X-ray Inspection Systems
See Also: Inspection Systems, Automated Fiber Optical inspection Systems
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Product
X-Ray Seamless Pixel Array Detector
XSPA-400 ER
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In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
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Product
Arc System
ACQUITY
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The ACQUITY Arc System is a quaternary-based, modern LC system for scientists working with established methods who are looking for the versatility and robustness required to bridge the gap between HPLC and UHPLC while continuing to support validated assays.
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Product
Bolometer Systems
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The detector comes with an IR light collecting cone assembly, vacuum-sealed wedged window, field of view baffling, and low noise electronics. The bolometer system is then outfitted with a single cut-on IR filter or a cold, manually operated, 2 or 3 position filter wheel. We offer a selection of far IR cut-on long pass filters that range from 10 to 285µm.
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Product
Automated Surface Inspection for Glossy Components
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Flawlessly glossy surfaces are among the most important quality features of many premium products. The smallest surface defects immediately have a degrading effect on the product. The result: disappointed end customers or buyers. At the same time, reflective surfaces are often very sensitive and a challenge for optical metrology. A manual inspection is tedious, expensive, and ultimately always governed by subjective decision criteria. During production, faulty painting or coating processes can cause high scrap rates. Defects that are not detected even during the final inspection can lead to expensive complaints and, in the worst case, to the loss of the customer. Only an efficient, automated surface inspection achieves the highest quality at acceptable costs.
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Product
Probe Systems
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We offer a complete line of premium performance analytical probe stations for precise device test and measurement directly on wafer.
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Product
Verification And Print Quality Inspection Solutions
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Integrate quality barcode verifiers within your production line using our robust barcode verification technology.
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Product
Energy Dispersive X-ray Fluorescence Spectrometer
EDX-LE
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EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
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Product
High Precision Angular Positioning, Calibration and Geometry Inspection
LabStandard DUO
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Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.2 axis design for rotary tilting applications with self-locking worm gearing and a high accuracy angular encoder ensures sensitivity and fine positioning for metrology and precision testing.
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Product
Wafer Inspection System
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JRT Photovoltaics GmbH & Co. KG
In close cooperation with well-known providers of inspection systems, we provide modular systems for quality control and classification of raw wafers.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Exposure Systems
Model 2012AF & 2012SM
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The Model 2012AF Flood Exposure System provides a cost-effective method for automated flood exposure. Designed to accommodate wafers from 8” to 300mm, the tool features automated FOUP loading. Mask and substrate changeover can be accomplished quickly and easily adding to both versatility and high-volume throughput of this production tool.The Model 2012SM Automated Edge-bead Exposure System provides a cost-effective method for edge-bead removal using standard shadow mask technology. Designed to accommodate wafers from 8” to 300mm, the tool features automated FOUP loading. Mask and substrate changeover can be accomplished quickly and easily adding to both versatility and high-volume throughput of this production tool.
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Product
Automatic Flight Inspection System
AT-930DG
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Fully Automatic OperationAll-Weather CapabilityDifferential GPS Position ReferenceHigh Accuracy and Maximum ReliabilityWindows User Interface SoftwareEasy to Operate and Easy to LearnMinimum Maintenance RequirementsModular System ArchitectureLong-Term Supportability
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Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
Magnetic Particle Inspection Systems for Non-Destructive Testing (NDT)
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VERIFY SURFACE AND SUBSURFACE STRUCTURAL INTEGRITY IN: Industrial Crankshafts, Ferrous Parts, Aircraft Components, Landing Gear Components.
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Product
Non-Destructive Inspection Equipment
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Non-destructive inspection means that various materials such as metal are "without damaging the object, knowing the presence or absence of scratches on the surface or inside and the degree of scratches, and passing the object against standards such as standards.
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Product
High-speed 3D Solder Inspection Machine
YSi-SP
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a high-speed 3D solder paste inspection machine that enables high-speed high-accuracy inspections based on our “1-head solution” concept for using a single type of head to handle various inspections. It is used to inspect the printing quality (volume, height, area, misalignment) of solder paste after it has been printed onto PCBs. Available April '18.
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Product
NVIDIA Systems
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NextComputing’s Data Science Workstations featuring NVIDIA GPUs from PNY dramatically accelerate data analytics time to insights, enabling breakthrough data preparation, model development and training performance. These powerful workstations can aid in the advancement of medicine and research enabling scientists to tackle interoperable data development of AI-based intelligent applications unique to their workflows and accelerate areas like image analysis, scientific research, and drug discovery.
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Product
Dynamic X-Ray Detector
Shad-o-Box HS
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The Shad-o-Box HS family of x-ray detectors are high-performance, high-resolution x-ray imaging devices designed for high speed digital radiography applications. Each model combines our x-ray sensor modules with appropriate readout electronics and a 14-bit digital interface for easy connection to a PC. The high-speed digital connection allows real-time imaging at frame rates up to 66 fps, while the state-of-the-art CMOS technology offers superb contrast, dynamic range, and resolution.
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Product
Enhanced Vision Systems for Aviation
System
Astronics offers the world’s most widely deployed enhanced vision systems for airframe OEMs and general aviation pilots. Used in search and rescue, firefighting, police, construction, and other critical missions, our EVS units are improving visibility and safety every day on fixed-wing and rotorcraft worldwide.
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Product
Monitoring System
A112
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The photoelectric sensor model A112 allows to realize a system for detecting breaks of thin wires from 10 um in diameter, with a detection range greater than 50 cm.The A112 produces these results without the use of laser technology, allowing high immunity to vibration and a secure alignment between receiver and transmitter.
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Product
Gauging System
Equator™ 300
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Advanced Industrial Measurement Systems
The Equator is a flexible gauge that is designed to provide speed, repeatability and ease of use for manual or automated applications. The Equator is a highly valuable option for manufacturers who are looking to replace their current gauging method. Its system enables process control by delivering highly repeatable, thermally insensitive, versatile, and re-programmable gauging to the shop floor.
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Product
Inspect a Large Range of Part Geometries
ECHOMAC® PA Composite Tester
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ensures complete inspection of the part. The system is scalable, allowing the flexibility of adding channels as needed to handle a large range of part geometries. Meets or exceeds USA, European and other international specifications in aerospace and automotive industries. MAC can supply mechanics designed to meet customer requirements ranging from inline bubbler systems to stand alone immersion tanks with part placement.
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Product
Terahertz Systems
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Terahertz waves are electromagnetic waves in the frequency band between radio waves and light waves. It combines the transmissivity of radio waves and the straightness of light waves and provides fingerprint spectra based on intermolecular interactions from small molecules to high polymers. By utilizing of this characteristic for spectroscopic and imaging measurements, it is possible to apply them to nondestructive analysis that has never been done before.
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Product
System Integration
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The most powerful of these is the flagship SC5100 System Controller that provides integration throughout the stationary industrial scanner portfolio of DS/DX laser readers, AV imagers, DM dimensioners.
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Product
Test System
Series 201
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The 201.net is fully programmable to electrically test and ensure the integrity of discrete semiconductor devices. The system is modular in design with each stimulus module individually addressable for specific test requirements.
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Product
Power Systems
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Astronics serves global customers as the aircraft industry’s electrical power experts, offering a breadth of power and motion solutions for commercial transport, business, VIP, rotorcraft, military aircraft, and other airborne platforms. Whatever your program, you’ll find a proven, certified solution with Astronics.
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Product
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
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Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
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Product
Automated Optical Inspection (AOI)
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Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method.
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Product
Furnace and Electrical Inspection Camera
FLIR GF309
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The FLIR GF309 is designed for high temperature industrial furnace applications. These infrared cameras are ideal for monitoring all types of furnaces, heaters, and boilers, particularly in the chemical, petrochemical, and utility industries. Custom-built to see through flames, the FLIR GF309 also features a detachable heat shield designed to reflect heat away from the camera and camera operator, providing increased protection.
