ATE
ATE systems are used to test semiconductor devices, printed circuit boards, and electronic systems during manufacturing. AI prompted RL created', prevails upon the UUT to demonstrate It's fulfillment of test requirements.
See Also: Automatic Test Equipment, ATS, Functional ATE, Combinational ATE, Semiconductor Test, PXI Switching, PXI Chassis, PXI Matrix, Automated Test Equipment, Automated Test Systems
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Product
Satellite ATE
MS 1123
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Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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Semiconductor ATE Systems
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Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.
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Product
ATE System Integration
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Cyth Systems is a Systems Integration Company specializing in Automated Test (ATE), Embedded Controls, and Machine Vision. Our skilled and experienced team uses their natural talent for problem-solving to create solutions in a wide range of industries. We build our solutions starting with the National Instruments (NI) platforms including LabVIEW and PXI, and by adding best-in class sensors and components.
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Product
ATE System Power Supplies
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For more than 50 years, Keysight's automated test equipment (ATE) power supplies have changed the way engineers prove their designs, understand issues, and ensure product quality. Our programmable ATE system power supplies' compact design makes it easy to integrate them into any system. Keysight power supplies make it easy to update a test program with modern interfaces, LXI-core capability, and SCPI language. Accelerate test time with fast command processing and quick settling times.
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Product
ATE System Power Supplies
N8700 Series
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The Keysight N8700 Series ATE system power supply delivers high current with low noise in a compact two unit package. Airflow moves front to back, so no additional space is required above or below the power supply in your automated test equipment (ATE) rack. This series of programmable power supplies sources up to 3300 or 5200 W. Get output voltages from 8 to 600 V and 5.5 to 400 A.
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Product
ATE
QT 200 NXG
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Qmax Test Technologies Pvt. Ltd.
QT 200 Nxg a Highly sophisticated ATE, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software.
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Product
Obsolescence Solutions for Legacy ATE
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Our obsolescence solutions, products, and services are used by the DOD and all major Mil/Aero companies to extend the life of their legacy ATE.
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Product
Link simulation to ATE conversion
VCD2ATE
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VCD2ATECost effective link simulation to ATE conversionDirect conversion from event driven design simulation dump (VCD/EVCD) to specific tester program files. VCD/eVCD to tester conversion Simple and cost effective conversion solution Simple cycle definition in excel High Performance Fast run time Handles very large files >6Gb
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Product
ATE For Data Communications Equipment
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• Developed for DRS Codem Systems, Inc. to test the CTM-IP product line of the Multi-Interface Protocol Converter.• Manufacturing Test support for the CTM-IP chassis and Interface Modules. Functional test of signaling, protocol and software configurations for various communication interface configurations.• Regression Test support for Engineering Product Development. Configurable test sequencing allows engineer to select specific tests for execution, with the ability to exercise all combinations of data rates and interface configurations.
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Product
Solar ATE
MS 1534
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The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.
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Product
ATE Test Systems
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Introducing the Procyon ATE System! When it comes to ATE Test Systems for a for low- to high-volume production, Intepro has the testing power you require to be successful. For more than three decades, Intepro Systems has designed, built and integrated power supply test equipment for the world’s largest and smallest power supply manufacturers.
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Aerospace & Defense ATE Systems and Services
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TE solution design, development, and integrationMeasurement / Test Process analysis and consultationEasy-to-use software interfaces for Engineers and UsersFactory automation for test processesAll major instrument brands available & supported
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Avionics ATE Power Subsystem
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AMETEK Programmable Power, Inc.
*Provides eight channels of programmable DC power with output isolation function*Output disconnect function*Total control via Ethernet within power supply.*Mounted in custom in transportable shock-mount case.
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Product
Quickly Upgrade RF ATE Testers
MP5800 / MP5806
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*MP5800 Quickly Provides 3380 / 3650 RF ATE Test Capabilities*MP5800 and 3380/3650 hardware and software are fully integrated*Provide complete and user-friendly RF / Digital debug tools*Provide a complete solution for IOT applications*Provide API for production automation software*Integrate Zimmer 3380/3650 to provide RF/Digital comprehensive ATE test solution
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Product
ATE Solutions
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Our custom, application-specific ATE Test Solutions offer a full test suite with Test Systems hardware, software, and support services.
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ATE Test & Engineering Services
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We can provide a limited scope project or a full turn key solution where we analyze a data sheet and provide a full test plan. Our wide range of ATE test equipment and experienced team can support first silicon debug to release to high volume production for a wide range of products, from Digital to RF, including wafer sort and packaged part testing. Test platforms include Verigy, Teradyne, Advantest.
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Product
PXI 8 Slot BRIC 506x8 1-Pole (11 sub-cards)
40-560A-121-506X8
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high-performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Product
PXI 8 Slot BRIC 44x8 2-pole (2 sub-cards)
40-562A-122-44X8
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Product
Multi-channel Battery Simulator
FT8340
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Shenzhen FaithTech Technology Co., Ltd.
The FT8340 series is a high precision, multi-channel, dual quadrant programmable battery simulator.The current of the simulator can be charged and discharged，and supports various fault simulations, which can not only meet the requirements of BMS testing, but also meet the ATE testing of consumer electronics products.There are at most 12 channels in a device, and each channel is electrically isolated, which is convenient for users to use in series. The built-in upper computer software is easy to operate, flexible and easy to use. It supports single channel programming operations, multi-channel editing operations, and multi process programming operations.
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Spring Probes & Hyperboloid Contacts
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In-Circuit / Functional Probes, Socketless X Probes®, High Current Probes, Double Ended Probes, ATE Interface Probes, integraMate®
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Product
Advanced Power System - Dynamic DC Power Supply, 40 V, 25 A, 1000 W
N7952A
DC Power Supply
The N7900 Series dynamic DC power supplies are designed for automated test equipment (ATE) applications where high-speed dynamic sourcing and measurement is needed.
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Product
PXI 4 Slot BRIC 44x8 1-Pole (2 sub-cards)
40-562A-021-44X8
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Product
LXI HighDensity 192x16 2A Matrix with BIRST
60-554-026
Matrix Switch Module
A high-density single pole matrix module capable of switching up to 300VDC/250VAC, 2A (60W max). The use of high-quality electro-mechanical relays offers high switching confidence for signal routing in large ATE systems.
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LXI HD Dual 24x64 2A Matrix With BIRST
60-552-030
Matrix Switch Module
A high-density single pole LXI matrix module capable of switching up to 300VDC/250VAC, 2A (60W max). The use of high-quality electro-mechanical relays offers high switching confidence for signal routing in large ATE systems.
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Product
Single-in-Line Reed Relays
Series 117
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SIL relays - Very High Density Instrumentation & ATE. Smallest board area. 1A version requires 0.15 x 0.27 inches (3.8mm x 6.8mm). 1 or 2 switches with 3 Watts rating. 5 Volt coils with optional diode
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Product
PXI/PXIe Very High Density Multiplexer, 49-Channel, 4-Pole
40-675B-002-49/4
Multiplexer Module
The 40-675B-002-49/4 (PXI) and the 42-675B-002-49/4 (PXIe) are 49-channel, 4-pole multiplexers and are part of our range of very high density low cost multiplexer modules. These modules are suitable for signal routing in high channel count ATE and data acquisition systems. They use high quality electromechanical signal relays allowing each channel to switch current up to 1 A at 150 VDC/100 VAC. Connections are made via a front panel 200-pin connector.
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Product
PXI-2594, 2.5 GHz, 50 Ω, 4x1 PXI RF Multiplexer Switch Module
778572-94
Multiplexer Module
2.5 GHz, 50 Ω, 4x1 PXI RF Multiplexer Switch Module—The PXI‑2594 is ideal for applications that require the routing of high-frequency signals inside automated test equipment (ATE) systems because it can switch signals with very low insertion loss. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
VectorPro - Simulation Cyclizer for VCD to WGL/STIL
VectorPro
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VectorPro is a low-cost, intuitive test development tool used to translate VCD/EVCD simulations into cyclized ATE Test Vectors in either WGL or STIL formats. This highly versatile tool reads in both VCD and EVCD formatted design simulations, and through the use of its flexible GUI, users are able to view and modify the simulation to fit the needs of their Test Environment.
