Test Pattern Generators
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Product
PCIe 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 4 Channels, High Voltage Outputs
M2P.6576-X4
Arbitrary Waveform Generator
The M2p.65xx series offers different versions of arbitrary waveform generators for PCI Express with a maximum output rate of 125 MS/s. These boards allow to generate freely definable waveforms on several channels synchronously. With one of the synchronization options the setup of synchronous multi channel systems is possible as well as the combination of arbitrary waveform generator with digitizers of the M2p product family. The 512 MSample on-board memory can be used as arbitrary waveform storage or as a FIFO buffer continuously stream data via the PCIe interface. Importantly, the high-resolution 16-bit DACs deliver four times the resolution than AWGs using older 14-bit technology.
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Product
Alternate 3.20 (90.00) - 6.90 (196.00) General Purpose Probe
EPA-4J-1
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
Standard 0.39 (11.00) - 1.39 (39.00) Replaceable General Purpose Probe
MEP-30U
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 30Test Center (mm): 0.76Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 690Overall Length (mm): 17.53
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
Test Port Adapter
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
PXI-5406, 14/16-Bit, 20/40 MHz Arbitrary Function Generator
779657-01
Waveform Generator
40 MHz Bandwidth, 16-Bit PXI Waveform Generator—The PXI‑5406 is a 40 MHz function generator capable of generating standard functions including sine, square, triangle, and ramp as well as other signals like psuedorandom noise and DC signals. This function generator can generate signals from -5 V to +5 V and uses direct digital synthesis (DDS) to precisely generate waveforms.
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Product
Ultra High 6.70 (190.00) - 11.80 (335.00) General Purpose Probe
EPA-4E-2
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
Mixed Signal Battery Test System
Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
PXI-5412, 20 MHz Bandwidth, 1-Channel, 14-Bit PXI Waveform Generator
779176-02
Waveform Generator
20 MHz Bandwidth, 1-Channel, 14-Bit PXI Waveform Generator - The PXI‑5412 is a 20 MHz arbitrary waveform generator capable of generating user-defined, arbitrary waveforms and standard functions including sine, square, triangle, and ramp. This arbitrary waveform generator can generate signals from -6 V to +6 V and uses direct digital synthesis (DDS) to precisely generate waveforms.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
PXI Signal Generators (Signal Sources)
Vector Signal Generator
Accelerate test throughput with fast, high-quality measurements optimized for RF or microwave design validation & manufacturing testIncrease test configuration flexibility with a PXI platform and license key upgradesReduce development time with easy integration of drivers and programming examples into test environments
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Product
LXI High Voltage Switching - 20xSPST Plugin Module
65-233-703-HI
General Purpose Relay Module
The 65-233-703-HI plug-in module is part of a scalable high voltage switch platform that provides a high voltage switching solution with capability up to 7 kV. Switch arrays are created by populating the 65-200-002 scalable chassis with plug-in modules that provide access to the switches on 51-pin front panel connectors. Users can specify as many or as few plug-in modules as they require and can field upgrade the chassis to extend the number of switches.
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
Non-Replaceable General Purpose Probe - Epoxy Mount
MEPJ-22BD
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 125Test Center (mil): 20Test Center (mm): 0.51Full Travel (mil): 79Full Travel (mm): 2.01Recommended Travel (mil): 52Recommended Travel (mm): 1.33Mechanical Life (no of cyles): 50,000Overall Length (mil): 810Overall Length (mm): 20.60Rec. Mounting Hole Size (mil): 13.8Rec. Mounting Hole Size (mm): 0.35Rec. Mounting Hole Remark: 13.5 to 14mil / 0.34 to 0.36 mmRecommended Drill Size: #80 or 0.35 mm
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3B
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
PXI-5651, 3.3 GHz RF Signal Generator
779670-01
Signal Generator
3.3 GHz PXI RF Analog Signal Generator—The PXI‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Cup, Straight Shaft Concave, Alternate 0.78 (22.00) - 3.70 (105.00) General Purpose Probe
HPA-0G21-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
MXG X-Series RF Vector Signal Generator, 9 kHz to 6 GHz
N5182B
Vector Signal Generator
Take your designs to their limit with outstanding hardware performance, including unmatched phase noise & spurious characteristicsDrive power amplifiers & characterize nonlinear behavior with industry-leading ACPR & output powerTest wideband devices with factory-equalized 160 MHz RF bandwidthReduce the time spent on signal creation with Signal Studio software, including LTE, WLAN & GNSSLower your cost of ownership with 3-year cal cycles & comprehensive solutions for self-maintenance
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
EPA-5 General Purpose Probe
General Purpose Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,420Overall Length (mm): 36.07
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Product
Tabletop Single Site Test Handler
3111
Test Handler
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
Regenerative Battery Pack Test System
17040
Test System
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Product
TSC157 Solar Panel Probe
TSC157
General Purpose Probe
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 25Test Center (mil): 157Test Center (mm): 3.99Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,114Overall Length (mm): 28.30
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
PXIe Vector Signal Generator: 1 MHz to 3 GHz or 6 GHz
M9381A
Vector Signal Generator
Choose your RF modulation bandwidth, 40, 100, or 160 MHz, and easily upgrade as test needs change Increase throughput with fastest RF frequency tuning and amplitude switching for high-speed automated test Save space with a compact solution for up to 8x8 MIMO with phase coherence Get up and running quickly with validated application-specific reference solutions Simplify signal creation with Keysight's Signal Studio and Waveform Creator
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Product
HD Arbitrary Waveform Generator,8 Ch,350 MHz,16 bit,128Mpts/Ch,6 Vpp output,AFG/AWG, Wave Sequencing
T3AWG3358
Arbitrary Waveform Generator
HD Arbitrary Waveform Generator,8 Ch,350 MHz,16 bit,128Mpts/Ch,6 Vpp output,AFG/AWG, Wave Sequencing.
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Product
12GHz Four Channel Signal Generator
LS1294B
Signal Generator
The LS1294B is a 12GHz Four Channel RF Analog Signal Generator, offers industry leading performance, in an easy to use benchtop box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Product
Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74T75-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
Pulse Generator
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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Product
Function / Arbitrary Waveform Generators
Arbitrary Waveform Generator
Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
