Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
Scanning Thermal Microscopy Module
VertiSense™
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SThM module for thermal conductivity contrast and a temperature contrast imaging. Supports Contact, Tapping™ and Peak Force Tapping modes. Plug-in module, compatible with most commercial AFMs. Real temperature measurements up to 700° C. Ultra-low noise, high speed amplifier. Innovative probe design.
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Atomic Force Microscope
AFM Heron
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New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
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Video Stereo Microscope
BVM-20105
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High-resolution CCD sensor, built-in analog/digital converter, analog and digital signal directly display on the screen, can also simultaneously display on TV and computer through corresponding interfaces; taking photo and video through software; simple operation, reducing user's fatigue and injury.
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Product
Joint Services Electronic Combat Systems Tester
JSECST™
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The Joint Services Electronic Combat Systems Tester (JSECST) is part of the family of testers, supporting the U.S. Air Force, Navy, Army, and over 23 allied nation platforms. JSECST performs full end-to-end diagnostic tests of installed systems including radar warning receivers (RWRs), jamming systems, communication systems, and navigation systems. Our JSECST delivers confidence for flight crews and the technicians who support them. It quickly and accurately tests and fault-isolates electronic combat and avionics systems for today's most advanced combat aircraft.
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Product
DC Electronic Load
3310G Series（75W~400W）
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Each 3310G Series module has its own control and display panel, CC / CR / CV / CP / Dynamic modes, plug in 3302G / 3305G / 3300G mainframe with 150 sets Store / Recall memory which provides load set-up more efficiently, also can be controlled via RS232、Ethernet、USB and GPIB interface.
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Product
Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Product
Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Product
Opto-Mechanics, Electronics, Software, Accessories
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A variety of complementary products expand the function of our measuring instruments and support the configuration of complete measuring systems.
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Product
Basic Electronics Trainer
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Basic Electronics Trainer System to understand Characteristics of Variuos Type of Electronic Components.Functional block diagrams are provided on-board for Teaching/Training. These Trainer provides with various Test Points to Measure the Parameters on Multimeter.
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Product
Ultrasonic Thickness Gaugew/A & B Scan and Thru Coating Capability
UTG-4000
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Utilizing color waveform A-scan and time based B-scan for absolute correctness, this new state of the art ultrasonic thickness gauge is packed with useful features allowing users to be confident of the displayed values on the most critical of applications. This multi-functional ultrasonic thickness gauge offers everything from basic measurement, Scan mode with Min/Max viewing, GO/NO GO display, Adjustable Sound Velocity and Thru-Coating Capabilities.
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Product
High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
4500~6000W DC Electronic Loads
JT634 Series
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Nanjing Jartul Electronic Co., Ltd
JT634 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT634 series load very suitable for testing power supply when produced in large quantity. Besides, JT634 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT634 series load satisfing most of R&D requirements. Moreover, JT634 series load’s special parallel operation method can satisfy the synchronous loading requirements of multi-channels output power supply and satisfy single-channel output power supply requirement for big power.
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Product
PXI Electronic Load Module
Load Module
PXI Electronic Load Module provides the electronic load capabilities of sinking DC power with high-accuracy measurements in a compact form factor optimized for design validation, characterization, and production test.
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Product
Portable Measuring Microscope
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Opto's portable microscope is designed to handle even the most demanding on-site inspections. With its ergonomic design, robust construction and perfectly matched optics configuration, it is a precise and reliable tool.
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Product
Imaging Mass Microscope
iMScope QT
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Inheriting the concept of a mass spectrometer equipped with an optical microscope from the iMScope series, the iMScope QT is also Shimadzu's flagship model for MS imaging with a Q-TOF MS(LCMS-9030).
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Electronic Production Measuring & Testing Instruments
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Wuhan Fanke Transformer Manufacture Co., LTD
Electronic Production Measuring & Testing Instruments
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Product
Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Product
RF Electronic Calibration Module (ECal), DC/300 KHz To 9 GHz, 4.3-10, 2 Port
85094D
Electronic Calibration Module
The Keysight 85094D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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Product
Air Cooled Linear DC Electronic Load
ALx Series
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The ALx Series utilizes conventional linear MOSFET-based dissipative elements, allowing the series to achieve a very wide voltage-current operating range within the model’s maximum power rating. Using the same heat management innovations developed for Magna-Power’s high density programmable DC power supplies, the ALx Series’ conservative cooling ensures long product life in environments up to 50 °C ambient operating temperature.
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VOC Emissions Testing for Electronic Equipment
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Underwriters Laboratories Inc.
Product emissions testing on electronic equipment, including printers, consumer electronics, information and communications equipment, and appliances.
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Pocket Microscopes
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Powerful magnification with an extremely lightweight and portable design.
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Product
PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
Load Module
The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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Fluorescence Microscope
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Our range of products include classic fl fluorescence microscope, optima fl led fluorescence microscope, optima fl fluorescence microscope, ultima fl fluorescent microscope, zoomstar fl fluorescence microscope and crown fl led trinocular medical microscope.
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
Electronic Surveying Compass
TOPOSENSOR
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F. W. Breithaupt & Sohn GmbH & Co.KG
*Compact electronic surveying compass*Internal memory for storage of approx. 4.000 measurements*RS232 interface*Digital LCD readout of horizontal/vertical angles; disply 1°*Declination setting*Scope magnification 10x*Accessories upon request
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Scanning Acoustic Microscope
Echo
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The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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Rapid Automated Modular Microscope
RAMM
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Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
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3-CMOS & 3-CCD prism-based RGB Area Scan Cameras
Apex Series
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JAI’s prism-based R-G-B cameras separate the incoming light into red, green and blue wavelengths, which are directed to three separate image sensors. The cameras deliver exceptionally accurate R-G-B raw image data ideal for demanding color machine vision applications across a range of industries including pharmaceutical, electronics, printing/packaging and imaging in microscopy and medical diagnostics equipment.
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Wireless Electronic Flight Bags
webFB
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The ultra-compact webFB easily fits in the palm of the hand, yet incorporates the capabilities of both an AID and a wireless server. The built-in AID safely gathers essential data from the aircraft's ARINC 429 and 717 databuses and conveys it to custom software or EFB apps hosted on the internal server. Using a wireless connection to portable EFB tablets, the webFB securely delivers this valuable information right to the fingertips of the flight crew.
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Benchtop Fiber Microscope
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BL-C series X/Y Axial Adjustment benchtop fiber microscope is used to inspect the polished surface or cleaved ends of fiber optic connectors. With a critical view of fine scratches, the BL-C series benchtop fiber optic microscope is an ideal choice for factory post-polish, component assembly, QC inspection of fiber connectors.
