X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Automated X-ray Inspection (AXI)
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Automated X-ray inspection (AXI) is a testing approach based on the same principles as automated optical inspection (AOI). Instead of cameras, X-rays are used to automatically inspect features.
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Multi-Sensor Core Logger
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The Geotek Multi-Sensor Core Logger (MSCL) systems enable a suite of geophysical measurements to be obtained rapidly, accurately and automatically on sediment or rock cores. The rugged nature of the equipment makes it suitable for use in either an onshore laboratory/repository environment or onboard survey and drilling vessels. All of Geotek’s core loggers accept core between 50 mm and 150 mm in diameter and up to 1.55 m in length. Geological cores and materials come in a variety of sizes therefore the MSCL and X-ray CT systems are designed for a full range of core material in a variety of liner compositions. To accommodate varying customers’ requirements (both operational and scientific), we provide a range of different core loggers and X-ray CT systems:
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X-Ray And Gamma Detector Systems
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The XR-100CR is a new high performance x-ray detector, preamplifier, and cooler system using a thermoelectrically cooled Si-PIN photodiode as an xray detector. Also mounted on the 2-stage cooler are the input FET and a novel feedback circuit. These components are kept at approximately -55 °C, and are monitored by an internal temperature sensor. The hermetic TO-8 package of the detector has a light tight, vacuum tight thin Beryllium window to enable soft xray detection. The XR-100T-CdTe represents a breakthrough in xray detector technology by providing “off-the-shelf” performance previously available only from expensive cryogenically cooled systems. The XR-100-CdTe is also suited for measuring gamma rays.
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Handheld XRF Analyzers
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XRF stands for X-ray fluorescence. It’s a powerful, nondestructive technique for measuring elemental composition from magnesium (Mg) to uranium (U), from parts per million to 100%. Handheld XRF analyzers are portable devices that can be used on location for immediate, lab-quality results to help you determine the next course of action and where it’s needed.
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High-Speed Video Camera
Hyper Vision HPV-X2
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Medical science and engineering have made dramatic progress thanks to visualization technology. Examples include the invention of microscopes capable of enlarged observations of phenomena occurring in the microscopic domain, invisible to the human eye, X-ray inspection systems, which enable the observation of images utilizing light at imperceptible wavelengths, and infrared cameras. Our eyes are incapable of capturing phenomena occurring at times shorter than 50 to 100 ms. As a result, high-speed video cameras have become necessary in order to record phenomena occurring at intervals that cannot be seen with the human eye, and then replay them at a slower rate so that they can be visualized. As the standard tool for visualizing ultra high-speed domains, the Hyper Vision high-speed video camera contributes to our understanding of ultra high-speed phenomena in a variety of fields.
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Fat Analysis
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Unlike standard x-ray systems which use a single x-ray energy spectrum to scan products, DEXA technology uses two energy spectrums to discriminate between high and low energy x-rays. A patented software algorithm uses the differential x-ray energy absorbance of these two energies by the meat to determine the fat content.
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Total Sulfur Process Analyzer
NEX XT
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Applied Rigaku Technologies, Inc
Featuring third-generation X-ray transmission technology, the NEX XT represents the next evolution of process gauge for sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.The Rigaku NEX XT system is faster, more sensitive and far more compact than competitive systems, and provides continuous, reliable detection of sulfur at pressures up to 1480 psig. Rigaku NEX XT can operate as a stand-alone analyzer or provide real-time closed-loop control when tied into a blending or plant-wide automation system. Among its other key features are a simplified user interface, reduced standards requirement, automatic density compensation, password protection, and standard platform for communicating sulfur and density to a plant-wide DCS. Due to its unique design and robust construction, sample conditioning and recovery systems are typically not required.
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XPS/ESCA Service
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X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Radiation Dose Testers
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Handheld Radiation Dose Tester with high sensitive GM counter sensor, combined Beta(β ), Gamma(γ), and X-ray radiation detection. It is widely used in home decoration, radiation processing enterprise, health and epidemic prevention, radiation therapy, import and export inspection, building materials, petrochemical, geological survey, scrap steel, industrial nondestructive testing and other environments existing ionizing radiation, personal radiation dose supervision and protection occasions.
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Precious Metal Analyzer
MIDEX
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SPECTRO Analytical Instruments GmbH
Small spot energy dispersive X-ray fluorescence (ED-XRF) spectrometer optimized for precious metal testing. Analyzing precious metals alloys, SPECTRO MIDEX provides high precision and accuracy for a wide range of concentration levels — plus record-setting testing times (as low as 15 seconds). For small jewelry items or drill cuttings from remelted samples, it analyzes a small spot (typically 1.2 mm). For silver samples, which may be relatively inhomogeneous, averaged results from an optional larger spot size maintain high-accuracy results.
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Microwave Moisture Meter
RX-95
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The system works based on the absorption of microwave energy by water molecules contained inthe x-rayed material. It is a non-contact, non-destructive method of instant measurement of water content - used for materials such as coal, flour, grain, cement, seeds, sugar, etc. Thanks to high measurement sensitivity (resolution greater than 0.01% of water content by weight), short measurement time (about 5 times/sec.) and repeatability of measurement - the system is suitable for continuous measurement of material moisture, e.g. on conveyor belts and its recording on a PC or using a 4-20 mA current loop.
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Electron Multiplication (EM) Standard Image Sensors
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EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Silicon Drift Detector
Octane Elite (SDD) Series
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The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
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Electron Probe Microanalyzer
EPMA-8050G
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This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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Constant Potential Generator Power Supply Mains
CP225D
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Supplemental to its outstanding penetration capacity (up to 47 mm for steel in just 10 minutes), the CP225D includes a built-in multiple X-Ray output carrousel that features a Beryllium window for the inspection of lighter alloys such as aluminum and carbon fiber. The CP225D is one of the most versatile generators on the market and will adapt to an extremely wide variety of applications. In fields as diverse as the construction or petrochemical industries, its power and small focal spot, light weight, compactness and high penetration capacity will be much appreciated.
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Multi-Channel X-Ray Fluorescence Spectrometer
FACTORY LAB MXF-2400
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Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
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XRD Diffractometers
Empyrean Range
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With the Empyrean, Malvern Panalytical has set the new standard in developing the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects.
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Non Destructive Analysis
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The submicron resolution of a submicron focus X-ray tube and digital image detection offers in 2D and Oblique View with High Magnification imaging mode high resolution X-ray images. A 3D image of the sample can be reconstructed from multiple image recordings during a 360° rotation of the sample. Virtual any cross section can be viewed at an offline workstation. This mode is a strong tool for multi-material components.
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X-ray Inspection System
JewelBox-90T/100T/110T™
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All JewelBoxes deliver precision x-ray images of ultra-high resolution and grey scale accuracy without the aberrations of voltage blooming and image distortion prevalent in other systems.
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Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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X-ray fluorescence spectrometers
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SPECTRO Analytical Instruments GmbH
SPECTRO is a world leader in the manufacture of energy dispersive X-ray fluorescence spectrometers. In recent years, SPECTRO has set standards by further developing X-ray fluorescence technology to create many new fields of operation for ED-XRF spectrometers.
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X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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WDXRF Wafer Analyzer
2830 ZT
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The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Industrial Computed Tomography
TomoScope® S
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In both design and construction, the measuring machine meets the legal requirements for a fully protective device according to x-ray device regulations. Additional safety features have been included over and above the legal requirements.
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Computed Tomography and CT Scanner
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When conventional x-ray images aren’t enough, a diagnosis for soft tissue conditions requires appropriate technology. Whether cross-sectional images are required or entire pictures of internal organs, CT exams and scanning are a vital part of a healthcare or imaging facility.
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Handheld/Mobile/Portable XRF Spectrometers
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Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Handheld ED-XRF Spectrometers
SPECTRO xSORT
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SPECTRO Analytical Instruments GmbH
The SPECTRO xSORT family of handheld ED-XRF spectrometers supplies elemental testing and spectrochemical analysis of myriad materials in widely varying conditions. These energy dispersive X-ray fluorescence devices are recognized for ruggedness and reliability on the job. They offer metals or nonmetals identification in seconds, with innovative technologies and designs that provide repeatable, laboratory-quality results. Simple, user-friendly displays and efficient ergonomics make these instruments extremely easy to use. At a range of affordable prices, SPECTRO xSORT spectrometers are leaders in their class for a broad spectrum of applications. - See more at: http://www.spectro.com/products/xrf-spectrometer/xsort-xrf-gun-handheld-analyzer#sthash.18piI4Px.dpuf
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Radiation Detectors
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High Purity Germanium (HPGe) DetectorsSilicon Charged Particle DetectorsScintillation DetectorsORTEC is a leading supplier of solid-state, high resolution, semiconductor radiation detectors. These radiation detectors are used in research, commercial industry, environmental protection, health and medical physics, as well as homeland security to detect gamma-rays, X-rays, and charged particles.
