Breaker Test Systems
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Product
Dynamic Test System
3430-SW
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The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Modular Test System
IMU-MGE
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Modular test system with colour touch screen and intuitive software. An integrated help with graphics guide the user through fast and efficient setup and operation. The system is used for CE mark testing in the European Union. Each system can be individually configured and easily extended.
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Product
Portable Test System
MT786
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Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Product
Photoelectrochemical Test System
SolarLab XM
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SolarLab XM is an application specific XM (Xtreme Measurement) product that is primarily focused on solar cell / photovoltaic research, developed in conjunction with Professor Laurie Peter of the University of Bath, UK.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Vibration Test Systems
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HIACC Engineering & Services Pvt. Ltd.
Designed to simulate real-world vibration, shock, and environmental stresses for product reliability testing.
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Product
EHV Circuit Breaker Analyzer
DigiTMR S2
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The Vanguard DIGITMR S2 is an inexpensive, easy to use digital circuit breaker analyzer. The DIGITMR S2 can be operated stand-alone or can be computer-controlled. It can fully analyze a circuit-breaker’s performance by testing the contact time, stroke, velocity, over-travel, and contact wipe. Contact and motion analysis can be performed for all breaker contact operations (Open, Close, Open – Close, Close – Open, and Open – Close – Open). Timing results are recorded and displayed on the 240 x 128 pixels back-lit LCD screen and can also be printed on the built-in 4.5″ wide thermal printer.
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Product
PXIe System Sync Module, 2 Port
M9032A
System Sync Module
The M9032A has a Soft Front Panel (SFP) that provides a graphical user interface to the system sync module. It allows the user to set up the most commonly used functionalities of the module. The SFP also gives you the ability to check the module's connection status, configure the reference clock and IO settings, and perform firmware udpates.
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Product
Test System
ETS788XL
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The 50/100 MHz ETS788XL system is the compact protable version of our ETS788. Made with the new high-performance precision components of our Griffin series, this portable powerhouse offers an optional tough road case and ready to go to any test site needed. Just pop off the covers and get started. Whether it's research, Failure Analysis, or single-event effects testing, his powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date.
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Product
SR/QE Testing System
PVE300
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Industrial Vision Technology Pte Ltd.
Solar Cell Multi-function SR/QE Testing System is specially designed for Photovoltaic Industry to characterize the Optical Performance of Raw material, process wafer, finished solar cell, as well as small Module.
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Product
Military Test Systems
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Santa Barbara Infrared is the leading supplier of sophisticated, integrated, multi-function E-O test systems used by the military in laboratory, factory, depot and field test environments. Each of these systems are built to specific requirements and utilize SBIR’s extensive design and test capabilities, core technologies and knowledge of the unique military applications. SBIR specializes in providing complete solutions with integrated hardware and software resulting in robust and easy-to-use systems.
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Product
Compliance Test Systems
LMG Test Suite
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ZES ZIMMER Electronic Systems GmbH
The ZES ZIMMER test system LMG Test Suite tests in accordance with the currently valid version of EN 61000-3-2/-12 or EN 61000-3-3/-11 and also supports measurements per ECE R-10.4 Annex 11 (e.g. electromagnetic compatibility of vehicles). As a manufacturer of precision power measurement technology, we are represented on the international standards committee. As a result, changes in standards are immediately incorporated into our test systems.
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Product
Handover Test Systems
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Family of handover test systems designed for handset-to-network handover testing. Internal step attenuators allow the RF signal between the network access points and the handsets to be dynamically faded up/down. The Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted commands.
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Product
FPD Tester Model
27014
Test Platform
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
MEMS Testing System
BK3010V2
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The BaKo BK3010V2 is our updated MEMS Tester, based on our C-Mic tester, the best selling BK3010. It's small enough to carry under your arm and with a test time of under 0.5 seconds, it tests as fast as you can connect a microphone. Setting up the specifications is very easy and can be done in a few minutes. In addition, the new BK3010V2 can be connected to a computer so you can keep and view compiled data and track trends in variations in your C-Mics.
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Product
Test System
USB Explorer 280
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The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Product
Test Systems
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Computer Gesteuerte Systeme GmbH
The system is pin and software compatible to the larger test systems LB302 / 303. Due to the fewer needed I/Os, the tester features the compact G6 receiver (Virginia Panel Cooperation) compared to the larger G12 of the other tester versions. The LB301 is equipped with a 2kW power supply and can control one load box.
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Product
Optics Test Systems
Contract Measurements And Services
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Optik Elektronik Gerätetechnik GmbH
Thanks to our very good laboratory equipment, we offer contract measurements for numerous measuring tasks. In the field of optics, measurement and testing technology, these are, for example, the parameters MTF, focal length, radius, contact dimension, focal length, geometric and optical parameters of cylindrical lenses. Others on request.
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Product
Circuit Breaker Timer
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* Micro - Controller based technology* Very Compact and lightweight* Very accurate measurements* Available with built - in thermal printer or RS 232 interface* Available in bench top and industrial suit case models.* Economical
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Product
Multi-Cell Test System
Cellcia
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Next-generation wafer probing system for 300mm wafers. The multi-layer system structure maximizes the efficiency of testing, further reducing the total testing cost.
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Product
3-Axis Non-Robotic Automated Testing System
AT3
Test Instrument
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
Laser Test Systems
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Santa Barbara Infrared, Inc. offers an extensive family of test systems and components that test and characterize the performance of laser range finders, designators, illuminators and spot trackers.
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Product
Circuit Breaker Analyzers & Timers
CAT Advanced Series
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DV Power circuit breaker analyzer and timer utilizes the latest technological enhancements for safe and fast testing of circuit breakers. The sophisticated design ensures efficient and reliable operations in high-voltage substations and industrial environments.The CAT Advanced series are stand-alone or PC-controlled digital instruments for a circuit breaker testing. The timing channels record closing and an opening of the arcing, resistor, and auxiliary contacts. Also, the main contact channels can measure the resistance value of the pre-insertion resistors (if present in the circuit breaker).With CAT Advanced series instruments, it is possible to record graphs of open and close coil currents. Furthermore, it records displacements of the HV and MV circuit breaker moving parts. Test results can be saved via USB, PC or be printed via 112 mm (4.4 inches) thermal printer (optional accessory) in tabular and graphical form.A circuit breaker test consists of different operational modes and CAT Advanced series supports:Open (O)Close (C)Reclose (O-0,3s-C)Trip free (CO)O-0,3s-COOpen-Close (O-C)Close-Open (C-O)Open-Close-Open (O-C-O)First trip (O)Multiple operations, such as Open-Close and Open-Close-Open, can be initiated by using a predefined delay time or by sensing a breaker’s contact position.The auxiliary inputs are used to monitor dry and wet auxiliary contacts. The six coil control analog channels measure and record coil currents simultaneously (OPEN and CLOSE), up to 35 A AC/DC.The additional six voltage analog channels have four selectable voltage ranges available (±1 V, ±5 V, ±60 V and ±300 V AC/DC).A built-in micro-ohmmeter generates up to 500A true DC ripple-free current with an automatically regulated test ramp that provides performing static and dynamic contact resistance measurement.Three transducer channels provide a measuring displacement of the circuit breaker moving parts, contact wipe, over-travel, rebound, damping time and average velocity. Also, a user can connect either an analog or a digital transducer to these universal channels.
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Product
Modular Breakout System 3-Pin & 20-Pin Plugin Module
95-199-004
Modular Breakout System
The 95-199-004 Plugin Breakout Module is designed to be fitted to a PXI 40-199 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
Test System
LPDDR4 and LPDDR3
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Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Product
Battery Test System
WBCS3000Ls32
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : ±5Vmax. current range : ±10mA
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Product
Test systems
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MG Products can supply a variety of test systems. These include the Extended Boundary Scan Test from JTAG Technologies, the functional test equipment integrated into a table or high configuration from Unites systems or the Cabinet Modular Test solution (CMT). We offer the right solution for every test setup.
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Product
Edge AI Inference Systems
Edge AI Inference System
Powered by NVIDIA Jetson family and RTX, AIR series provides scalable AI inference performance or efficient retraining on a large scale at the edge.
