Measuring Microscopes
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Air Quality Measurement
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Air pollution measurement is the process of collecting and measuring the components of air pollution, notably gases and particulates. The earliest devices used to measure pollution include rain gauges, Ringelmann charts for measuring smoke, and simple soot and dust collectors known as deposit gauges.
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Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Code Complexity Measurement Tool
CMT Java
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The Code complexity measurement tool Testwell CMT++ (for C, C++ and C#) and Testwell CMTJava (for Java) saves costs and avoids software erosion. For this reasons several standards (like ISO 26262) require the enforcement of low code complexity.
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Roll Force Measurement
Millmate
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ABB’s Millmate roll force system is the perfect choice for measuring roll force in both hot rolling and cold rolling mills, thereby achieving correct roll gap settings and force distribution.The system is proven to be exceptionally robust and resilient to high forces as well as aggressive mill agents. The load cells are calibration free, can withstand overloads up to 7 times the nominal force, and have an impressive life length. The load cells come in different sizes from 0.1MN up to 60MN.
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3D Measuring Laser Microscope
LEXT OLS5000
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The OLS5000 laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that's four times faster than our previous model delivers a significant boost to productivity. Measure samples that are up to 210 mm tall. Capture the shape of any surface. Total magnification: 54x - 17,280x
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Two-Quadrant SMU For Battery Drain Analysis, 20 V
N6781A
Source Measure Unit
The Keysight N6781A is a source / measure unit (SMU) designed specifically for the task of battery drain analysis. Whether the device under test (DUT) is an eBook reader, MP3 player, mobile phone, or pacemaker, the N6781A’s seamless measurement ranging, programmable output resistance, and auxiliary DVM combine the best set of advanced features on the market for battery drain analysis. When used with the 14585A Control and Analysis software, the N6781A becomes an even more powerful battery drain analysis solution, offering additional insights into your measurements. Learn more about the 14585A Control and Analysis software.
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Inner Diameter Measurement Lasers
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the inside diameter is the maximum distance across the inside of an observed cylinder, the diameter of the space within the hollow cylindrical or spherical object.
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Contactless Lifetime Measurement and Inhomogenities Device
MWR-2S-3I
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Lifetime determination is based on measuring photoconductivity decay after pulse light photo-exciting with usage of reflected microwave as probe.Simultaneous IR light transmission gives possibility to detect any inhomogenity insidesilicon brick and made 3D image of defects.
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Catalytic Converter Measurement
OMCAT
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OMCAT catalytic converter measuring systems provide a fast and efficient means of carrying out complex geometrical measurements on exhaust catalytic converters and of determining the gap bulk density (GBD). OMCAT measuring systems feature innovative measurement functions combined with reliable technology. High measurement speed and accuracy and high availability due to their rugged construction are the major strengths of these systems which come to the fore in the harsh conditions which prevail in production environments.
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NanoModeScan M² Measuring System
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This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
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Product
Temperature Measurement System
TMM-100
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Thermal Engineering Associates, Inc.
The self contained TMM-100 module accepts diode, thermocouple and thermistor temperature sensors. The USB-connected instrument is supplied with Windows™ 7, 8 & 10 compatible software that provides for sensor measurement on a cyclic basis and for data logging of all measured values. LabVIEW™ Virtual Instrument (VI) drivers are available as an extra cost option for users that wish to incorporate the TMM-100 into an application-specific measurement environment.
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M² Measurement Systems
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Thorlabs' M2 Measurement Systems provide self-contained, turn-key solutions for measuring M2, divergence, focus diameter, waist position, Rayleigh length and other laser beam quality metrics. Pre-configured, factory-aligned systems covering wavelength ranges between 250 nm and 2700 nm are available. Choose from among systems that have a scanning-slit beam profiler, a camera beam profiler, or no beam profiler.
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Light Microscopes
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Compound light microscopes from Leica Microsystems meet the highest demands whatever the application – from routine laboratory work to the research of multi-dimensional dynamic processes in living cells.
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Contact Resistance Measurement System
CRMS
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The CRMS is a system designed to allow any user to measure the resistance of each set of relay contacts associated with the relay under test. The test system consists of a CONTACT RESISTANCE MEASUREMENT UNIT (CRMU), a MULTIPLE RELAY TEST RACK, as well as an interconnect CABLE ASSEMBLY. Either DC or AC energy to pick and drop relay coils under test for all contact measurements is supplied from the CRMU and easily interfaces with the Multiple Relay Test Rack. For additional and more thorough testing of relays an external relay tester can be interfaced to the Multiple Relay Test Rack to supply energy to the relay coil. It is recommended that the UTE Relay Tester With Timer/Counter (UTE Product # 15967-00) be utilized so the operator can take full advantage of the unique features it offers
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Measurement System
DPS
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EYCOM develops and manufactures highly accurate and dependablemeasurement systems for permittivity, dielectric loss tangent, or permeabilityby leveraging its accumulated experience and expertise over a long period of time.Capitalizing on such experience and expertise, KEYCOM is committed todeveloping customized solutions for wide range of specific applications such asflexible circuit board, semiconductor, thin film, millimeter wave and microwave frequency board,
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48-Channel High Performance Strain Gauge Measurement Instrument
EX1629
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48-Channel High Performance Strain Gauge Measurement InstrumentSupports quarter-bridge (120, 350Ω or user defined), half-bridge or full-bridge24-bit ADCs, sampling rates up to 25 kSa/sBuilt in programmable differential excitation -8V to 8VBuilt in selectable bridge completionConfigure signal conditioning excitation and bridge completion on a per channel basisSimple, low-cost wiring using RJ-45 telecom connectorsSupports TEDS for easy transducer detection and setupRJ-45 input connector reduces setup cost and timeBuilt in self-calibration and shunt calibrationSupports voltage, ratiometric and linear measurements other than strain measurements.
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Electrical Test & Measurement Products
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Electrical Test & Measuring Products, Including Clamp Meters, Voltage Testers, Multimeters & Test Kits
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Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Hall Effect Measurement system
HMS-5000
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Constant current source + Van der Pauw method terminal conversion system
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High Voltage Measuring System
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Our company is counted among the topmost manufacturers and exporters of High Voltage Measuring System. In strict accordance with industry standard parameters, this testing system is manufactured using excellent quality raw materials. Our range includes different technical specifications and models to satisfy clients' varied demands. We offer this High Voltage Measuring System to clients at economical price.
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Product
P104 LVDT/RVDT Measurement Board
73LD4
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NAI’s 73LD4 is a PC104-compliant LVDT/RVDT Measurement Board with six separate transformer-isolated channels. The channels can incorporate up to six programmable LVDT/RVDT-to-Digital Tracking Converters in a stack-through module. Each channel is programmable for 2-, 3-, or 4-wire inputs that automatically range between 2.0 volts and 28 volts, so there is no need to purchase multiple boards set for specific inputs. Operating frequency between 360 Hz and 10 kHz can be specified. Each channel also produces differential incremental encoder (A & B) outputs with programmable resolution and a zero-degree marker pulse.
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High Voltage Probes To Measure Primary Waveforms With A Power Analyzer
Volt Litewire
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The Litewire is a true RMS meter designed for use by electric utilities to sense currents or voltage waveforms from the primary side of their distribution networks.
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Automated Measurement Expert (AMX), VNA Plugin
S94702A
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The Keysight automated measurement expert (AMX) is a smart software solution for automated multiport S-parameter measurements with the PXIe vector network analyzers M937xA/M9485A or the benchtop E5080A ENA network analyzer. The S94702A AMX VNA plugin adds S-parameter measurement capabilities to the Keysight test automation platform (TAP). The combination of the TAP and the VNA plugin forms the AMX backend software, which makes the VNA setups and executes the test sequences in the PXIe controller according to the optimized test sequence files generated by the AMX test plan builder. Other instrument plugins allow you to control the DUT mode, expand the number of test ports with the PXI switches or multiport test set, and use external instruments such as a DC power supply and a digital multimeter. The AMX backend software also provides step-by-step calibration wizard for full multiport calibration using the 4-port ECal module.
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X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
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Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
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CMM (Coordinate Measuring Machine) Solutions
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A device that measures the geometry of physical objects by sensing discrete points on the surface of the object with a probe.
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Basic Pulsed-RF Measurements For VNA Up To 20 GHz
S970250B
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Add pulsed-RF measurement capabilities to your P50xxB Streamline series vector network analyzer
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Measurement System
BLS-I/BCT-400
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The BLS-I/BCT-400 measurement systems perform lifetime measurement on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation.
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Electrical Conductivity Measuring Instrument
SIGMASCOPE® SMP350
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Handheld instrument for electrical conductivity measurement of non-ferromagnetic metals. The electrical conductivity can be used for determining material properties, like hardness, strength, heat damage and material fatigue of metals. Rapid and simple on-the-spot conductivity measurement of non-ferromagnetic metals acc. to DIN EN 2004-1 and ASTM E 1004.
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Raman Microscopes
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Edinburgh Instruments has been providing high performance instrumentation in the Molecular Spectroscopy market for almost 50 years. Our Raman microscopes continue our commitment to offering the highest quality and sensitivity instruments. For further information on our Raman Microscopes, simply contact our sales team, sales@edinst.com, who will be delighted to help.
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Measuring Systems For Night Vision Systems
MTF Master IIT
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Optik Elektronik Gerätetechnik GmbH
Measuring system for MTF, SNR and EBI of Image Intensifier Tubes (IIT). The MTF MASTER IIT was specially developed to classify the quality of image intensifier tubes by the objective criteria of the MTF (Modulation Transfer Function).
