PCI Express Test
See Also: PCI Express, PCI Express Analyzers, PCIe
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Product
PCI Express Gen 1 Test Backplane
SKU-015-01
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The PCI Express Test Backplane was designed to support production testing/debugging of PCIe-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into one x4 and three x1 PCI Express slots via 7 ft CAT6 cable.
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Product
PCI Express, PCI, Multi-Interface Test Backplanes
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Amfeltec PCI Express, PCI, Multi-Interface Test Backplanes
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
PCI Express® Electrical Performance Validation and Compliance Software
D9040PCIC
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D9040PCIC PCI Express Transmitter Test Compliance Software for PCI Express 4.0 (PCIe 3.x, 2.x and 1.x also supported).
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Product
PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
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PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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Product
PCIe 3.0 and 4.0 Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 3.0 and PCIe 4.0 specification. This solution combines a Summit Z416 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 3.0 and PCI Express 4.0 Link and Transaction Layer Compliance Testing.
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Product
PCIe Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
PCI Express PLL Test Application
N1081PLCA
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Keysight N1081PLCA PCI Express PLL Test Application designed to measure transmitter PLL bandwidth and peaking based on the PCI Express 5.0 TX PLL Specifications. Use N1081PLCA PCIe PLL test software to test, debug and characterize your PCIe designs.
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Product
PCI Express® 2.0 Protocol Test
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The E2960B family is one of the best tools in the industry for PCI Express® 2.0 testing and debug. That’s not just from us, in fact the E2960B series wins the 2007 Best in Test Award – Honorable Mention.
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Product
PCI Express Full Tx Test Suite
SW02PCIE
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The PCI Express Full Tx Test Suite is part of the subscription based Oscilloscope Compliance Test Software Suites. In addition to Tx Validation licenses for PCIExpress, this suite also provides the support of the Advanced PCIe Protocol Decode/Trigger Software. This suite supports coverage across the PCI Express technology starting from Gen4. Together with the subscription model, this enables the support and coverage continuity as the PCI Express technology progresses through generations.
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Product
250 KS/s, 16-Bit, 8-Ch Simultaneous Sampling, Multifunction PCI Card
PCI-1706U
PCI Card
8 differential analog inputs8 A/D converters simultaneously sampling16-bit A/D converter, with up to 250kHz sampling rate for each channelProgrammable gainMultiple A/D triggering modesOnboard FIFO memory up to 8K SampleProgrammable pacer/counterBoardID™ switchUniversal PCI Bus (supports 3.3V or 5V PCI bus signals)
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Product
MXI-Express Cable with Communication Levels up to Gen 3 x8
779500-03
MXI Express
MXI-Express Cable, Gen 1 x1, Copper, 3m
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Product
PXIe-8399, Gen 3, x16, 2-Port PXI Remote Control Module
784180-01
MXI Express
PXIe, Gen 3, x16, 2-Port PXI Remote Control Module—The PXIe-8399 enables control of a PXI Express chassis from an external host, such as a desktop PC, rackmount controller, or a separate master chassis. Using a Gen 3 x16 PCI Express link, the PXIe-8399 provides up to 16 GB/s of data transfer between the chassis and host over a copper cable connection. An additional port allows daisy-chaining for multi-chassis configurations.
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Product
250 KS/s, 16-Bit, 64-Ch Analog Input Universal PCI Card
PCI-1747U
PCI Card
64-ch single-ended or 32-ch differential or a combination of analog input16-bit A/D converter, with up to 250 kHz sampling rateAuto calibrationOnboard FIFO memory (1,024 samples)Universal PCI Bus (support 3.3 V or 5 V PCI bus signal)BoardID™ switch
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Product
Full DSP-Based 4-Axis Motion Control Universal PCI Card
PCI-1245
PCI Card
Encoder input is 10 MHz for 4xAB mode, 2.5 MHz for CW/CCW modePulse output up to 5 MppsMemory buffer (10K points) for trajectory planning which is designed in DSPSupports E-Gear, and helical interpolationSupports E-CAM providing 256 points to describe the CAM profiles which buffers located in DSPHardware emergency inputWatchdog timerPosition latch via ORG & index signalPosition compare triggering up to 100 KHz, and memory buffer is up to 100K points in DSPProgrammable interruptSupports gantry mode by semi-closed loop pulse train controlRDY/LTC-dedicated input channels & SVON/CMP/CAM-DO/ERC-dedicated output channels are switchable for general input and output purposes
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Product
Value DSP-Based 4-Axis Motion Control Universal PCI Card
PCI-1245V
PCI Card
Encoder input is 10 MHz for 4xAB mode, 2.5 MHz for CW/CCW modePulse output up to 5 MppsSupports linear and circular interpolationHardware emergency inputSupports E-GearSupports programmable acceleration/deceleration rateMemory buffer (10K points) for trajectory planning which is designed in DSP(Auto-blending is not supported)Position compares triggering up to 100 KHz, and memory buffer is up to 100 K points in DSPPosition latchProgrammable interrupt and watchdog timerRDY/LTC-dedicated input channels & SVON/CMP/CAM-DO/ERC-dedicatedoutput channels are switchable for general input and output purposes
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
2-Axis Stepping And Servo Motor Control Universal PCI Card
PCI-1220U
PCI Card
Independent 2-axis motion controlHand wheel and jog function2-axis linear interpolation function2-axis circular interpolation functionContinuous interpolation functionProgrammable T/S-curve acceleration/deceleration rateUp to 4 Mpps output for each axisTwo pulse output types: CW/CCW or pulse/directionUp to 1 MHz encoder input for each axisTwo encoder pulse input types: A/B phase or up/downConstant speed controlPosition management and software limit switch functionBoardID™ switch
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Product
NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
MXI-Express Cable with Communication Levels up to Gen 3 x8
785550-01
MXI Express
MXI-Express Cable, Gen 3 x8, Copper, 1m
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
Scienlab Combined Battery Test Solution
SL1133A
test
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
MXI-Express Cable with Communication Levels up to Gen 3 x8
785549-03
MXI Express
MXI-Express Cable, Gen 3 x4, Copper, 3m
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Product
MXI-Express Cable With Communication Levels Up To Gen 3 X8
788302-30
MXI Express
The MXI-Express Cable connects a host interface to a PXI or PXI Express chassis. You can also use it for data communication between multichassis systems. NI offers it in different MXI communication levels and lengths.
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Product
Mixed Signal Battery Test System
Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
