Mapping
See Also: Wafer Mapping, Survey
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Product
Pressure Mapping
NIP PRESSURE MEASUREMENT SYSTEM
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A completely wireless system for measuring nip pressure between rollers in real-time
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Product
Photoluminescence Mapping System
VS6845A
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Industrial Vision Technology Pte Ltd.
With its unique optical design technology, the System detects and classifies defects that affect yield and uses advanced photoluminescence (PL) technology to enable real-time monitoring of MOCVD production processes.
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Product
Pressure Mapping Sensors
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The pressure sensors listed below are available in a wide range of shapes, sizes, pressure ranges, and resolutions. Over 200 different pressure sensors are available. High Temperature pressure mapping sensors are also available in certain sensor models. Custom tactile pressure sensors and pressure ranges can also be created to meet your specific application requirements. Please note, the sensors listed in this catalog are matrix sensors designed to be used with one of Tekscan's pressure mapping systems. If you need single-point force sensors for testing, or custom force sensors for embedded/OEM applications, please refer to our FlexiForce™ products. For more application and industry details, see some of our key sensor application and industry solutions.
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Product
Pressure Mapping Technology
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Measure interface pressure between two surfaces, utilizing a thin and flexible sensor. The resulting data and our analysis tools offer insights to enhance product design, manufacturing, quality, and research.
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Product
Temperature Mapping Sensors
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Tekscan's thin-film temperature mapping sensors can track real-time temperature data changes between almost any two mating surfaces.
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Product
Wafer Mapping Sensor
M-DW1
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Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Product
Validation, Mapping and other Services for GxP Regulated Applications
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The individuality of your GxP application may require a variety of function-specific settings and measurement systems. Benefit from our know-how and let our application engineers design the optimal measuring system for you. With our consulting services in GxP, we support you from project planning (URS) to implementation and testing of your system. This ensures an optimal and efficient design.
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Product
Non-Contact Mapping Life Time System
MWR-2S-3
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The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Product
Azure Maps
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Create location-aware web and mobile applications using simple and secure geospatial services, APIs, and SDKs in Azure. Deliver seamless experiences based on geospatial data with built-in location intelligence from world-class mobility technology partners.
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Product
Gravity Meter
CG-6 Autograv™
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The CG-6 Autograv™ is the next generation land gravity meter combining a modern, intuitive user interface with our renowned quartz sensor technology housed in a rugged yet lightweight enclosure. The new CG-6 offers fast, reliable and precise gravity measurements and includes an array of mapping and post processing functionality with our new Lynx LG software conveniently installed on the tablet computer, provided as a standard feature.
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Product
IP and Port Monitoring Software
CallerIP
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IP and Port monitoring. See all incoming and outgoing connections made to your computer. Including process names, remote and internal port numbers and much more. Automated alerts bring your attention to illegal connections. Automated Alerting. Set up alerts to warn you of intruders and hack attempts. CallerIP can send an email, display a warning dialog and/or append a log file. CallerIP Server. CallerIP server allows you to view all incoming and outgoing connections to your computer from any browser in the world. CallerIP plots all connecting IP locations on a world map. IP origin shown on world map. All connecting IP address locations are shown on a world map.
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Product
Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
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SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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Product
Low Cost Emulator
EB-51X2
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* Emulates 8051 Derivatives with 6/12 Clocks/Cycle * 64K Code And 64K Data Memory * Memory With Mapping Capabilities * Real-Time Trace * Frequency Range up to 40MHz * Source-Level Debugger For C And Assembler * MS-Windows Debugger Software * Performance Analyzer * Emulation Header and Signal Testpoints * Serially Linked to IBM PC at 115Kbaud
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Product
Microprocessor Development System
DS-M8
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# Real-Time and Transparent In-Circuit Emulator# Supports PIC12xxx, PIC14xxx, PIC16xxx, PIC17xxx and others# Uses Microchip Bond-Out Technology# Maximum Frequency Support# Standard 64Kx16 Emulation Memory# 32Kx48 Real-time Trace with Filters and Triggers# 64K Hardware Breakpoints with External Signals# Memory Mapping Capabilities# Software for MS-Windows# Source-Level Debugger for C and Assembler
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Product
Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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Product
SAM Software
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PVA TePla Analytical Systems GmbH
The high performance of our systems derives not least from their interaction with our specially developed software. This enables the comprehensive and precise mapping and analysis of all SAM data software.
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Product
Metabolites Method Package Suite
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This suite allows comprehensive analysis of over 1900 metabolites without the need for investigation of separation conditions, MRM optimization or parameter settings. The range of metabolites spans both hydrophilic and hydrophobic compounds, including amino acids, short-chain fatty acids, sugars, nucleotides, bile acids, and lipids. The suite consists of five LC/MS/MS Method Packages including ready-to-use methods for the LCMS-8050/8060 series, the LC/MS/MS MRM Library for Phospholipid Profiling, the Smart Metabolites Database™ for GC/MS(GC/MS/MS), and a Multi-omics Analysis Package. The Multi-omics Analysis Package included in this product supports not only regular analysis but also large volume data analysis and interpretation. The Multi-omics Analysis Package includes metabolic pathways and other contour maps corresponding to the Method Packages. This makes it easy to visualize fluctuations in the quantitative values of metabolites across metabolic pathways. Data filtering functions and statistical analysis can be applied to the network of compound relationships, providing a total solution for metabolite analysis.
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Product
Altitude Simulation
MEDAS
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The MEDAS system is a compact altitude simulator that reproduces a wide range of environmental conditions. It allows for testing light- to heavy-duty vehicles, including Non-Road Mobile Machinery (NRMM). It is ideally suited for a range of testing applications, such as durability, RDE replication, emission tests and mapping as well as tests from component to vehicle level. The patented technology inside the MEDAS system allows dynamic changes on the simulated atmosphere with high accuracy. The system can also be moved between different test cells due to its compact design.
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Product
Spectroscopic Reflectometer
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– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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Product
Phased Array Corrosion Mapping Software
Concerto
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Concerto is a UT acquisition and analysis software specially designed for Phased Array corrosion mapping. For the tough field conditions that operators deal with Concerto features no menu, less than 18 icons, and few controls so that operators can easily work and not be bothered by complex GUIs. Concerto is simple and easy to work with yet WT, Surface, and back wall C-scan can still be analyzed and setting can be changed using the same acquired data.
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Product
Interface for the Multimode, multiprotocol Excalibur 8000 Family of Carrier Boards, Providing a Complete Solution for Developing & Testing MIL-STD-1760 Interfaces
M8K1760Px(S)
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The M8K1760Px(S) interface module for the multimode, multiprotocol, Excalibur 8000 family of carrier boards provide a complete solution for developing and testing MIL-STD-1760 interfaces and performing system simulation of the MIL-STD-1760 bus. The module handles all standard variations of the MIL-STD-1760 protocol.Each M8K1553Px-1760 multi function module contains 64K bytes of dual-port RAM for Data blocks, Control registers, and Look-up Tables. All Data blocks and Control registers are memory mapped, and may be accessed in real time. Each of the independent dual redundant M8K1760Px modules may be programmed to operate in one of three modes of operation: Remote Terminal, Bus Controller/Concurrent-RT, and Bus Monitor. In addition, modules 1 and 3 can be programmed to operate as Concurrent monitors, to modules 0 and 2 respectively.In addition, Checksum, SRQ bit and Header Words are supported on each channel, as well as, error injection (BC and RT modes) and error detection (all modes).Each M8K1760PxS single function module operates either as a Bus Controller, Remote Terminal, or Bus Monitor.The M8K1760Px(S) comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application
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Product
ETL Testing
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Data is of utmost importance in digital systems. Protecting data, therefore, is of utmost importance. ETL refers to Extract, Transform, and Load. It supports the movement of data from its source to storage. With ETL testing we ensure that the data is not lost or corrupted during this movement. Huge volumes of data are collected in various formats and sources. The mapping process of these data is error-prone and can have quality issues.
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Product
Automotive Test Lead Kit
143
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Test Lead Kit includes our basic set of interchangeable specialty test probes designed for automotive use. The flexible back probing pins are great for sliding into automotive connectors like those on fuel injectors and MAP sensors. The large Crocodile Clips are good for clipping to grounds and battery terminals. Roll up storage pouch keeps your leads organized.
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Product
Dynatrace Application Monitoring
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Start Dynatracing your applications in minutes with easy deployment and zero-configuration.Auto-discover and map all applications and transaction-flows in your distributed environment.Leverage self-learning baselines with alerts, out-of-the-box dashboards and auto-correlated system monitoring.Find problems before your users notice them with smart, early production error detection.Configure, manage and update easily with a centralized configuration consoleeven for thousands systems.Enable easy access for everyone who needs it. Provide one system valuable to all stakeholders by de-coupling system access and performance analysis.
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Product
Defect Isolation
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*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB
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Product
Semi-auto 4 Point Probe System for Solar Cell Substrate
RG-100PV
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*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
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Product
Acoustic Analysis
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Noise is increasingly the subject of new regulations for the protection of human health and safety as well as for improving the environment in general. As well as sound levels, the perceived sound quality of products from washing machines to vehicles is often an important part of the customer buying decision so must be considered during product development. m+p Analyzer for noise and vibration measurement and analysis provides a full range of capability for these applications. Real-time fractional octave filters satisfy all acoustic applications from simple sound pressure, sound power for equipment legislative requirements, intensity mapping to isolate sources to sound quality metrics for product refinement.
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Product
Pin-Mapping for Custom Connectors, Test Fixtures, UUTs | Cable & Harness Testers
PinMap™
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Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester.
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Product
Concrete Corrosion Mapping System
15620
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Our Concrete Corrosion Mapping System (CCMS) can be used to satisfy the ASTM C-876 standard test method and the kit contains all equipment items that are needed to perform a corrosion survey on virtually all types of reinforced concrete structures, such as bridges, highway slabs and parking garages.
