Spring Probes
Spring loaded electrical conductor contacting elements. Also known as: Pogo Pin
See Also: Pogo Pin, Test Fixtures, Bed of Nails
-
Product
Spring Contact Probes
-
FEINMETALL offers a wide range of contact probe:ICT / FCT probes, short travel probes, double plunger probes, fine pitch probes, interface probes, wire harness probes, threaded probes, high current probes, switch probes, twist proof probes, push back probes, koaxial probes, radio frequency probes.
-
Product
Linear Testfixture (Cassette Not Included), UTT 105 x 170 mm
MG-01
-
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (1000N) 650 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 105 x 170 mm (wxd)• Outer dimensions: 254 x 400 x 50 x 140 mm (wxdxh1xh2)• Designed for changeable cassette
-
Product
Semiconductor
-
You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
-
Product
For AIM-65 And AIM-75S
8" MSR Module
-
MSR module is suitable for retail customer to do membership card information checking with easy installation wayMSR module is charging via pogo pin
-
-
Product
Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
-
Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type G, Ø1.50mm, 230gf
K100-G150230-SKAU
-
K100 Series, Pitch 100mil, Tip Style G, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
-
Product
HPA General Purpose Probes
-
General Purpose Spring Probe contact solutions are designed for high volume testing and feature the industry-proven Pylon line. General-purpose probes are offered in both replaceable and non-replaceable options.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 155gf
K100-I126155-SKAU
-
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 155gf, Steel with Gold Plating.
-
Product
Spring Probes & Hyperboloid Contacts
-
In-Circuit / Functional Probes, Socketless X Probes®, High Current Probes, Double Ended Probes, ATE Interface Probes, integraMate®
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type Q, Ø0.80mm, 305gf
K100-Q080305-SKAU
-
K100 Series, Pitch 100mil, Tip Style Q, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
-
Product
Diagnostic Cores
VersaCore™
-
The diagnostic cores are uniquely designed in the VC20 format. Using the customizable PCB, components can be added to create a "golden core" to quickly troubleshoot your system Test SMUs, Test Motherboard, Test Pogo pins, Test Relay matrix.
-
Product
Linear Testfixture (Cassette Not Included), UTT 456 x 320 mm
MG-07
-
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 456 x 320 mm (wxd)• Outer dimensions: 620 x 590 x 100 x 184 mm (wxdxh1xh2)• Designed for changeable cassette
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type G, Ø1.50mm, 305gf
K100-G150305-SKAU
-
K100 Series, Pitch 100mil, Tip Style G, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 230gf
K100-C150230-SKAU
-
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type Q, Ø0.80mm, 230gf
K100-Q080230-SKAU
-
K100 Series, Pitch 100mil, Tip Style Q, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
-
Product
High Force Type Prbobe For PCB, K100 Series 100 Mil Pitch, Receptacle With Wire Wrap Pin
KR100-WP
-
K100 Series, Pitch 100mil, Receptacle, with wire wrap pin. Brass with gold finish.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 230gf
K100-H080230-SKAU
-
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 155gf
K100-K150155-SKAU
-
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type D, Ø0.80mm, 230gf
K100-D080230-SKAU
-
K100 Series, Pitch 100mil, Tip Style D, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type E, Ø1.50mm, 155gf
K100-E150155-SKAU
-
K100 Series, Pitch 100mil, Tip Style E, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type D, Ø0.80mm, 305gf
K100-D080305-SKAU
-
K100 Series, Pitch 100mil, Tip Style D, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type E, Ø1.50mm, 305gf
K100-E150305-SKAU
-
K100 Series, Pitch 100mil, Tip Style E, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 155gf
K100-C150155-SKAU
-
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
-
Product
Pylon ITA Mount Linear Testfixture Cassette and ITA Frame Not Included, UUT 306 x 248 mm
MG-02 VGR12
-
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with aluminum backpanel for a Genrad VGR12 Pylon frame• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
-
Product
Test Contactor/Probe Head
Hydra
-
Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
-
Product
Linear Testfixture for VPC iCon i1 Mass Interconnected Cassette Interface (Cassette Not Included) 4 or 10 Positions Blocks, UTT 306 x 248 mm
MG-02-01
-
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for Mass interconnect changeable cassette• Up to a maximum of 4 interface blocks of 160 signals• All interface blocks can be customized
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 305gf
K100-A080305-SKAU
-
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
-
Product
NI Semiconductor Test Systems
-
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 305gf
K100-K150305-SKAU
-
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
