PXI Functional Test
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Product
Functional Testing Services
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The efficient functioning of the software is what makes the overall user experience convenient and hassle-free. Many companies struggle with the functionality of the software they make due to some undetected issues with it.
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Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Standards Reference for Test Systems PXI Card
GX1034
PXI Card
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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Functional Testing
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We are flexible to match your approach, whether you are using Agile or traditional development methodologies. We can work with your requirements and test cases, or perform exploratory testing. We can provide 100% of your software testing, or supplement your internal team. Independence and creativity are key elements to find issues to help your software developers create high quality software.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Drop-In Functional Test Fixtures
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Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
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Product
Function Generators
FG085 miniDDS
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The FG085 is a low cost yet versatile function generator capable of producing signals of many different waveforms. As an easy-to-use tool operation of FG085 is very simple and straightforward. It is an ideal test/experiment tool for electronic hobbyists and students.
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Product
NI's Electrical Functional Test Solution
Functional Test
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Functional Testing For Critical Software
RapiTest
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*Requirements-based testing for Ada, C & C++ on-host & target*Reduce test authoring effort through easy-to-use test formats*Manage project artifacts with requirements traceability*Simplify verification through integration with your CI tool*Produce evidence for DO-178 and ISO 26262 certification
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Function Generators
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Analogue and Digital (DDS) function generators with frequency capability from 3MHz up to 50MHz. Single and dual channel models with a comprehensive range of modulations and other capabilities. Remote control models with variants of USB, RS232, GPIB and LAN interfaces.
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Functional Verification
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The Mentor Graphics Scalable Verification" is the most comprehensive EDA solution for functional verification, merging standards support, tools and a "design for verification" methodology to minimize verification cycles and costly design respins.
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Product
Counter/Timer Function Cards
ProDAQ 3800 Series
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The ProDAQ 3800 Series counter/timer function cards are high-density cards that fit into ProDAQ VXIbus motherboards and LXI function card carriers. ProDAQ instruments are versatile, providing users with the highest channel density and functionality available on the market.
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Product
Functional Testing for Evolved Packet Core (ePC/VePC)
PacketCraft
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is a software-only functional tester for ePC and VePC networks. It is installed on a customer laptop or desktop, or on a virtual PC in the cloud.
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Function generators
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Instrumentation for laboratories and technical schools, with digital control.
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
Battery Test Platform
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Automotive Electronics Functional Test Systems
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Keysight Technologies’ TS-5000 Family of Automotive Electronics Functional Test Systems helps automotive electronics manufacturers get their products to market faster by accelerating test system deployment. It utilizes common architecture and core instrumentations to offer maximum flexibility to keep pace with the dynamic changes in the automotive electronic industry.
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Product
Azure Functions
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Develop more efficiently with Functions, an event-driven serverless compute platform that can also solve complex orchestration problems. Build and debug locally without additional setup, deploy and operate at scale in the cloud, and integrate services using triggers and bindings.
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Product
P-GW Functional Tester
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The LTE PGW Functional Tester provides a wrap-around test solution for the Packet Date Network Gateway by emulating all the LTE network elements surrounding the PDN-GW (System Under Test). The P-GW Functional Tester emulates LTE Core Network entities such as the S-GW, PCRF, OCS and OFCS. It tests the S5/S8, S7/Gx, Gy and Gz interfaces of the P-GW.
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
PXI - Test System
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We provide a complete PXI test system made by PXI individual components: 19'' rack, Measuring and stimuli cards, Relay cards, Power Supplies, Integration additional protocol cards such as CAN and CANopen, Boundary Scan, Integration of additional test hardware
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
Function Generator
FG-52
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*0.05Hz ~ 5MHz FUNCTION GENERATOR*LINEAR / LOG SWEEP FUNCTION*DUTY CYCLE COUNTROL*INVERT FUNCTION*AUTO RANGE AUTO GATETIME COUNTER*0.001Hz COUNTER RESOLUTION
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Product
Memory Test Systems
T5503HS2
Test System
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
Digital Bit Pattern Generator
FAB-3226
Function Generator
The FAB-3226 Digital Bit Pattern Generator connects digital ports to an user-defined FPGA logic. As the FPGA is user-programmable all kind of operation can be implemented: input, output, and closed loop operation where input and output are processed in real-time. All this can be controlled by an user-defined application program running on a computer system (PC or embedded).
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Product
Function Generator
FG-109
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*FG-109 is a function generator with a high resolution of 10MHz DDS.*Various output waveforms: Sine, Square, Triangle, Pulse, Anti-Pulse.*Variable DC offset control : ±10V(no load).*Store / Recall. 20 settings*Counter up to 60MHz high frequency.*AM with internal and external carry.*Sweep mode with Linear and Log slope.*FM wide modulation range up to 10 times.*The signal Attenuate can be -20dB or -40 dB.*USB terminal for computer operation.*LCD Display
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Product
S-GW Functional Tester
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The LTE SGW Functional Tester provides a wrap-around test solution for the Serving Gateway by emulating all the LTE network elements surrounding the SGW (System Under Test). The S-GW Functional Tester emulates an LTE eNodeB and other Core Network entities such as the MME, P-GW, S-GW, RNC and SGSN. It tests the S1-u, S11, S5/S8 , S12 and S4 interfaces of the S-GW.
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Product
Functional Test
cUTS
Functional Test
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Function Generators
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PGP Electronics Private Limited
PGP Electronics Function Generators are a reliable source for different waveforms. Two units, function generator and frequency counter are integrated in to one unit. The built-in frequency counter can also be used to measure the external frequency.
