Scanning Probe Microscopes
Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu)
See Also: SPM
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Product
Standard 0.39 (11.00) - 1.39 (39.00) Replaceable General Purpose Probe
MEP-30U
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 30Test Center (mm): 0.76Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 690Overall Length (mm): 17.53
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Product
Digital Vision Microscopes
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Sinowon Innovation Metrology Manufacture Ltd.
Video Microscope is widely used in the inspection of electronic industry production line, printed circuit board, weld detects ( such as wrong printing, edge collapse,etc)during printed circuit component, PC Board, VFD, and the identification of printing grid and painting, etc. It can display the zoom out image on the screen and save, magnify and print.
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Product
Renishaw Scanning Probes
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Advanced Industrial Measurement Systems
The REVO® is designed to maximize CMM throughput while maintaining high system accuracy and uses synchronized motion as well as Renscan5 measurement technology to minimize the dynamic effects of CMM motion at ultra high measurement speeds. This is achieved by letting the REVO® head do the fast demanding motion while the CMM moves in a slow linear fashion.
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Product
Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3G-1
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
CC15010X, 10 MHz, 150 A Current Oscilloscope Probe
786849-01
High Current Probe
The CC15010X, or Hioki 3274, is a clamp-on current probe that offers a wide DC to 10 MHz bandwidth and 150 A of continuous input. It is ideal for capturing transient current signals from switching power supplies, inverters, and motor controllers. The probe requires an external power supply.
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Product
Scanning & Inspection
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API’s offers a range of portable measuring and laser scanning solutions together with robot or tripod mounted 3D structured light scanner.
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Product
Standard 1.10 (31.00) - 2.50 (71.00) General Purpose Probe
HPA-1H-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1UN-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Industrial Microscope Solutions
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Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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Product
Differential Scanning Calorimetry
Nano DSC
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The Nano DSC differential scanning calorimeter is designed to characterize the molecular stability of dilute in-solution biomolecules. The Nano DSC obtains data using less sample than competitive designs. Solid-state thermoelectric elements are used to precisely control temperature and a built-in precision linear actuator maintains constant or controlled variable pressure in the cell. Automated, unattended continuous operation with increased sample throughput is achieved with the optional Nano DSC Autosampler.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1I35-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Stereo Microscopes & Macroscopes
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Leica Microsystems offers customized stereo microscopes for research, industry and education. Our macroscopes for industry, medicine and research offer exceptional optics and ultra convenient operation. Stereo microscopes and macroscopes from Leica enable you to view, analyze and document your specimens in two and three dimensions for any application.
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Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2X-1
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Scanning Electron Microscope
SEM
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Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Atomic Force Microscope
AFM
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Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1Z1-8-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1L18-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-J100-3
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T80
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
High 2.84 (81.00) - 8.00 (227.00) Bead Probe
BTP-25F-8
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.50 (43.00) - 3.00 (85.00) General Purpose Probe
P2665G-1C1S
General Purpose Probe
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
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Product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25L18-10
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.39 (11.00) - 1.39 (39.00) Non Replaceable General Purpose Probe
MEP-20B
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 25Test Center (mm): 0.635Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 750Overall Length (mm): 19.05Rec. Mounting Hole Size (mil): 20.5Rec. Mounting Hole Size (mm): 0.52Rec. Mounting Hole Remark: 20.5 to 21.5 mil / 0.52 to 0.55 mmRecommended Drill Size: #75 or 0.52 mm
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Product
Digital Microscopes
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Zarbeco Digital Microscopes include Video toolbox PC software for taking still and moving images, measurement, labelling, draw-on features. They will have the best image quality at an affordable price with magnification options, digital camera options, and software options to meet your imaging needs.
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Product
Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25UN-6.5
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Product
STM Microscope
NaioSTM
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The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1I35-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25I-6
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
