Correlators
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Mid-Range Gas Filter Correlation CO2 Analyzer
Model T360M
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Teledyne Advanced Pollution Instrumentation
The Model T360M CO2 analyzer measures Carbon Dioxide by comparing infrared energy absorbed by a sample to that absorbed by a reference gas according to the Beer-Lambert law. Using a Gas Filter Correlation Wheel, a high-energy IR light source is alternately passed through a CO2 filled chamber and a chamber with no CO2 present. The light path then travels through the sample cell, which has a folded path of 1.28 meters.The energy loss through the sample cell is compared with the reference signal provided by the filter wheel to produce a signal proportional to concentration, with little effect from interfering gases within the sample. This design produces excellent zero and span stability and high signal to noise ratio, allowing excellent performance over a wide concentration range, making this instrument an ideal choice for CO2 reporting requirements associated with dilution CEMS.
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Product
Smart Factory Solutions
Smart4Metrics Factory 4.0
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Teradyne’s Smart4Metrics Factory4.0 solution closely integrates the TestStation in-circuit tester operating conditions, status and health data with existing data collection systems in the factory. By providing a single interface to convey both production data and production tester data, correlation of production results with other equipment or environmental conditions is easily integrated.
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Product
High Power LED Photo-color-semi Automatic Selector
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Shenzhen Chuangxin Instruments Co., Ltd.
Can divide LED in to several groups by chromatic coordinates, correlated color temperature, dominant wavelength or luminous flux.
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Product
Gas Filter Correlation CO2 Analyzer
Model N360
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Teledyne Advanced Pollution Instrumentation
The Model N360 measures carbon dioxide (CO2) by comparing infrared energy absorbed by a sample to that absorbed by a reference according to the Beer-Lambert law.The N360 uses Gas Filter Correlation (GFC) to overcome the interfering effects of various other gases (such as water vapor) that also absorb IR. The analyzer passes the IR beam through a spinning wheel made up of two separate chambers: one containing a high concentration of CO2 known as the reference, and the other containing a neutral gas known as the measure. The concentration of CO2 in the sample chamber is computed by taking the ratio of the instantaneous measure and reference values and then compensating the ratio for sample temperature and pressure. A nitrogen purge system is provided for the GFC wheel assembly to eliminate the effects of ambient CO2, if necessary.
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Product
Counterfeit Analysis / Screening Services
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DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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Product
Soil Mechanics
INSITU
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The INSITU program interprets statical and dynamical geotechnical in situ tests. In order to interpret the SPT tests, the program utilises the main correlations that are normally used to determine the geotechnical parameters of a soil. One should enter the geometrical and geotechnical parameters pertaining to the stratigraphy surveyed trough drilling and the number of blows relative to each test; some corrective parameters can be entered that enable one to limit the perturbations in the interpretation of the data caused by the way the test is performed and the type of instrument that is used.
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Product
ARINC 429 Test And Simulation PMC Module
PMC-429
PMC Module
*4, 8, 16 or 32 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*PXI interrupts, star trigger, and PXI clock*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Sorting according to SDI field*VXI Plug & Play driver including soft front panel*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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Product
PCI-6221, 16 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device
779418-01
Multifunction I/O
16 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device - The PCI-6221 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Product
PXI-6280, 16 AI (18-Bit, 625 kS/s), 24 DIO, PXI Hybrid, Multifunction I/O Module
779120-01
Multifunction I/O
16 AI (18-Bit, 625 kS/s), 24 DIO, PXI Multifunction I/O Module—The PXI‑6280 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
PCI-6284 , 32 AI (18-Bit, 625 kS/s), 48 DIO PCI Multifunction I/O Device
779110-01
Multifunction I/O
32 AI (18-Bit, 625 kS/s), 48 DIO PCI Multifunction I/O Device - The PCI‑6284 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Real-time and Direct Correlative Nanoscopy
LabRAM Soleil Nano
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Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
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Product
Mixed Signal Oscilloscopes
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The design, validation, and manufacturing of modern electronics necessitate the measurement of both analog and digital signals. Mixed signal oscilloscopes enable the simultaneous, time correlated observations and analysis of analog with digital (logic) signals, to establish causal relationships between the various areas of a device's electronics. They are purpose built tools for troubleshooting electrical anomalies, measuring parametric values, and monitoring cause and effect relationships between signals.
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Product
PXI-6251, 16 AI (16-Bit, 1.25 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module
779117-01
Multifunction I/O
The PXI-6251 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Carbon Compound Instruments
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Teledyne Advanced Pollution Instrumentation
Teledyne API's Carbon compound analyzers utilize Gas Filter Correlation combined with reliable NDIR (non-dispersed infrared) technology to produce very stable and accurate gas measurements. All T Series instruments offer two front-panel USB ports, an advanced touch screen full color display, customizable user interface with predictive maintenance alerts, one-touch real-time graphing, and multiple language support. All of our instruments are designed meet the rigorous demands of ambient air quality, stack, or industrial process gas monitoring.
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Product
Modulation Distortion Up To And Beyond 125 GHz
S930713B
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S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Resistance Temperature Detectors
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Sensors used to measure temperature by correlating the resistance of the RTD element with temperature.
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Product
NI-9435, ±5 VDC to ±250 VDC/10 VAC to 250 VAC, 4-Channel (Sinking/Sourcing Input), 3 ms C Series Digital Module
779010-01
Digital Module
±5 VDC to ±250 VDC/10 VAC to 250 VAC, 4-Channel (Sinking/Sourcing Input), 3 ms C Series Digital Module - The NI‑9435 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel accepts signals from ±5 VDC to ±250 VDC and 10 VAC to 250 VAC; features transient overvoltage protection between the input channels and earth ground; and has an LED that indicates the status. The NI‑9435 is a correlated digital module, so it can perform correlated operations, triggering, and synchronization when installed in a CompactDAQ chassis.
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Product
Spectroradiometer
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Spectroradiometer is usually used with a integrating sphere to measure the photometric and colorimetric parameters of all kinds of lamps. Relative spectral power distribution P(λ), chromaticity coordinate (x,y), (u,v), correlated color temperature Tc, color rendering index Ra, dominant wavelength, peak wavelength, spectral bandwidth, color purity, color ratio, SDCM, luminous flux, etc.
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Product
ENA-X Vector Network Analyzer
E5081A
Vector Network Analyzer
Our spectral correlation technique directly analyzes the modulated input and output signals in the frequency domain on the network analyzer. Current solutions on the market require a network and spectrum analyzer to characterize components fully. With the new ENA-X, you can ensure test accuracy and repeatability with a single test setup using full vector correction at the DUT plane. Avoid manually reconfiguring setups or automating complex switch-based systems — verify device performance faster and with less error potential with the ENA-X network analyzer.
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Product
Security intelligence & analytics
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Detect and prioritize threats that pose the greatest risk. dentify high-risk threats with near real-time correlation and behavioral anomaly detection. Detect vulnerabilities, manage risks and identify high-priority incidents among billions of data points.Gain full visibility into network, application and user activity.
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Product
Modulation Distortion Up To 125 GHz
S930712B
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S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Ex-Interface / Multiplexer
IXT0
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Intelligent Ex separation interface for Ex-safe connection of correlation sensors
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Product
Carbon Monoxide Analyzer(CO)
AQMS-400
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FPI AQMS-400 carbon monoxide (CO) analyzer measures ambient CO concentration by employing nondispersive infrared with gas filter correlation method technology.
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Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Product
Fibre Channel PXI Express Test & Simulation Instrument
PXIe-FC4
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Avionics Interface Technologies
3U PXIe form factor will fit into any PXIe or hybrid slot - Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speeds - Comprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Triggering and Filtering - Error Injection on any Header or Payload Parameter - Data Capture to on-board memory or disk file - Live Capture and Current Value Monitoring - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent Analyzer - Supports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Supports HS-1760E applications, including AS5653, AS5625, and AS5627fcXplorer Windows-based FC Simulator and Analyzer Test Software
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Product
Digital Image Correlation (DIC) Measurement System
EduDIC
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EduDIC is a complete Digital Image Correlation (DIC) measurement system, designed as a simple and convenient educational training tool for academic courses in experimental solid mechanics. This easy-to-use system allows academic instructors to effectively present the optical measurement technique of DIC for materials testing to the engineers and scientists of tomorrow.
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Product
PCI-6255, 80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO PCI Multifunction I/O Device
779546-01
Multifunction I/O
80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6255 offers analog I/O, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Modulation Distortion Up To 26.5 GHz
S930702B
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S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Modulation Distortion For E5081A Up To 20 GHz
S960704B
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The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
