Measuring Microscopes
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Product
Measuring & Monitoring Relays
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Fixed or adjustable threshold for low level or high level voltage or current monitoring.
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Product
USB Source Measure Units
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The U272xA is a 3-channel USB SMU that can operate in a 4-quadrant operation. It can function as a standalone module or used as a modular device, allowing expansion and compact solution when used with the other modules in the USB Modular Instruments and DAQ family.
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Measurement Hardware
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Whether it’s in a vehicle, on a test stand or monitoring equipment and machinery - imc data acquisition systems are easy to operate and will help you become more productive and profitable. Our products are suited for work in mechanical and mechatronic applications. They handle up to 100 kHz per channel, are compatible with almost all signal sources and sensors, and can measure nearly all physical quantities such as pressure, force, speed, vibration, noise, temperature, voltage and current. The spectrum of imc data acquisition systems ranges from simple data acquisition via integrated real-time calculations, to the integration of models and complete automation of test stands.
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Incremental Length Gauges For Measuring Stations And Multipoint Inspection Equipment
CERTO series
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*Interferential scanning principle*Very high system accuracy of down to ±0.03 µm*Well-matched ball-bearing guide for very high quality*Defined thermal behavior*Large measuring ranges of up to 60 mm*Interface: 11 µAPP
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Radar solution for width measurement of steel & metal
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The OndoSense radar sensor solution determines the width of steel plates, steel strips or steel slabs (up to 1600 °C hot) with an accuracy of up to ±300 µm. Thanks to robust radar technology, sophisticated signal processing and smart radar algorithms, our radar sensors offer this high precision in width measurement even in the extreme production environments of the metal and steel industry.
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Atomic Force Microscope
Flex-Mount
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Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
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Measurement Tool
LogicDAQ
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LogicDAQ is affording to sample the digital data on 32 channels. Maximum frequency of sampling while using all channels is 100MHz. Higher sampling frequencies are available after reducing the number of used channels, 200MHz for 16 channels The instrument is offering many trigger options - the triger can occur on the slope or specific combination of levels of digital signals.
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Non-contact Ultra-High Range Sheet Resistance Measurement System
CRN-100
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*Ultra-High range sheet resistance measurement for 10E+9 ~ 10E+15 ohm/sq without contacting*Mapping program software;*1. Arranged in a multipoint pattern measurement is programmed*2. 2-D & 3-D mapping software*Easy operation by Windows 7 system software*Measurement data base link with Excel via CSV format file*Unaffected by contact resistance
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Tactile Pressure and Force Measurement
I-Scan® System
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This versatile tactile pressure measurement system is tailor-made by choosing from over 200 pressure sensors to meet your specific application requirements.
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Product
WaferPro Express On-Wafer Measurement Program Software
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WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
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Instrument Systems LED And Display Measurement
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Konica Minolta Sensing Americas, Inc
Instrument Systems is a frontrunner in developing state-of-the-art light measurement equipment, software, and accessories, taking great pride in constructing products that provide fast, accurate readings to ensure precise data for laboratory, production and quality assurance testing. All Instrument Systems products have stringent quality and performance requirements to ensure that customers get the highest quality equipment. As a leading supplier world-wide, they provide cost-sensitive support to a diverse clientele to help them measure luminance, flux, intensity, illuminance, and chromaticity of LEDS, lamps and displays throughout all aspects of product development and production.
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Humidity Measurement & Monitoring Relative Humidity
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Relative humidity measurement in production, packaging, storage and transportation is vital to ensure product quality and is strictly regulated in the Food and Pharma industry.
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Inner Diameter Measurement Lasers
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the inside diameter is the maximum distance across the inside of an observed cylinder, the diameter of the space within the hollow cylindrical or spherical object.
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FIBER OPTIC MICROSCOPES
SpecVision
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SpecVision is a video probe that engages directly with Krell polishing machines. This permits the viewing of polished optical surfaces while connectors or bare fibers are still loaded in the polisher. This in-line video inspection technique minimizes material handling and potential damage/contamination that may occur when transferring components from the polisher to a traditional microscope. SpecVision can interface with Scepter, SpecPro and Rev Polishers.
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Visualize & Analyze Measurement Data Software
vSignalyzer
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vSignalyzer is a convenient tool for efficient evaluation and analysis of all types of measurement data. Its functional features range from extensive options for data visualization to manual andautomated analysis and reporting. The measurement data that is logged during network development, network analysis and ECU calibration may be read in from various file formats.
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Radiometer Spectral sensitivities precisely adapted to the measurement task
UVS-B-T
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Compared to the spectral response of the UVS-E, the UVS-B-T has a sharper cut-off at the transition from UV-B to UV-A. This feature reduces the UV-A contribution to the radiometer output and permits the highest possible correlation to atmospheric UV-B irradiance.
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Configurable System For Temperature Measurement With CAN FD Interface
MU thermocouple1 CAN FD
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With the MU-Thermocouple1 CAN FD, measurement data from thermocouples are recorded, pre-processed and transmitted with CAN FD. The temperature is measured via 8 connections, which are designed for the temperature measuring ranges J, K or T, depending on the product version. Temperatures can be recorded in Celsius, Fahrenheit or Kelvin and calculated with an individual factor and offset. The measurement data is then transmitted via CAN FD or via classic CAN.
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Data Logger For Humidity Measurement
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Prominent & Leading Manufacturer from Satara, we offer data logger for humidity measurement.
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4-Wire Resistance Measurement | Continuity & HiPot Cable & Wire Harness Testers
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An add-on option for the CableEye HVX high voltage cable tester series that permits expanded testing for contact and wire resistance as low as 1 mΩ. After checking for opens, shorts, miswires, and resistance limits, the 4-wire Kelvin measurement applies a user-selectable test current from 10 mA to 1 A to determine connection resistance within 1 mΩ. The resistance profile of a model cable may be stored and used as a basis of comparison during later testing to reveal cold solder joints, faulty crimps, recessed pins, pin contact contamination, improper wire gauge, and stress-extruded wire.This option may be purchased with any new HVX tester, or added as an upgrade to any of your existing HVX testers.
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Product
Measuring Wheel
B20-S
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Simple and light Measuring Wheel B20-s can measure up to 10,000m at 10cm graduation.The counter is indicated in 5 digits and has reset button. When we use Leak Noise Correlator LC-2500, we need to input the between pick-up sensors.
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Internally Ruggedized Phase Stable Test & Measurement Test Lead Assemblies
Storm-Test®
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- Engineered to provide precise measurements with stable electrical performance- Excellent loss, VSWR, & phase/amplitude stability with flexure. - Internally ruggedized cable construction delivers longer life, repetitive mating and prevents crushing, bending & twisting- Accurate & repeatable measurements - Performance tested prior to shipment
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Sheet Resistance Measurement
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The Filmetrics® R54-series and R50-series sheet resistance measurement instruments have been developed based on over 45 years of KLA sheet resistance measurement innovation. The R50 measures metal layer thickness, sheet resistance and sheet conductance. The R54-series adds a light-tight enclosure, along with 300mm support, to provide metal thickness measurement solutions for semiconductor and compound semiconductor manufacturing.
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Modular Platform for the Measurement
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Rovsing has devised a standard modular platform for the measurement, acquisition, simulation and commanding functionality of EGSE systems. This platform is called MASC (Measurement, Acquisition, Simulation and Commanding). At the heart of the platform is the RO-104001 Modular EGSE System Motherboard, a Powerful FPGA based motherboard accommodating 5 daughter board slots. The RO-104001 may be populated by a range of Rovsing daughter boards (MASC I/O boards) which implement the electrical specifics of a systems input / outputs.
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Semiconductor Device Parameter Analyzer and Measurement Modules
B1500A Series
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Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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Non-steady-state probe for thermal conductivity measurement
TP02
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Hukseflux Thermal Sensors B.V.
TP02 is a probe that offers the possibility to perform a practical and fast measurement of the thermal conductivity (or thermal resistivity) of the medium in which it is inserted at the highest accuracy level. It works in compliance with the ASTM D 5334-00, D 5930-97 and IEEE 442-1981 standards. The standard TP02 probe has proven suitability in soils, thermal backfill materials, sediments, foodstuff, powders, sludges, paints, glues and various other materials. The Non-Steady-State Probe (NSSP) measurement method (also known as transient line source, thermal needle, hot needle, heat pulse- and hot wire technique) has the fundamental advantages that it is fast and absolute while the sample size is not critical. Hukseflux is specialised in NSSP design. Special models have been developed for in-situ field experiments. For permanent installation in soils, a dedicated model, TP01, is available. TP02 has been designed and tested in collaboration with the Applied Physics Group of Wageningen University.
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Basic Pulsed-RF Measurements Lite For P50xxB Up To 20 GHz
S970240B
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Add pulsed-RF measurement capabilities to your P50xxB Streamline series vector network analyzer
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Glare Measurement System
GMS-1000
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Hangzhou Hopoo Optoelectronics Technology Co., Ltd
Glare is one of the main factors affecting the health of the light environment. At present, there are many different models for glare evaluation, and different evaluation models are used according to the specific lighting application environment. According to the glare evaluation model, glare evaluation needs to be based on a number of key physical parameters. In actual field measurement and analysis, due to the influence of many factors such as the environment, there are higher requirements for the performance of measuring instruments.
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Life-time Measurement System For Silicon Bulks/ingots By JIS Method
HF-100DCA
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*Global standard model for the lifetime test of silicon bulk*JIS direct current anodizing method*Data processing by digital oscilloscope and PC with software
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Thermal Microscope Stage For Petri Dish
TS-4SMP
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With our TS-4SMP Thermal Stage for Petri Dish, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C. The collar on the stage is designed to accommodate a 35mm 'Nunc' petri dish. The collar may also be removed for use with slides.
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Vibration Measurement Tools
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SKF Condition Monitoring Center
Abnormal vibrations are often the first indication of a potential machine failure. Conditions that can cause these vibrations include unbalance, misalignment, looseness of parts, deteriorating rolling element bearing and gear damage. Vibration analysis instruments and systems can help detect many serious problems at an early stage, allowing personnel to undertake remedial work in a timely manner.
