Open Area Test Sites
test objects to 30MHz to 3000 MHz frequency range.
See Also: OATS, Comb Generators
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Open Flanges Test Rig
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Flexible cell dimensions: cells of Ø 8 to Ø 80 mm (or square till 70x70 mm) can be successively installed Quick start of experiment: less than 20 minutes to remount a new cell with different dimension, thanks to the simple design without sealing Other SOFC components: the open flanges test rig is also useful for conductivity measurements (electrolyte, electrode material, interconnect etc.) and sealing tests End of broken cells and secure testing: the cell is squeezed by a soft alumina felt that prevents any damages, the excess fuel burns continuously in the alumina felt at the cell edges
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Product
Fixturing Kit
10744A
Test Fixture
The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
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Product
Non-Isolated Controller Area Network (CAN)
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ADI nonisolated controller area network (CAN) transceivers provide the differential physical layer interface between the data layer link, hardware protocol (for example, embedded in some of ADI's Blackfin® processors), and the physical wiring of the CAN bus. ADI's portfolio includes transceivers with integrated iCoupler® and isoPower® isolation, providing, fully isolated off-the-shelf CAN PHY's.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
6TL19 Off-Line Base Test Platform
H71001900
Test Platform
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Product
Protective Inspection Kit for Hazardous Areas
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The kit provides all the tools required for the on-site inspection of a coating, including surface profile, dewpoint, relative humidity, both wet and dry film thickness and also adhesive testing.Measurement parameters include:Surface inspectionSurface profileSurface contaminationClimatic conditionsCoating thicknessAdhesion
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Product
Open Frame Monitor
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Advantech Open Frame Monitor IDS-3100 series provides touch screen monitors with slim open front frame design and supports rear mount and VESA mount with integrated bracket design for easy installation.
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Product
Open Standard Module (OSM)
ROM-2620
Open Standard Module
Advantech ROM-2620 OSM 1.1 Computer-on-Module is powered by NXP i.MX 8ULP SoC which includes up to 2 Arm Cortex-A35 cores in combination with one Cortex-M33 real timeprocessor and Vivante GC7000 nanoULTRA/GC328 graphics engine. It provides USB2.0, Fast Ethernet, MIPI-CSI, I2C, SPI, GPIO, PWM and MIPI DSI display for embedded applications
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Product
Active Alignment Assembly & Test Platform
Test Platform
Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
Laser Contact Opening
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JRT Photovoltaics GmbH & Co. KG
On an industrial scale, laser technology plays a key role, as it enables low-cost production of high-quality solar cells. Jonas & Redmann develop and design laser systems for micro material processing – hereby ensuring an extremely cost-effective production process with high process efficiency.
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Product
Controller Area Network (CAN) Transceivers
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CAES CAN Transceivers are low power serial communications devices developed to handle the demands of harsh terrestrial and space environments.
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Product
Open eVision Studios
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Intuitive graphical user interface, allows you to call and immediately see the result of any eVision functionAble to generate C++, C# and Visual Basic codeIncludes Quick Start tutorials and a Getting Started guide
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Product
Area Monitors
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Provides real-time remote radiological monitoring. Local readout of hand-held meter allows for use as a portable survey instrument. More importantly, since the probe’s sensitive electronics are located far from the high field (25 to 350 feet away), they are not subject to destructive gamma exposure. The probe head may be placed directly into a filter compartment or against a resin tank or waste liner.
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Product
Crack Opening Displacement (COD) gauges
COD
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Instron® Crack Opening Displacement transducers are designed specifically to perform standard ASTM and ISO fracture mechanics tests (both cyclic and static), covering all common specimen geometries (CT, SEB, Centre Crack, Arc Shaped). Each model offers class leading linearity, whilst being rugged enough to withstand the high energy release common in many of these applications and can be used at both elevated and sub-ambient temperatures. These gauges comply with requirements laid down in ASTM E399-09.
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Product
6TL10 Table Top Test Base
H71001000
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Carrier - Virtex 7 W/FMC Site
VPF: 3U VPX
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The VPF is a VPX form factor (VITA 46), FPGA processor board designed to meet the needs of challenging, embedded high‐performance digital signal processing applications at a competitive price point. AMD Virtex 7: VX330 and VX690 population options are available. The Virtex 7 FPGA provides impressive processing capabilities and supports operations such as: FFTs, FIR filters, fixed‐point and repetitive processing tasks. The VPF FPGA node processes input from the FMC HPC (Vita 57.1) site, allowing for maximum application configurability and performance when coupled with DEG’s market leading ADC and DAC FMC modules (250MSPS to 4.0GSPS). The VPF is fully compliant with the OpenVPX standard and accommodates the PCIExpress Gen 3.0 communication protocol. Delphi also offers a VPF FPGA Design kit which allows customers to leverage and modify DEG source code, develop within an open architecture, and rapidly integrate FPGA HDL. The DEG FPGA Design kit includes: Source code, simulation test bench and utilities to support custom algorithm development. Embedded Linux, VX Works and Windows software drivers are available. HPC FMC Site, Fully Compatible with all Delphi ADC and DAC FMC Modules.
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Product
Wide Area Thrubeam Laser Sensor
LV-H300/100
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Wide Area Thrubeam Laser Sensor. World's smallest size. Linear area beam (Transmitter). Light diffusion sheet (Receiver). Easy adjustment of beam axis
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Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
Second-Grade Service Area Externally Modulated Optical Transmitter
HT8500A
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Hangzhou Huatai Optic Tech. Co., Ltd.
How to select 1550nm optical transmitter for second-grade service area is always a difficulty. Take technical feature and long-term development of the network into consideration, we should select 1550nm Externally Modulated optical transmitter, however, such transmitter with reasonable price which can be suitable for Second-grade service area is unavailable in the current market. Considering the traditional cost, 1550nm Internal Modulated optical transmitter will be selected to have a test.
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Product
Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
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According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Product
Pulse AC Method Area Ionizers
ER-X Series
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Panasonic Industrial Devices Sales Company of America
The ER-X Series Area Ionizers utilize the pulse AC ionization design to achieve high-speed charge removal of wide surface areas for high-volume production lines. In addition to supporting compressed air ionization, the ER-X also features both airless and low-pressure ionization modes for applications where tiny workpieces can be easily blown away. Additional features include automatic ion balance and discharge frequency control (manual control is also possible), flat discharge surface for easy cleaning, discharge needle air barrier design to reduce contamination of the needles, replaceable discharge needle unit for easy maintenance, and a dual head configuration for enhanced charge area and layout (2 different ionizer heads can be connected to a single controller).
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Tri-Temp Octal Sites Handler
3160-C
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Chroma 3160-C is a productive pick & place system for high volume multi-site IC testing.
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
VR/AR/MR Calibration Platform
Test Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Product
Open Path Gas Detector
Senscient ELDS
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The Senscient ELDS laser-based open path gas detector is available for a wide range of toxic and flammable gases.
