X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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X Ray Flaw Detector
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A non-destructive testing (NDT) device used to inspect materials for internal flaws or defects such as cracks, voids, inclusions, and weld discontinuities.
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Ambient Metal Analyzer
AMMS-100 XRF
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The system integrates X-ray fluorescence for metal analysis up to 30 elements and a beta-ray attenuation model for particulate mass monitoring. But module will be using the same sample moving sequentially across the detector and would be significantly effective in industry emission tracing.
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Scientific CCD Image Sensors
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Our front and backside illuminated (BSI) and backthinned Charge Coupled Devices (CCDs) are seen as the gold standard for scientific and quantum imaging in applications in spectroscopy, microscopy, In vivo, x-ray and astronomy. We understand that every imaging application is unique and requires our engineers and scientists to work closely with our customers providing highly tailored imaging solutions.
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Digital Radiography Software
SHERLOCK NDT
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Sherlock NDT is the perfect link between Teledyne ICM best in class portable X-ray generator, the CPSERIES, and our high-resolution digital radiography detectors, the Go-Scan SERIES. Developed by and with NDT DR specialists, this intuitive and user-friendly touchscreen software produces high-quality images, allows real-time (video) acquisition, and comes with many different enhancement features.
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Radiation Detection
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Radiation detectors for safety quality assurance is top of mind for hospitals, nuclear power facilities, nuclear medicine laboratories, x-ray manufacturers, government agencies, state inspectors, emergency response and HAZMAT teams, and police and fire departments around the world. Fluke Biomedical offers a complete line of radiation detection, personal dosimeters, staff radiation dosimeter monitoring, and safety products and solutions that allow these professionals the versatility they need to get the job done and the quality they trust in a radiation-safety device.
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Beam Geometry & Alignment Testing
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Perform quality control testing of your Digital Radiography (DR), Computed Radiography (CR) and Fluoroscopy X-ray systems with ease. Comply with local, state, federal, and governing bodies for digital and traditional analog radiographic imaging technologies.
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Crystallographic Imaging Software
GrainMapper3D™
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The GrainMapper3D software provides non-destructive 3D crystallographic imaging through LabDCT™ on the ZEISS Xradia 520 Versa X-ray Microscope made for laboratory use.
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Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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Nano-focus X-ray Inspection System
X-eye NF120
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Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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X-ray Fluorescence Spectrometers
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Is a non-destructive analytical technique used to determine the elemental composition of materials.
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Industrial CT X-Ray Inspection System
X7000
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The X7000 is North Star Imaging’s largest standard system. The large scanning envelope and generous focal distance allow for unparalleled inspection capabilities of very large objects. The system is great for composites, castings, pipes, tubes, welds and similar parts.
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Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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Gasoline and Diesel Analyzer
NAX-100S
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Napco Precision Instruments Co
NAX-100S is the X-ray fluorescence spectrometer which is collaborative researched Sense and the University of Michigan in USA,TsingHua University in china and other spectrum experts, It is based on American high-end technology,has a design patent about the unique vacuum system ,special optics path system,designed for the detection of gasoline and diesel,has excellent stability about the ultra low content of elements analysis for petroleum chemical industry products.
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X-Ray Inspection
MXI Jade Plus
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Restrictions in manufacturing materials and ever increasing expectations for reliability mean ensuring quality product manufacture is more important than ever. Jade Plus enables you to Prove Your Quality and reduce product returns from the field, and the associated cost and damage to reputation.
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Handheld XRF Analysers
X-MET8000 range
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Hitachi High-Technologies Corp.
The X-MET8000 range of handheld X-ray fluorescence (HHXRF) analysers delivers the performance needed for rapid alloy grade identification and accurate chemistry of a wide variety of materials (solid and powder metals, polymers, wood, solutions, soil, ores, minerals etc). The X-MET is practical, rugged and easy to use to deliver results you can trust.
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Constant Potential Generator Power Supply Mains 10 to 200 kV
CP200D
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Being just 20 mm longer than the CP160D, the CP200D represents the best compromise between high penetration (up to 42 mm for steel) and the capacity of the generator to fit with various NDT applications, such as inspections of more technical materials in the aeronautical or space industries. The CP200D is one of the most versatile generators on the market and thanks to its built-in multiple X-Ray output carrousel it will adapt to a very wide variety of NDT applications, without compromising in any manner its light weight (12 kg) and ease of use.
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Handheld XRF Analyzer
Genius-XRF
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Zhengzhou Nanbei Instrument Equipment Co. Ltd
Based on the mature technology of desktop X-ray fluorescence analyzer and the latest technological development, and on the performance of the existing international commercial handheld X-ray fluorescence analyzer, adding new elements into it on the basis of the first, second, and third generation, Skyray Instrument has developed the intellectual portable fourth generational handheld analyzer-Genius XRF series, which can satisfy the market requirements and possess independent intellectual property rights.
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Portable XRF Spectrometers
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XRF (X-ray fluorescence) is an innovative, non-destructive technology for material analysis. It`s unique and almost universal, given you get a high-quality XRF gun (handheld XRF). An X-ray gun sees sample contents by using an X-ray source to measure the secondary ways (fluorescent) the sample emits. Such an analysis is clear and fast.
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Intelligent Detection Units
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Measurement of the ambient dose rate equivalent of continuous and average dose rate of pulsed X-ray and gamma radiation in an extremely wide range in harsh operating conditions.
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Non- Destructive Testing
NDT
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Non-destructive testing (NDT) is an application of industrial radiography that uses X-rays to reveal defects in manufactured products or structures. Fujifilm NDT systems share digital X-ray innovations with our Fuji Computed Radiography (FCR) imaging systems.
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Analysers
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Hand-held tester for checking the molybdenum content of stainless steels. Portable semi-quantative analyser for stainless steels, nickel-base alloys and monel. The MolyTester is most convenient for quick, non-destructive determination of alloys both in-shop and outdoor. Molytester is apllicable even for narrow weld seas where the local resolution of X-ray analysers is not fine enough.
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XPS/ESCA Service
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X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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X-ray and CT inspection System
UX20
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Due to the transformation to electric mobility, foundries are increasingly producing larger and more complex components. With its exceptional inspection envelope and the smart Geminy software, the UX20 facilitates fast and precise inspections of cast parts and helps increase overall production efficiency.
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Software
DIFFRAC.SUITE
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DIFFRAC.SUITE represents a new software platform offering a wide range of software modules for easy X-ray powder diffraction data acquisition and evaluation. Based on Microsoft's .NET technology, DIFFRAC.SUITE offers all the advantages of most modern software technology for maximum ease of use and networking.
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Diffractometers & Scattering Systems
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Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
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XRF Instruments
MasterXRF
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Pratt & Whitney Measurement Systems, Inc.
The MasterXRF® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry. It is the ideal instrument for industrial process control, improving product quality, and saving money.
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Detector Subsystem
Aurora CT
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Aurora CT is the industry’s first off-the-self detector subsystem for security CT applications. The plug-and-play-type solution includes ready-made, multislice detector boards, a control unit and a software library. Aurora CT speeds up time-to-market and decreases total costs of X-ray imaging systems that meet the most stringent security equipment standards in aviation.
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Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
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The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
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Micro-XRF Spectrometers
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Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
