Correlators
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Product
Single Shot Third-order Cross- Correlator
Rincon SS
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Specifically developed for measuring a wide array of output parameters from ultrafast laser systems including: contrast ratio of laser pulses, determining pulse pedestal, pre- and post-pulses, and amplified spontaneous emission in femtosecond systems.
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Product
Data Record Adaptor and Correlator
Joiner
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nTh Network Technologies to Help
Joiner is a data record adaptor and correlator for mobile and core networks management. The ideal partner for big data architectures with data lakes and analytic applications. Distributed as Docker component, it may be orchestrated in line with the network virtualization function concepts.
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Product
Fibre Channel PXI Express Test & Simulation Instrument
PXIe-FC4
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Avionics Interface Technologies
3U PXIe form factor will fit into any PXIe or hybrid slot - Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speeds - Comprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Triggering and Filtering - Error Injection on any Header or Payload Parameter - Data Capture to on-board memory or disk file - Live Capture and Current Value Monitoring - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent Analyzer - Supports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Supports HS-1760E applications, including AS5653, AS5625, and AS5627fcXplorer Windows-based FC Simulator and Analyzer Test Software
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Product
PXI-6289, 32 AI (18-Bit, 625 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module
779123-01
Multifunction I/O
32 AI (18-Bit, 625 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXI‑6289 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
ARINC 429 Test And Simulation PCIe Module
PCIe-C429
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*4, 8, 16 or 32 software programmable TX / RX channels*X4 lane PCI Express host interface*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*Sorting according to SDI field*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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Product
Dual Port Simulator Fiber Channel XMC Module
XMC-FC4 Simulyzer
Simulator
*Two independent fiber channel ports*The two SFPs accept electrical as well as optical transceivers*Each port supports 1, 2, or 4 Gbps*Supports customer-specific defined transmission speed*Comprehensive decoding of FC-1, FC-2 and Upper Layer Protocol (ULP) frames*Triggering and filtering*Supports DMA for high-speed streaming*IRIG-B time code encoder / decoder for data correlation*Supports ULPs such as FC-AE-ASM, FC-AE-RDMA, FC-AE-1553 and FC-AV*Supports HS-1760E applications such as AS5653, AS5652 and AS5627*Optional fcXplorer, Windows-based FC simulation and analysis test software*FC SDK (Software Development Kit) provides drivers and APIs for Windows XP / 7,*Linux, VxWorks, QNX Neutrino RTOS and others on request
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Product
Digital Image Correlation (DIC) Measurement System
EduDIC
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EduDIC is a complete Digital Image Correlation (DIC) measurement system, designed as a simple and convenient educational training tool for academic courses in experimental solid mechanics. This easy-to-use system allows academic instructors to effectively present the optical measurement technique of DIC for materials testing to the engineers and scientists of tomorrow.
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Product
Gas Gravitometers
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Gas gravitometers provide a simple, reliable method of measuring the specific gravity of a gas or analysis of the composition of the process gas when specific gravity can be correlated to composition.
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Product
Oil In Water/Soil Analyzer
InfraCal 2 ATR-SP
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The InfraCal Model ATR-SP is recommended for measuring oil in water, TPH in soil or FOG in wastewater concentration levels when using hexane, pentane or Vertrel MCA as the extracting solvent. Measurement data obtained with this analyzer will correlate to EPA Method 1664 as both procedures are based on evaporation techniques and measuring the residual oil and grease. The analyzer is equipped with a built-in cubic zirconia horizontal attenuated total reflection (HATR) stainless steel sample stage. The InfraCal 2 ATR-SP is a direct replacement for the original InfraCal HATR-T2 used worldwide for the determination of TOG/TPH in water and soil.
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Product
Counterfeit Analysis / Screening Services
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DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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Product
Active Monitoring or Synthetic Transactions
CloudReady
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Always-on, end-to-end user experience monitoringNo complex scripting required, Exoprise maintains the actions the sensors takeMonitors app performance via both Web UI and API transactionsFull network path performance information for correlation and outage detection
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Product
Custom Bench Test
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TestEdge provides customized bench test. If your device has specialized test requirements, it may be necessary to test your device using specialized bench equipment rather than traditional ATE. In other situations, both ATE and a custom bench setup may be required to fully characterize the device and provide necessary correlation. Finally, it may be useful to create a custom bench setup to facilitate device debug.
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Product
NI-9422, 24 V to 60 V, 8 Channel (Sinking/Sourcing Input), 250 µs C Series Digital Module
779522-01
Digital Module
24 V to 60 V, 8 Channel (Sinking/Sourcing Input), 250 µs C Series Digital Module - The NI‑9422 works with industrial logic levels and signals to directly connect to a wide array of industrial switches, transducers, and devices. Each channel accommodates 24 V to 60 V digital input signals. The NI‑9422 features channel‑to‑channel and channel‑to‑earth ground isolation for the highest level of safety for automotive and industrial environments The NI‑9422 is a correlated digital module, so it can perform correlated operations, triggering, and synchronization.
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Product
Motadata ServiceOps
Problem Management
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Motadata ServiceOps ITSM platform’s Problem Management solution manages the complete lifecycle of problems faced by different organizations and helps to diagnose and identify the root cause of incidents. The problem management system prevents problems and resulting incidents from happening, eliminates recurring incidents and minimizes the impact of incidents that cannot be prevented with incident management. With Motadata problem management tool, you can easily correlate incident tickets with a problem. The correlated incidents have a distinctive tag to highlight the relationship.
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Product
Fibre Channel Test & Simulation Interface for PCI Express
PCIe-FC4
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Avionics Interface Technologies
Half-size four lane PCIe board - Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speedsComprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Full Error Injection and Detection - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent Analyzer - Supports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Compatible with AIT’s fcXplorer GUI Bus Analyzer Software
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Product
DC - 400 MHz PC-Based Timer Interval Analyzer
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GuideTech’s GT658PCI is an ultra-fast, high resolution, DC – 400 MHz Time Interval Analyzer (TIA), ideal for most PC-based lab bench (timing) test applications. What makes the GT 658 superior to traditional counters is analogous to the difference between volt meters & digital scopes. While both measure voltage, the scope provides much more information about the dynamics of the signal. This is because our patented TIA substantially increases measurement speed, and the measurements are displayed as afunction of time. All of these features, along with the benefit of ‘continuous time correlation to a common reference between all measurement time stamps,’ enable our TIAs to make measurements that weren’t previously possible with traditional counters.
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Product
ARINC 429 Test And Simulation USB Module
USB-429
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*4, 8 or 16 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*Sorting according to SDI field*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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Product
Digital Image Correlation System for Complete 3D Warpage, Thermal Expansion, and Strain Analysis of Materials and Components in the Heating and Cooling Phase
Q-400 TCT
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The Q-400 TCT system is designed for complete three-dimensional and highly sensitive warpage, thermal expansion measurement and strain analysis of materials and components in the heating and cooling phase. Areas from 50 mm x 70 mm down to 2 mm x 3 mm can be investigated. Measurements can be done from room temperature up to 300°C and down to -40°C. The system is specially suited for thermal expansion measurement of electronic components and is frequently used in the development and testing of complex anisotropic materials, components, and structures in electronic applications.
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Product
Spectral Domain Signal Analyzer
Baudline
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Baudline is a time-frequency browser designed for scientific visualization of the spectral domain. Signal analysis is performed by Fourier, correlation, and raster transforms that create colorful spectrograms with vibrant detail. Conduct test and measurement experiments with the built in function generator, or play back audio files with a multitude of effects and filters. The baudline signal analyzer combines fast digital signal processing, versatile high speed displays, and continuous capture tools for hunting down and studying elusive signal characteristics.
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Product
Modulation Distortion Up To 26.5 GHz
S930702B
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S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
FFT Audio Spectrum Analyzer Plug-in
SPAN Plus
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Fast Fourier transform spectrum analyzer. Stereo, mid-side, surround spectrum analyzer. Stereo correlation meter. Multi-track spectrum comparison. PNG spectrum snapshot saving. K level meter. This plug-in is compatible with Windows (32 and 64-bit Windows XP, Vista, 7 and later versions) and Mac OS X (10.5 and later versions, 32-and 64-bit, Intel processor-based) computers.
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Product
PXI-6229, 32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module
779115-01
Multifunction I/O
32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXI‑6229 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
PCI-6280 , 16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device
779108-01
Multifunction I/O
16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6280 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Wafer ESD Tester lineup
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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Product
PCIe Gen3 High Speed, Compact Camera for Testing
CB013CG-LX-X8G3
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High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Product
NI-9411, ±5 V to 24 V, 6 Differential/Single-Ended Channels, 500 ns C Series Digital Module
779005-02
Digital Module
±5 V to 24 V, 6 Differential/Single-Ended Channels, 500 ns C Series Digital Module - The NI‑9411 works with industrial logic levels and signals for direct connection to a wide array of industrial switches, transducers, and devices. The NI‑9411 is a correlated digital module, so it can perform correlated measurements, triggering, and synchronization when installed in a CompactDAQ chassis.
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Product
Smart Factory Solutions
Smart4Metrics Factory 4.0
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Teradyne’s Smart4Metrics Factory4.0 solution closely integrates the TestStation in-circuit tester operating conditions, status and health data with existing data collection systems in the factory. By providing a single interface to convey both production data and production tester data, correlation of production results with other equipment or environmental conditions is easily integrated.
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Product
Fibre Channel Test & Simulation Interface for PCI
PCI-FC4
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Avionics Interface Technologies
Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speeds - Comprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Full Error Injection and Detection - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent AnalyzerSupports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Compatible with AIT’s fcXplorer GUI Bus Analyzer Software
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Product
PXI-6280, 16 AI (18-Bit, 625 kS/s), 24 DIO, PXI Hybrid, Multifunction I/O Module
779120-01
Multifunction I/O
16 AI (18-Bit, 625 kS/s), 24 DIO, PXI Multifunction I/O Module—The PXI‑6280 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
AFM Optical Platform
OmegaScope
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The OmegaScope is a state-of-the-art turn-key solution that combines Optics and ultra-resolution multi-range research AFM. The OmegaScope AFM is an advanced research instrument that provides path for researchers in spectroscopy and photonics. It is available in reflection configurations providing direct top and side optical access. The flexibility of the OmegaScope platform offer almost endless possibilities in correlation of high spatial resolution spectroscopies (Raman, Photoluminescence, Fluorescence) and AFM imaging modes.
