuit and provide the driver circuitry to the switch. The modules require only a single 5 V supply, and a single TX / RX control signal which greatly reduced the customer design complexity.
-
Product
DC Bias Injector
J2130A
-
When using the network analyzer to measure impedance, such as the capacitance and ESR or a capacitor, or the DCR of an inductor, etc., it is often necessary to provide a voltage bias to the device being tested. This is true of semiconductor junction capacitances, varactors, and some ceramic capacitors (especially X5R). In these cases the impedance is a function of the DC bias on the device. The Picotest DC bias injector (J2130A) is used for this purpose during impedance measurements.
-
Product
Automotive Ethernet Test Fixture
AE6941A
Test Fixture
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
-
Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
-
Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
-
Product
Low-Noise DC Bias
-
Imaging devices, such as CCDs, IR FPAs, and CMOS image sensors, require DC bias with very low electrical noise to prevent contamination of the image. Image quality can also be enhanced by carefully tuning each bias voltage to extract the maximum signal/noise ratio out of an array. Pulse Instruments has decades of experience providing DC bias supplies with the flexibility required tocharacterize and test a variety of devices while maintaining the noise immunity required for satellite and astronomy applications.
-
Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
-
Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
-
Product
Test Port Adapter Set, 2.4 Mm To 3.5 Mm
85130F
Test Port Adapter
The Keysight 85130F test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector designed for connecting to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. The set contains a 2.4 mm to PSC-3.5 mm male adapter and a 2.4 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 26 dB or better.
-
Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
-
Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
-
Product
ARINC 818 Tester
Test Platform
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
-
Product
Spring Clip Fixture
16092A
Test Fixture
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
-
Product
Millimeter Wave Zero Bias GaAs Schottky Diode
HSCH-9161
Diode Detector
The HSCH-9161 is suitable for medium-low barrier, zero bias detector applications. The HSCH-9161 is functional through W-band (110 GHz) and can be mounted in microstrip, finline, and coplanar circuits.
-
Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
HIGH FREQUENCY DC BIAS
6565 SERIES
-
The 6565 HF DC Bias Unit is intended to be used with a Wayne Kerr 6500 analyzer, either the 6500B Precision Impedance Analyzer or the 6500P HF LCR Meter. Its function is to provide a source of DC bias current through the Device Under Test (DUT) while the analyzer is making AC measurements. Each 6565 unit can provide up to 10 A of DC current, and up to six 6565 units can be connected in parallel to supply a maximum 60 A. A digital ammeter on the front panel allows the user to see the dc bias current value and an indicator LED shows when the bias current is enabled.
-
Product
DC Current Bias Supply
DC1000A
-
To guarantee the quality and performance of inductive components such as inductors, chokes and transformers they are tested at their real-life operating point. If the inductor is designed to carry a DC current, then its inductance must be measured with that DC current present. Until now, these measurements were made by an LCR meter connected via special interfacing to a DC bias supply available only from the manufacturer of the LCR meter. The unique NEW DC1000A can be used with any precision LCR meter and connects simply into existing test fixturing.
-
Product
FADEC/EEC Test Platform
Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
-
Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
-
Product
PXIe Optical Test Modules
Test Module
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
-
Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
Test Platform
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
-
Product
Dual Channel, Low-Noise DC Bias Card
PI-41701
-
The PI-41701 is a dual channel bipolar DC Bias supply that can provide an output current up to 100 mA per channel. The output voltage ranges from –8 V to +8 V and features programmable current limits with LED indicators and software interrupt to show/alert the user if the channel is in current limit. This card has special filter circuitry to reduce the output noise for those applications that require a low noise bias output.
-
Product
Functional Testing and Test Engineering
-
Customer-supplied or developed in-house• Ruggedization of existing (lab-built) fixtures• Co-develop hardware/software• Deployment, implementation, and training• Engineering evaluation tools• Design verification• Medical device evaluation• Manufacturing test systems• Verification test systems• Go/No-go tests• Serialization, recordkeeping, and datalogging• Troubleshooting failed units with other test platforms
-
Product
120 GHz Frequency Extender, Pulsed DC Bias
N5295AX02
Frequency Extender
The N5295AX02 is a compact and broadband frequency extender with built-in pulsed bias-tee and provides 10 MHz to 120 GHz single-sweep measurements with N5292A test set controller systemized with a PNA/PNA-X B vector network analyzer.
-
Product
Image Sensor Testing
IP750Ex-HD Family
Test System
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
-
Product
Bias T's
-
Centric RF offers Coaxial Bias T's so that a DC voltage can be applied to the rf signal path. These Bias Tee's (aka bias t) currently are offered with sma and 2.92mm connectors. Bias T's are implemented by attaching a broadband inductor to the circuit trace, with the power rating of the bias tee being determined by the size of the inductor.
-
Product
Zero Bias Schottky Detectors
-
KRYTAR Zero Bias Schottky Detectors are specifically designed for use in today's high-performance microwave instrumentation and systems. KRYTAR detectors are designed for such applications as power measurements, analyzing radar performance, leveling pulsed signal sources, AM noise measurements, system monitoring and pulsed RF measurements in ultra-broadband and mm-Wave applications.
-
Product
110 GHz Frequency Extender, Pulsed DC Bias
N5293AX02
Frequency Extender
The N5293AX02 is a compact and broadband frequency extender with built-in pulsed bias-tee and provides 10 MHz to 110 GHz single-sweep measurements with N5292A test set controller systemized with a PNA/PNA-X B vector network analyzer.
-
Product
DC Bias Current Power Supply
TH1775
-
Shenzhen Chuangxin Instruments Co., Ltd.
TH1775 is a DC Bias Current Source (or DC Magnetization Current Source) used for inductance measurement of inductors and transformer windings with DC bias current. Except for constant current output, low additional error and wide frequency response range are important for bias current inductance measurement. High frequency LCR meter could be used, when the frequency response range is wide enough. MPU controlled auto current balance technology is adopted to realize AC+DC current overlap and constant current output from 0 to ±20A. Two TH1775 can be paralleled to supply a maximum current up to 40A.TH1775 permits high frequency measurement up to 1 MHz and can be directly controlled by TH2816A, TH2817A, TH2818 and TH2819. TH1773/TH1775 with its low additional error, wide frequency response range and sweep output function is widely used in DC biased inductance measurement. TH1775 also provides a perfect solution for magnetic material analysis.
