X-ray Inspection Systems
See Also: Inspection Systems, Automated Fiber Optical inspection Systems
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Product
Digital X-ray Detector
Aurora
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Aurora is a product family of digital X-ray detector solutions powering all security and a variety of industrial line-scanners. The product family consists of a wide range of stand-alone detectors, and all needed building blocks, like ready-made detector boards, modules and readout electronics, for end-to-end systems. Aurora provides superior image quality and a fully digitalized data path in the most robust, modular and easily scalable platform. It is a plug-and-play type solution speeding up time-to-market and delivering total cost savings.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Pinhole Detection Inspection Kit
Elcometer 270
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The Elcometer 270 Pinhole Detectors Inspection Kit utilises the wet sponge technique and has been designed to set a new standard for wet sponge detectors - a high quality, low voltage detector with similar accessories to a high voltage spark tester.
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Product
Inspection Cameras
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Inspection Camera systems by Vivax-Metrotech - applications including municipal collection systems, residential plumbing, indoor commercial lines, lateral lines, and indoor drain lines.
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Product
Automated Optical Inspection (AOI)
TR7700 SIII 3D
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TRI’s ground breaking 3D AOI solution delivers the fastest hybrid PCB inspection combining optical and blue-laser-based true 3D profile measurement for the highest automated defect symptom coverage possible. Integrated state-of-the-art software solution and third generation intelligent hardware platform offer stable and robust 3D solder and component defect inspection and with high inspection coverage and easy programming.
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Product
Digital Ultrasonic Inspection, Information, storage, and retrieval system
ULTRAPROBE® 3000
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he Ultraprobe 3000 is a digital ultrasonic inspection, information, storage, and retrieval system that comfortably fits in the palm of your hand.
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Product
Portable gear inspection- and 3D-measuring systems
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ultimate independent measurement - on the production machine or on the shop-floor without rotary table
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Product
X-ray Microscopy
Xradia Family
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✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
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Product
Integrated NDT Inspection Device
FlawHunter
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The FlawHunter is an integrated NDT inspection device, equipped with an advanced, high-resolution Laser Shearography sensor with a vacuum (partial) excitation system. It is ergonomic & easy-to-use and is equipped with a workflow-oriented, GUI-display and left/right-hand button control. Regardless of the application, the FlawHunter provides reliable and resolute measurement results for in-field (service) NDT and quality control (post-production) operations.It can be used on any material & surface provided a stable vacuum can be generated within the vacuum seal (viewable inspection area).
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Product
Semiconductor Package Inspection System
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NIDEC-READ GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA).
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Product
Surface Defect Inspection System
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Wafer for inspection of surface condition of specular flat substrate, glass substrate, others φ 100 ~ φ 300 compatible
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Product
Dual Illumination Inspection Scope
0700-7950
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KITCO Fiber Optics introduces our new 200X dual illumination inspection scope.
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Product
Waterproof Inspection Cameras
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waterproof inspection cameras have waterproof probes, General's DCS6XX wet/dry cameras, the DCS600A, DCS605, DCS660A, DCS665 & the DCS665-ART, go one step further because their grips and monitors are also waterproof. This feature, unique in the industry, allows users to inspect toilets and water and sewer lines carrying running water without worrying about dropping and "dunking" the instrument.
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Product
PCB Assembly Inspection
a3Di
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a3Di is a revolutionary new technology designed to provide accurate, repeatable and fast PCB inspection. The cost saving potential to your business is significant, reducing your overall product inspection costs, increasing your product throughput rates and reducing customer returns.
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Product
Energy Dispersive X-ray Fluorescence Analyzer
X-5000
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HORIBA continues it's innovation in the petroleum market by proudly teaming with Olympus Innov-X to promote the X-5000 Mobile XRF Analyzer. The X-5000 is a rugged, fully integrated closed beam portable EDXRF system that offers the power and performance of a traditional benchtop XRF, but is designed for transportable operation.
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Product
Vision Inspection Products
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Vision inspection systems use a series of high-speed cameras and imaging software to detect and measure random objects as they move along a conveyor belt. Custom software and measurement algorithms can determine the size, shape, color or composite measurement of any object and convert this into standard units for quality control. Bench, over-line, and in-line systems are available and provide real-time 100% inspection and rejection of any production line.
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Product
Ground Resistance Inspection Box
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AllWin Instrument Science and Technology Co., Ltd.
Check the ground resistance tester each time prior to start work everyday morning and do some relevant records.
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Product
X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
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Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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Product
Substrate Inspection Apparatus
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The test system of the printed circuit board (mounting board) called the flying probe tester developed ahead of the world received high evaluation at the electronics manufacturing factory around the world, securing the top share of the industry and "Takaya of the board tester" We have established a firm position that.
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Product
Automated Optical Inspection
K Series3D
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K Series and K Series3D are the reference in Automated Optical Inspection (AOI), allowing 2D and 3D inspection with very low false calls rate, for both pre-reflow and post-reflow. They are the most powerful gatekeepers to guarantee high quality level for the assembled PCB.
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Product
X-ray Inspection Performance
MXI Quadra 7
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Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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Product
Energy Dispersive X-ray Fluorescence Spectrometer
Pharmaceutical Elemental Impurities Analysis System
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Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
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Product
X-ray fluorescence spectrometers
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SPECTRO Analytical Instruments GmbH
SPECTRO is a world leader in the manufacture of energy dispersive X-ray fluorescence spectrometers. In recent years, SPECTRO has set standards by further developing X-ray fluorescence technology to create many new fields of operation for ED-XRF spectrometers.
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Product
X-Ray Detectors
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Sydor Technologies is committed to innovating x-ray detector technology—as we have done for over a decade—developing complex measurement solutions and commercializing emerging technologies for world-class laboratories. We’re committed to innovating cutting-edge technology to improve the accuracy, resolution, and ultrafast speeds of x-ray detectors to enable complex measurements.
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Product
Ultrasound Inspection
ULTRAPROBE 10,000
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The Ultraprobe 10,000 brings Ultrasound Inspection technology to a whole new level. With this one system, inspectors can perform condition analysis, record sounds, store and manage data.
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Product
Simple 3D Measurement & Inspection
XG-X Series Vision System
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Abundant processing power is available even with multiple camera connections, including the 21 megapixel color camera, line scan cameras, or 3D cameras. XG-X Series offers high-speed, high-resolution cameras for high-accuracy inspection, providing powerful solutions for a variety of problems that arise in manufacturing.
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Product
End Face Inspection Microscopes
D SCOPE EFI – D SCOPE EFI-C – D SCOPE EFI-C LWD
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The new D Scope EFI for MTP/MPO and multifibers field connectors is a cost effective microscope for inspecting fiber optic patchcords and cassettes.
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Product
Semiconductor Inspection (SEMI)
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A process for detecting any particles or defects in a wafer.
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Product
X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units





























