Diode Test
See Also: Diode, Laser Diode, Zener Diode, Photodiode, Diode Testers
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Product
THz Diodes
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Macom Technology Solutions Holdings Inc.
The intrinsic cutoff frequencies of these Schottky junction devices exceed 1 THz, making them well-suited for use in mixers and detectors operating in the frequency bands from 60 GHz into the hundreds of GHz bands.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Product
Laser Diode Drivers (LDD)
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LDD technology has evolved from driving DVD/CD/Blue-ray optical drives to include laser projection in smartphones, automotive head-up displays (HUDs) and pico projectors. Renesas has developed new LDDs for RGB scanning laser projection systems and laser-based pico projectors. Automotive HUDs are benefiting from big innovations in MEMS projection systems and are now central to advanced driver assistance systems (ADAS) and safety. The latest laser scanned-MEMS projection systems can provide higher resolution images and at a lower cost.
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Product
Silicon Carbide Diodes
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In addition to ensuring compliance with today's most stringent energy efficiency regulations (Energy Star, 80Plus, and European Efficiency), ST's silicon-carbide diodes show four times better dynamic characteristics with 15% less forward voltage (VF) than standard silicon diodes. Silicon-carbide diodes belong to our STPOWER family.
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Product
External Cavity Diode Lasers
ECDLs
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High-performance ECDLs and injection-locked optical amplifier.
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Product
Silicon Diodes
DT-670 Series
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DT-670 Series silicon diodes offer better accuracy over a wider temperature range than any previously marketed silicon diodes. Conforming to the Curve DT-670 standard voltage versus temperature response curve, sensors within the DT-670 series are interchangeable and, for many applications, do not require individual calibration. DT-670 sensors in the SD package are available in four tolerance bands—three for general cryogenic use across the 1.4 K to 500 K temperature range and one that offers superior accuracy for applications from 30 K to room temperature. DT-670 sensors also come in a seventh tolerance band, B and E, which are available only as bare die. For applications requiring greater accuracy, DT-670-SD diodes are available with calibration across the full 1.4 K to 500 K temperature range.
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Product
In-Circuit Test System Repairs
Test System
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
Diode Arrays
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a silicon diode with minimal packaging overhead. The small signal 0603, 1005 and 1206 Chip Diodes are lead free with Cu/Ni/Au plated terminations while the other packages (SMA, SMB, SMC, 1408, 1607, 2010, 2419, 8L NSOIC, 16L NSOIC, SOT23, SOT23-6, 16L WSOIC) use 100 % Tin terminations. All Bourns® diodes are compatible with lead free manufacturing processes, conforming to many industry and government regulations on lead free components.
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Product
Beam Lead PIN Diodes
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The SemiGen SBL 2000 series Beam Lead PIN Diodes feature fast switching speeds at both low capacitance and resistance. Beam Lead PIN Diodes have high levels of mechanical strength and stability during assembly. These diodes are suitable for microstrip or stripline circuits as well as circuits requiring high isolation from a series of mounted diodes such as multi-throw switches, phase shifters, attenuators and modulators.
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Product
High Temperature Component Test Fixture
16194A
Test Fixture
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
Schottky Mixer and Detector Diodes
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Macom Technology Solutions Holdings Inc.
Schottky diodes are majority carrier diodes formed by plating a layer of metal on a layer of doped semiconductor, which forms a rectifying junction. The type of metal and the type of dopant in the semiconductor determines the diode’s barrier height, which is a measure of the amount of energy required to force the diode into forward conduction. MACOM produces Si Schottky diodes as well as GaAs Schottky diodes for use as signal detectors or in frequency mixers.
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Product
Universal In-Line Test Platform
Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Product
Diode Driver & Laser System Controllers
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The laser controllers provide a simple method of controlling Lumina and other popular laser diode drivers or full laser systems. They include the ability to easily control current levels, pulse modes, and interlock controls as well as monitor voltage and current levels as well as q-switch triggering, external triggering, sync output, and additional I/O signals.
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Product
Test System for High Volume Production Testing of Integrated Circuits
ETS-364
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
Diode Laser Driver
D200
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The D200 is a compact, DC-coupled fast laser driver, providing up to 4 amps of regulated constant current. A built-in edge-triggered pulse generator produces up to 1 microsecond pulse widths and 2 nanosecond transition times, capable of driving lasers with forward voltages up to 9 volts. A pulse-follower mode is also provided, accommodating externally-defined trigger widths up to 100% duty continuous-wave (CW). Power, pulse width, drive current and differential triggering functions are accessible through a ribbon cable header for embedded OEM applications. A low-inductance laser drive interface permits direct laser connection or custom interposer and flex-cable attachment.
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Product
Laser Diode Driver
LDD100
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Artifex Engineering GmbH & Co. KG
The LDD100 employs a digitally programmable analogue end stage for flexible and accurate current control. Currents of up to 600A with pulse durations of 50ns to 3s are generated with rise and fall times of 70ns (F-version) or 600ns (XL-version) – essentially without overshoot. Due to the flexibility in setup and control, the LDD100 is practical for many laboratory applications. For automated measurements, the unit may be directly controlled via the USB interface. Alternatively, all parameters may be input via the graphical software or via the integrated keypad and OLED display.
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Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
Fast Recovery Diodes
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We offer high-performance products with low forward voltage (VF) and high-speed reverse recovery time (trr) for increasing device efficiency.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
SiC Diodes
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ST’s silicon carbide diodes range from 600 to 1200 V – as single and dual diodes – and feature unbeatable reverse recovery characteristics and improved VF. Available in a wide variety of packages, from D²PAK to TO-247 and the insulated TO-220AB/AC, they offer great flexibility to designers looking for efficiency, robustness and fast time-to-market. ST’s SiC Schottky diodes show a significant power-loss reduction and are commonly used in hard-switching applications such as high-end-server and telecom power supplies, while also intended for solar inverters, motor drives and uninterruptible power supplies (UPS). ST’s automotive-grade 650 and 1200 V SiC diodes – AEC-Q101-qualified and PPAP capable – feature the lowest forward voltage drop (VF) on the market, for optimal efficiency in electric vehicle (EV) applications.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
PIN Diodes
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The SemiGen SGP7000 series of PIN Diodes are processed with a high-resistivity epi that have intrinsic layers that range in thickness from 4 micron to 200 micron depending on performance specifications. These devices are typically manufactured with either a robust thermal-oxide passivation or ceramic glass for durable high-power applications. These diodes are made with a grown junction P++ layer that yields abrupt junction structures that provide low punch through voltages and minimize autodoping. They are available as chips or in your choice of packages.
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
Test System
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
PIN Limiter Diodes
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Macom Technology Solutions Holdings Inc.
MACOM’s PIN limiter diodes provide excellent broadband performance from 1 MHz to 20 GHz and higher for receiver protector circuits. Our PIN limiter diodes are available in die form, plastic and ceramic packaging. Our ceramic packaged diode series is ideal for waveguide, coaxial, and surface mount applications, while our die diode series is well suited for chip and wire high frequency microwave applications.
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Product
Atlas ZEN Zener Diode Analyser
ZEN50
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The Atlas ZEN is ideal for testing Zener diodes (including avalanche diodes), transient suppressors, LEDs and LED strings.
