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Reflection/Transmission Spectrophotometry
FilmTek 3000 PAR-SE
Scientific Computing International
Engineered to meet the needs of any advanced thin film measurement application, excelling at material characterization on both transparent and non-transparent substrates. Combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
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Spectroradiometer
SpectraScan® PR-745
The SpectraScan® Spectroradiometer PR-745 is JADAK’s enhanced sensitivity portable solution for spectral based photometric and colorimetric light measurements, designed for applications requiring precise light measurements from a range of light sources, such as display monitors and projectors, reflective surfaces, and industrial applications (visual display testing, LED testing, film and video post-production, auto/aerospace displays, and dental color testing).
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ACCUplace BullsEye /Recognition Grid
AP-B Series
A unique concept in imaging calibration technology, The ACCUplace Bulls Eye / Recognition Grid allows the end user to calibrate magnification at multiple power levels, as well as test the system’s ability to recognize and locate distinctive shapes within shapes by focusing on the concentric circles.Each Bulls Eye / Recognition Grid target has individual patterns consisting of 5 concentric circles with 0.50mm line width and 0.50mm spacing between circles (10mm Pitch) with a 0.100mm center dot. In addition, each row and column is labeled with X & Y coordinates. The AP-B series is offered on four standard substrates; Chrome on Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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500 N Screw Flat Grips
500 N (110 lbf) screw flat grips are for use with low-capacity AGS-X series and EZ-X series load cells and come with flat grip faces. Similar to standard screw flat grips, these grips are versatile and are used for static tensile testing a wide range of materials, including rubbers, plastics, textiles, cloth, and paper, in film form.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Coating Thickness Meters
PCE Instruments' accurate, affordable coating thickness gauge, thickness meter, surface testing and film gauge devices are used for material testing, manufacturing quality control and automotive paint inspection applications. Choose from a variety of coating thickness gauge, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum.
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Coordinate Measuring Machines
FlatScope
Perfect for the measurement of larger 2D profiles (e.g.),films, circuit boards, laser cut and stamped parts large and smallMachine design with the image processing sensor under the glass plate, eliminates time-consuming focusing as the workpiece is always in the correct distance to the opticsIn raster scanning mode the machine also quickly captures the selected measurement range completelyAll geometric features are then evaluated automatically in the imageQuick dimensional measurements in the scanned image and automatic gaging with ToleranceFit® comparisons
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Coating Thickness Gauge
Shenzhen Linshang Technology Co., Ltd.
Linshang coating thickness gauge, also named dry film thickness gauge, which can identify the substrate automatically. It can be used in various fields such as coating thickness measurement, plating thickness measurement, fireproof and anticorrosive coating thickness measurement, etc. The dual-use coating thickness gauge such as LS220H, LS221, LS223 are suitable for ferrous and non-ferrous substrates, LS225+F500 is special for ferrous substrates and LS225+N1500 is special for non-ferrous substrates.
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Thick Film Passive Element
GBR-253
GBR-253 series high voltage resistors are made in a thick film technology on ceramic substrates (Al2O3 96%). These elements are used in high voltage applications requiring high stability and resistance.
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Vibrating Sample Magnetometer
VSM-P2H
This is low magnetic field type of exclusive use for soft thin film sample by the use of Helmholtz Coil.The type is capable of measuring variations of temperature from -50°C to 200°C by adding gas-flow type of temperature controller as an option.
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Phantom Surface/Web Metal Detector
Phantom Surface Web Metal Detection systems are designed to detect metallic fragments in wide, sheeted materials, continuous webs, and other thin products like textiles, paper, boards, food packaging, boxboard, poly films or products packaged on a roll/web.
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Coefficient Of Friction Testers
Saicheng coefficient of friction (COF) tester is specialized in measuring the static and kinetic coefficients of friction of plastic film and sheet, rubber, paper, cardboard, woven bag, fabric style, metal material composite belt for communication cable and optical cable, conveyor belt, wood, coating, brake pad, wiper, shoe material, tire and other materials when sliding.
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Basic Digital Systems
The Medical Imaging System can be configured simply by installing the FCR Reader, the CR Console, and the Imager to your existing X-ray equipment. The Imager uses the dry film for output and therefore does not require a dark room as in conventional systems thus saving space. Also, the scanned image can be digitally saved to media and not on films, thus not much storage space is required.
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In-Line Pinhole Detector
DZK
Shanghai Dean Electrical Co., Ltd
DZK portable Pin-hole Instrument is designed and produced in accordance with GB/ t4074.5-2008 standard, which can be used for the user of enameled wire to monitor the continuous performance of paint film in the process of production and use. It takes into account the detection function of the traditional high pressure paint film continuity tester and the advantage of being easy to move and replace, which facilitates the user's detection and use of various environments and multiple cables.
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Film Thickness Probe
FTPadv
The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness of transparent films. It extends the measureable thickness to 25 µm. Therefore the SE 500adv extends the capability of the standard laser ellipsometer SE 400adv especially for analyzing thicker films of dielectrics, organic materials, photoresists, silicon, and polysilicon.
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Film and Paper Thickness Gauges
Economical, Accurate, Easy-to-Operate, our line of off-line paper / film thickness gauges are manufactured to meet TAPPI specifications for paper or ASTM specifications for film.
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Thin Film Chip Resistors, High Voltage Type
Panasonic Industrial Devices Sales Company of America
Thin Film Chip Resistors, High Voltage Type by Panasonic
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Low Noise Amplifiers
RPG Low Noise Amplifiers are developed and manufactured using the most modern discrete components and thin film technologies, in order to cover the frequency range 50 to 350 GHz. With improved DC-supply and modern semiconductors these amplifiers not only deliver low noise performance but also broad operating bandwidth and gain flatness. These low-noise amplifiers are available as a standard product and on request as customized manufactured product.
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DUV-NIR Spectroscopic Reflectometry
FilmTek 2000
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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Hot Tack Tester
Guangzhou Biaoji Packaging Equipment Co., Ltd.
GBPI Hot Tack Tester To test the sticking strength of packaging films after heat sealed with different temperature, pressure and time. It simulates the use of packaging bag and makes impact experiment on the part of hot tack.
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Shore A Type Hardness Tester Rubber Hardness Tester
HS-A
Shenzhen Chuangxin Instruments Co., Ltd.
HS-A is a digital Shore A type hardness tester. It is suitable for plastic (such as film, medical appliance, etc.), synthetic rubber(such as seals, tires, rubber roller, rubber hose/belt, wire and cable, shock absorber, etc.) and other related chemical products.
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Microwave Dielectric Measurement Systems
This system enables fast and non-destructive measurements of materials having various shapes, including thin films. Enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials using the evanescent mode of an open coaxial resonator.
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Thickness Tester
CX-Series
The Thickness Tester - CX-1000 combines our patented capacitance sensor with industry-leading software to give you plastic film thickness profiling resolution to one micron. This gauge can be run as a stand-alone bench unit, or can be connected to a computer for RS-232 operation by our Thickness Tester - CX-1100 Quality Control Software. Capacitance measurement is industry-recognized as the best choice for off-line, high resolution, continuous gauge profiling for plastic films.
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Scatterometers / Thin Film Metrology Systems
OptiPrime Series
The n&k OptiPrime series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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Programmable Step Attenuator, DC to 26.5 GHz, 0 to 70 dB, 10 dB steps
84907K
The Keysight 84907K programmable step attenuator offers coaxial measurements to 26.5 GHz in a compact, rugged design. It offers repeatability of better than 0.03 dB, excellent life (greater than 5 million switching cycles per section) and an attenuation range of 0 to 70 dB in 10-dB steps. This latest design evolution sets new standards for size and performance. High attenuation accuracy and low SWR are achieved through the use of miniature thin-film attenuation cards composed of high-stability tantalum nitride film of saphire substrate. Insertion loss is outstanding, with less than 2 dB of loss at 26.5 GHz. The compact size of the unit, 35 percent smaller than the Keysight 8495/7 26.5 GHz) family, allows for easy integration into instruments and ATE systems.
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Piezo Sensors
TE Connectivity (TE) piezoelectric sensors provide durable vibration, accelerometer, or dynamic switch elements for a wide range of markets and applications. Piezo sensors and transducers are available in various forms including film, cable, and miniature elements in standard and customized packages.
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Color Proof Station
TU311
TESTEX Testing Equipment Systems Ltd.
Color Proof Station is designed especially for color comparison between objects and samples during the printing process. It adopts CPL asymmetrical color proof light tool and can illuminate two working surfaces, i.e. the vertical surface with the samples and the horizontal surface with objects. The drawer beneath the working table can house films, PS plate. It is equipped with rolling track, which enables it to slide under weight
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Thickness Meters
Choose from a variety of thickness meter, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum. Explore PCE Instruments' selection of accurate, affordable thickness meter, coating thickness gauge, surface testing and film gauge devices used for automotive paint inspection, material testing and manufacturing quality control applications.
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Reference Ellipsometer for Thin Film Measurements
UVISEL Plus
The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution. The possibility to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster.
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Trace Moisture Analyzer
Model 8800P
Teledyne Analytical Instruments
The 8800 series uses field proven aluminum oxide (Al2O3) sensing technology to accurately detect trace moisture on either a continuous or spot checking basis. All Al2O3 sensors share the same basic operating principle: the capacitance measured between the sensor’s aluminum core and gold film deposited on the oxide layer varies with the water content. The 8800 series moisture sensor employs unique Hyper Thin Film (HTF) technology, which offers three major structural improvements in Al2O3 sensor design. These structural changes, noted below, provide the user with increased sensitivity, greater stability and a quicker response time when compared to other conventional aluminum oxide sensors on the market today.
