Test Heads
1) interchangeable assembly connecting test signals between DUT and ATE. 2) representation of a human head. 3) provide network test access.
See Also: Heads, Test Probes
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Product
Single Head Component Testers
34XX
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Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Product
Attitude Heading Reference System
(AHRS) TRAX2
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Using its unrivaled magnetic sensor expertise , PNI fuses its proprietary magnetic sensors and sensor fusion algorithms, delivering accurate AHRS heading without the need for GPS.
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Product
Scanning Head For Energy Meter Test
PACB108
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PACB08 is the accessory device to perform the energy meter test, which can work together with PONOVO’s relay test sets to test energy meter by using Energy Meter Module in Powertest software.
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Test Platform
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Custom Magnetic Recording Heads
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International Electro-Magnetics, Inc.
We have manufactured over 5,000 different head designs. If we don't have one to suit your requirements, we will design and build to your specification. Our toolroom is well equipped to produce precision parts, and our design projects have included flux sensing systems, magnetic disk encoding, and electronic test equipment.
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Product
Doppler Sensor Heads
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Designed for long range motion/speed/directional detection where the sensitivity is essential.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Motorised and Automated Probe Heads
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Motorised heads enable automated, repeatable re-orientation of probes to allow access to features on all faces of the part, improving the capability of the CMM and maximising productivity.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
Frequency Extension Heads for Vector Network Analyzers
FEV
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These frequency extension modules connect to your existing test ports and leverage the inherent microwave network analyzer’s performance and features to display full port S-parameters: Two measurement architecture available: 1-path/2-port and fully reversing 2 port. Waveguide calibration kits are available as separate accessories.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Universal Scanning Head
CF106
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Calmet Smart Calibration Devices
Universal miniature scanning head for detecting (counting) impulses from inductive, LED and LCD energy meters. Additionally it enables counting of manually triggered impulses (Start/Stop push button function). Sometimes (when access is difficult) it is the only way to count pulses from inductive, LED and LCD meters.
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Product
Flying Prober Test System
QTOUCH1404C
Test System
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Product
WLCSP Probe Heads
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Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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Product
7-Meter Laser Head Cable
10882B
Calibration Cable
The 10882B 7-meter Laser Head Cable is used to connect the 5519A/B Laser Head to the E1735A USB Axis Module for the 5530 Laser Calibration System.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Wafer Probe Heads
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WLCSP test is the applying final test conditions at Wafer Level. WLCSP testing is driven in lowering the cost of test of devices through economical methods of manufacturing and testing.
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Product
Constant Pressure Dual Head Pump
ReaXus CP Class
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The high performance CP Class consists of dual-headed, positive displacement piston pumps with constant pressure control, covering a wide range of flows, with pressures up to 25,000 psi. Standard fluid path material is Stainless Steel. Other available features include Hastelloy fluid path with jacketed pump heads for temperature controlled processes.The CP Class pumps are widely used for Liquid Chromatography Column packing for 4.6 mm columns, as well as many process applications. The constant-pressure feedback loop automatically adjusts solvent flow to maintain constant system pressure and allows the user to select a wide range of process parameters, including desired pressure set point, ramp rate, and upper flow rate limit.The CP Class is available as standalone units, and also with the Teledyne SSI Column Packing System (called Pack-in-a-Box). Features include:20 mL packing reservoir assembly4.6 mm pre-column assemblyTwo (2) 4.6 mm x 150 mm columns10 gram bottle of C18 stationary phaseBracket assembly to mount packing reservoir to pumpQuick-set disk to allow full control of the packing process through a computerTubing, cables and other necessary fittings for connectionsWith 5 mL/min, 24 mL/min, and 100 mL/min versions, the CP Class will meet most Liquid Chromatography Column packing and process needs.
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Product
+40dBm Optical Power Head
81628B
Power Sensor
The 81628B is used with the threaded type adapters. When the adapter is removed, the 8 mm diameter aperture is available for input to open beams or customized fiber holders. The heads are connected to the 816x mainframes using the 81618A single channel or 81619A dual-channel interface module.
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
