Inductor Test
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
Test Port Cable
The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
Headlamp Test Platform
Test Platform
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
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Product
Inductors
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Murata offers a broad lineup of chip inductors that fit diverse requirements such as compact size, large current, etc. across applications ranging from consumer use to automotive applications that require high reliability. We are also productizing inductors with superior mountability thanks to their SMD type that are suited to specific applications such as high-frequency circuits, power supply circuits, in-vehicle PoC, short-range wireless communication, etc.
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Product
Scalable Tester System for Functional Testing
UTP6010
Functional Test
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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Product
Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
Power Bead Inductors
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Power bead inductors are typically used in high current multi-phase voltage regulators that power processors, memory modules and high current ASICs and FPGA in a wide range of applications including servers, graphics cards, storage and data centers. The construction consists of a ferrite core assembled over a 1T or 2T winding and which allows for extremely low DCR, high peak current and low AC losses. Pulse has single phase, integrated phases and coupled inductor versions. Our high volume manufacturing enables us to produce components that are cost-effective while maintain exceptional quality and reliability.
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Product
In-Circuit Test Systems For Sale
Test System
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Product
Wireless Test Standards Software
test
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Product
DC Filter Inductors
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Osborne DC filter inductors (aka filter chokes) are commonly used in AC to DC conversion circuits to present an inductive voltage drop to the AC component of rectified current. This inductive voltage drop acts as a filter. Osborne designs filter inductors to components to function effectively (without saturation) in the presence of the DC current. Osborne will work with you to mitigate the impact of ripple frequency in conversion circuits. Every Osborne DC filter choke is designed for high performance with special consideration given to your circuit´s power supply frequency and conversion configuration.
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Product
Hybrid Single Site Test Handler
3110
Test Handler
Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Test Platform
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
AC Load Simulating Inductors
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Osborne designs our AC Inductors to provide the desired inductance and to perform effectively with the dissipation characteristics presented to the circuit. Dissipation characteristics depend on circuit current and operating frequency. The Osborne design approach is unique to the extent that we design for frequency effects. The resulting inductors deliver superior performance.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Inductor Coils
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SemiGen's Inductor Coils are manufactured using our thin film process on quartz substrates. The precision photolithography and non-chemical etching process provides clean edges to assure uniformity from coil to coil. By using quartz and applying a polyimide coating we produce a device that eliminates the need for conformal coating or staking. Inductors can be epoxied down with nonconductive epoxy and the wire bonded for connection.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Harmonic Trap Inductors
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Osborne designs harmonic trap inductors to work in conjunction with capacitors in power systems to prevent specific line-frequency harmonics from flowing back to the power source (point of common connection). This power quality design approach prevents harmonic currents from flowing to the main facility power system and/or to the utility power system. The Osborne system also reduces unnecessary power losses and power-system pollution.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Inductor Products
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Macom Technology Solutions Holdings Inc.
They provide uniformity, durability and repeatability in circuit fabrication. The coils are polyimide coated to protect from ambient contaminants, and to eliminate the need for conformal coating. Quartz substrates are rugged and reduce dielectric losses. Chips may be bonded using either conductive or non conductive epoxies, and wire bonded with gold wire or ribbon by thermocompression bonding.
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Product
Flying Prober Test System
QTOUCH1404C
Test System
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
