Scanning Probe Microscopes
Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu)
See Also: SPM
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 155gf
K100-H080155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
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Product
C-S General Purpose Probes
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 45Full Travel (mm): 1.14Recommended Travel (mil): 30Recommended Travel (mm): 0.76Overall Length (mil): 395Overall Length (mm): 10.03Rec. Mounting Hole Size (mil): 46.5Rec. Mounting Hole Size (mm): 1.18Recommended Drill Size: 56
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Product
RF High Frequency Probes
High Frequency Probe
*Low impedance*High bandwidth up to 20 GHz*Repeatable measurements*Coaxial design*Interchangeable center conductor
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Product
Scan To CAD
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Scanning or hard probing, large or small, we have a large arsenal of hardware & software to fit our clients’ needs. With all the reference data coming directly from the CAD model this eliminates any human error that would have come through manually entering nominal information.
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Product
Standard 1.53 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-72I15-4
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Standard 2.00 (57.00) - 4.00 (113.00) General Purpose Probe
P2757G-1V1S
General Purpose Probe
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1P-10-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25T30-12
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Digital Microscope Accessories
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Variety of extra accessories , such as macro lenses, remote control consoles, illuminations, image/video capture, software, stands and stages are available for Inspectis digital microscopes.
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Product
Boundary Scan Compliance Tester
QT900
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Qmax Test Technologies Pvt. Ltd.
QT900 Qscan Test system is designed to provide test solution for both Boundary Scan compliance devices and Non Boundary Scan devices. The System provided with Digital IO’s capable of driving and receiving via JTAG IEEE 1149 standard interface and synchronous to JTAG pins. Both Digital and JTAG test are carried out synchronously. Use of virtual test pin and Edge connector eliminates the need of expensive test fixture strategy.
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Product
Ultra-High Vacuum Scanning Kelvin Probe
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Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25Z-4
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25L-6.5
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Upright Microscopes
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ACCU-SCOPE upright microscopes deliver top quality optics for bright, crisp images. Sometimes referred to as compound microscopes, our upright microscopes are favorites across a wide range of laboratories including clinical, veterinary, pharmaceutical, research, university, and education. Some of the disciplines utilizing our upright microscopes include pathology, hematology, microbiology, cytology and histology. ACCU-SCOPE upright microscopes offer a selection of magnifications from ultra-low (e.g. 2X) to high power oil immersion (e.g. 100X). Our microscopes have a variety of options and accessories to perfectly fit your application including ergonomic viewing heads, trinocular heads for camera attachment, and an assortment of objectives. Common contrast methods used with our microscopes include brightfield, phase contrast, darkfield, Differential Interference Contrast (DIC) and fluorescence.
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Product
3D Microscope
BVM-5006
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BVM-5006 Electric 3D Microscope features the quality optical system, high resolution, large field of view, high zoom ratio, novel design and one-up technology, easy and automatic operations. Includes: Motorized zooming, motorized observation angle for changing and optional motorized focusing. The speed can be adjusted while changing observation angle. With the angle attachment, the microscope can realize 3D image effects for observing the components and deep holes. The LED lights can generate high brightness. Theoretically the service life of LED lights can reach 20,000 hours. The LED lights with area control function can illuminate from different angles for convenient multi-angle inspections. The M-N3D Microscope can be widely used in micro-electronics, automated monitoring and testing industries. By selecting the appropriate objectives and video couplers, different magnification, field of view and depth of field can be acquired. Digital and Analog video systems can meet the different users' demands.
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Product
Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50L-QG-75
High Frequency Probe
Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,575Overall Length (mm): 40.00
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-1I40-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Power Rail Probe, 6 GHz
N7024A
Oscilloscope Probe
The N7024A power rail probe is for users making power integrity measurements that need mV sensitivity when measuring noise, ripple and transients on their DC power rails. The probe is designed for measuring periodic and random disturbances (PARD), static and dynamic load response, programmable power rail response, and similar power integrity measurements. Many of today’s products have tighter tolerances on their DC power rails than the previous generations of these products, and the N7024A power rail probe is designed to help users ensure their products meet these tighter tolerances.
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Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1T-8-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2B40-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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SSP Switch Probes
Switch Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Spring Force Remark: Force at switch point: 2.36 (66)Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 150Full Travel (mm): 3.81Recommended Travel (mil): 100Recommended Travel (mm): 2.54Mechanical Life (no of cyles): 100,000Overall Length (mil): 1,210Overall Length (mm): 30.73Switch Point (mil): 25Switch Point (mm): 0.64
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Product
Area Scan Camera
Genie Nano-CL
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Introducing Genie Nano, a CMOS area scan camera that redefines low cost performance. Genie Nano starts with industry leading CMOS sensors and adds proprietary camera technology for breakthrough speed, a robust build quality for wide operating temperature, and an unmatched feature set--all at an incredible price.
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Product
Stereo and Zoom Microscopes
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Generate three-dimensional and laterally precise images. With Stereo Microscope you observe large samples such as leafs and tissues or inspect rough material surfaces. Upgrade your microscope flexibly with different digital cameras and benefit from various types of illumination techniques.
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Product
High 3.12 (88.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-72I40-8
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
64-Channel Boundary Scan Digital I/O Scan Module
JT 2111/MPV DIOS DIN
Digital I/O
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.This JT2111/MPV DIOS module is also available through our webshop.
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Metra Scan 3D
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The most accurate scanning and probing solutions, whether in lab or on the shop floor.Highly accurate measurementDynamic referencingComplete metrology solution
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Temperature Controlled Microscope Stages
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Your product descripThere are various version options for this stage, including pressure, vacuum, electrical sample measurement and sample holders to mount the stage vertically in IR or xray spectrometers.tion goes here.
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1Z-10-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1UN-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 2.67 (76.00) - 7.00 (198.00) Bead Probe
BTP-72F-7
Bead Target Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,700Overall Length (mm): 43.18
