Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
Widefield Confocal Microscope
Smartproof 5
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The versatile ZEISS Smartproof 5 widefield confocal microscope is your integrated system for surface analysis: fast, precise and repeatable. Put it to work on a wide range of industrial applications - such as roughness and topographical characterization - that come up every day in QA/QC departments, production environments and R&D labs. This high quality confocal system is driven by the powerful software ZEISS Efficient Navigation (ZEN) to bring you the added benefits of maximum user comfort and increased productivity.
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Product
Boundary Scan
TurboBSD
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TurboBSD is SynTest high-performance Boundary Scan Designer. It is 100% compliant to the IEEE 1149.1 Boundary Scan Standard. TurboBSD performs Boundary Scan logic synthesis, creates BSDL (Boundary Scan Description Language) file, and generates Boundary Scan test patterns
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Product
NeaSNOM Microscope
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Based on high-stability scanning-sample Atomic Force Microscope optimized for optical nanoscopyOptical focusing unit accepts visible, infrared and even terahertz illuminationTwo independent module bays allow imaging & spectroscopy at the same time
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Product
Microscopic Four-Point Probes
M4PP
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CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
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Product
Microscope
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Shanghai Selon Scientific Instrument Co. Ltd.
An optical instrument used for viewing very small objects, such as mineral samples or animal or plant cells, typically magnified several hundred times.
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Product
Atomic Force Microscope
NaioAFM
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The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
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Product
Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Product
Electronics
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Weidmüller Interface GmbH & Co. KG
Electronics lie at the heart of your automation technology. We give you solutions with intelligence.
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Product
Toolmakers Microscope
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Sinowon Innovation Metrology Manufacture Ltd.
It is widely used in mechanical, meter, electronic and light industry; university, Institute and metrology department. The measuring profile projector can detect the contour dimension and surface shape of variety complex workpiece, such as templates, punching pieces, cams, threads, gears, molding milling cutters.
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Product
Electronic Loads
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high performance electronic load is the successor to the highly respected PLZ-4W series, whilst still retaining the same high specification and build quality. Advances include a high visibility color display, low voltage operation from a minimum of 1 V to a maximum of 150 V. Programmable profiles of voltage/current can be applied (using the new ARB function, as used in LED/solar testing) in addition to the inherited 6 modes of operation: Constant Current, Constant Resistance, Constant Voltage, Constant Power, Constant Current + Constant Voltage, Constant Resistance + Constant Voltage.
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Product
Universal Scanning Head
CF106
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Calmet Smart Calibration Devices
Universal miniature scanning head for detecting (counting) impulses from inductive, LED and LCD energy meters. Additionally it enables counting of manually triggered impulses (Start/Stop push button function). Sometimes (when access is difficult) it is the only way to count pulses from inductive, LED and LCD meters.
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Product
Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Product
Confocal Raman Microscopes
NRS Series
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Include Class 1 laser safety as standard and share the same comprehensive Spectra Manager™ Suite of measurement and micro-imaging software.
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Product
Electronics
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Flann provides control processors and switch drivers that support all Flanns current range of programmable attenuators, phase changers and waveguide switches
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Product
Digital Vision Microscopes
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Sinowon Innovation Metrology Manufacture Ltd.
Video Microscope is widely used in the inspection of electronic industry production line, printed circuit board, weld detects ( such as wrong printing, edge collapse,etc)during printed circuit component, PC Board, VFD, and the identification of printing grid and painting, etc. It can display the zoom out image on the screen and save, magnify and print.
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Product
Scanning & Inspection
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API’s offers a range of portable measuring and laser scanning solutions together with robot or tripod mounted 3D structured light scanner.
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Product
Industrial Microscope Solutions
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Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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Product
Differential Scanning Calorimetry
Nano DSC
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The Nano DSC differential scanning calorimeter is designed to characterize the molecular stability of dilute in-solution biomolecules. The Nano DSC obtains data using less sample than competitive designs. Solid-state thermoelectric elements are used to precisely control temperature and a built-in precision linear actuator maintains constant or controlled variable pressure in the cell. Automated, unattended continuous operation with increased sample throughput is achieved with the optional Nano DSC Autosampler.
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Product
Stereo Microscopes & Macroscopes
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Leica Microsystems offers customized stereo microscopes for research, industry and education. Our macroscopes for industry, medicine and research offer exceptional optics and ultra convenient operation. Stereo microscopes and macroscopes from Leica enable you to view, analyze and document your specimens in two and three dimensions for any application.
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Product
Atomic Force Microscope
AFM
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Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Product
Digital Microscopes
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Zarbeco Digital Microscopes include Video toolbox PC software for taking still and moving images, measurement, labelling, draw-on features. They will have the best image quality at an affordable price with magnification options, digital camera options, and software options to meet your imaging needs.
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Product
Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Product
STM Microscope
NaioSTM
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The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!
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Product
Scanning Electron Microscopy (SEM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Product
Confocal Raman Microscope
LabRAM HR Evolution
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The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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Product
Microscope Cameras
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High-performance USB microscope cameras with the latest SONY global and rolling-shutter sensors and advanced feature sets such as external trigger and readout functions.
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Product
Scanning Probe Microscopy
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SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Product
Automated Multispectral Microscop
VideometerMic
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The VideometerMic is an automated multispectral microscope incorporating a multispectral scanner head mounted in an xyz-stage for auto-focusing and scanning of samples of size up to 30 mm x 30 mm.
