Diode Test
See Also: Diode, Laser Diode, Zener Diode, Photodiode, Diode Testers
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Simulation Models for Passive Components, Transistors, Diodes, etc.
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An indispensable collection of the industry''s most advanced simulation models for passive components, transistors, diodes and more. These reliable, measurement-based models maximize the RF/MW electronic design automation (EDA) process, reduce design cycle times, and lower product development cost. With a few EASY steps, the Modelithics Model Libraries are ready to use in EDA tools.
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THz Diodes
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Macom Technology Solutions Holdings Inc.
The intrinsic cutoff frequencies of these Schottky junction devices exceed 1 THz, making them well-suited for use in mixers and detectors operating in the frequency bands from 60 GHz into the hundreds of GHz bands.
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Diode Power probe
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The COMM-connect 3026 Diode based temperature compensated probe is designed for use with the COMM-connect range of Power Monitors. The probe will handle from 50µW to 100mW . Used with external couplers and the our measurement system application from 1W to 1MW, a high dynamic range can be configured. The 3026 Diode based probe gives excellent stable results along with the COMM-connect Power Monitor variants. This gives our customers a number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
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Product
Flying Prober Test System
QTOUCH1404C
Test System
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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High Voltage Diode Assemblies
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High voltage diode assemblies are built by adding diodes in series to yield a higher peak inverse voltage. For example, if each diode is rated for 1200 peak inverse voltage (PIV), then six diodes in series would have a total peak inverse voltage of 7200 PIV. The detailed circuit is shown below.
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Laser Diode Drivers For Automotive
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Automotive Head-Up Displays (HUDs) are benefiting from big innovations in MEMS projection systems and are central to ADAS and safety. The latest laser scanned-MEMS projection systems can provide higher resolution images and at a lower cost. Renesas' highly integrated laser diode driver enables automotive head-up displays (HUDs) with high resolution, high color-depth and high frame-rate projections.
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
Steering Diodes
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ProTek's low capacitance Steering Diode Arrays provide high-speed data line and I/O port protection from transients caused by Electrostatic Discharge (ESD), Electrical Fast Transients (EFT), Tertiary Lightning and other induced voltages. Steering diodes divert the transient to the power-bus or ground and away from sensitive IC components.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Millimeter-wave and Microwave GaAs Diodes
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Keysight Technologies provides MMIC diodes ideal for microwave radio, aerospace and defense, and instrumentation applications.
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Pump Laser Diode Driver
S-110
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•LD Driver, EDFA, ASE Broadband Source, 1X4 Optical Switch•Variable Optical Attenuator, Wavelength Meter•SOA Driver, SLED Driver, Pump LD Driver•Pattern Generator & BERT, SFP Transceiver Driver•4Channel Optical Return Loss Meter (Light Source & Power Meter)
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Laser Diode Driver
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Fibotec offers special laser diode drivers, especially versions that accommodate laser diodes via integrated terminal bases. Two standard products for different applications accommodate laser diodes in butterfly packages with up to 2 A forward current. The "Pump Laser Pinout" is standard. The configuration for "Signal Laser" is available on request.
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Product
Planar-Doped Barrier Diode Detector, 0.01 to 33 GHz
8474C
Diode Detector
The Keysight 8474C is a high-performance detector using a gallium arsenide, planar-doped barrier detecting element. It features extremely flat frequency response over its entire band of operation and very good frequency response stability versus temperature. The Keysight 8474C is also very rugged with high resistance to ESD damage. The Keysight 8474C detector is available with a 3.5-mm (mates with SMA, 0.01 to 33 GHz) connector. This detector offers the options for optimal sqaure-law loads (Option 102) and for positive polarity output (option 103). Because the unit-to-unit frequency response tracking of this device is typically better than 0.3 dB, no matched response option is offered.
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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High-power Laser Diode Assembly
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The laser diode is one of the most common devices used throughout photonics. The micro-assembly process calls for the placement and bonding (align-&-attach) of single emitters, or multiple laser diodes (stacked or complete bars), the placement, active alignment and bonding of necessary micro-optical elements, subsequent device testing, and ultimately packaging and quality control. ficonTEC’s machine systems are capable of all the steps necessary for assembling laser diodes, even high-power devices. Multiple in-line systems can be configured to address entire process segments.
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Repair of Six Diode Bridge Assemblies, P/N 5989C
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CEHCO is specialist in repair of various rectifier assemblies. One such assembly is shown below:Specifications:- Six Diode Bridge Assembly, P/N 5989C- AC input terminals: (3, 4 , 5)- DC output terminals: (1), POSITIVE and (2), NEGATIVE
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PIN Diodes
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The SemiGen SGP7000 series of PIN Diodes are processed with a high-resistivity epi that have intrinsic layers that range in thickness from 4 micron to 200 micron depending on performance specifications. These devices are typically manufactured with either a robust thermal-oxide passivation or ceramic glass for durable high-power applications. These diodes are made with a grown junction P++ layer that yields abrupt junction structures that provide low punch through voltages and minimize autodoping. They are available as chips or in your choice of packages.
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USHIO Blue Violet Laser Diodes (375nm - 405nm)
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The Optoelectronics Company Ltd
The USHIO HL40071MG is a single transverse mode 405nm laser diode which offers 300mW optical output power in a 5.6mm package with typical optical and electrical characteristics, (Tc=25 degrees C, cw), of 50mA threshold current, operating current of 280mA, operating voltage 6.0V, 6 degrees beam divergence parallel to the junction, 15 degrees beam divergence perpendicular to the junction, laser diode reverse voltage of 2V and operating temperature of 0 to +70 degrees C.
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SP4T RF Pin Diode Switches To 16 GHz
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The 4-way series of absorptive and reflective switches operate from 100 MHz to 16 GHz. They are rated at 200 mW maximum input power and have a switching time of 100 ns. SP4T switches that operate up to 8 GHz have a maximum VSWR of 1.6:1 and minimum isolation of 60 dB. All absorptive and reflective switches manufactured by Pulsar Microwave require both positive and negative 5-volt supplies. Additionally, the TTL control logic operates from 0 to +5 VDC. Voltage connection is made with feed thru terminals. Ground connection is made through the chassis and turret terminals.
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Millimeter Wave Zero Bias GaAs Schottky Diode
HSCH-9162
Diode Detector
The HSCH-9162 is suitable for medium-low barrier, zero bias detector applications. The HSCH-9162 is functional through W-band (110 GHz) and can be mounted in microstrip, finline, and coplanar circuits.
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Laser Diode Drivers
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Arroyo Instruments offers a broad range of laser drivers to meet your exact test needs. From 100 milliamps to 100 Amps, all of Arroyo Instruments' LaserSource benchtop laser drivers include unique features not found on competing products such as optically isolated photodiode and modulation inputs, programmable PD bias, and both RS232 and USB computer interfaces. The LaserSource also has laser diode protection circuits such as interlock, ESD protection, and hardware limits for current and voltage.
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Function Test and In-Circuit Test
CT350
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ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Test Sockets
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socket design as per customer specificationsquick + easy socket changehigh-performance spring probesdesigned for high frequency up to 16 GHz-55C/-67F to 150C/302F temperature rangemanual/automatic application optionssmall socket footprintone socket base for each insert (3x3 to 9x9 QFN)one-click switch from engineering to production socket modedevice dependent standard socket frame with changeable insertmore than 500,000 compression cyclesKelvin test applicabilitytool-free insert + actuator exchanges0.3 mm minimum lead pitchQFP extender available
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Microwave Testing
120
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The MODEL 120 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 120 Picoprobe®, achieves an insertion loss of less than 1.75 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
